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Artigo de periodico
Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge (2025)
Aguiar, Vitor A. P. ; Medina, Nilberto H. ; Added, Nemitala ; Alberton, Saulo ; Macchione, Eduardo L. A. ; Guazzelli, Marcilei A ; Melo, Marco A. A.; Oliveira, Juliano A.; Giacomini, Renato C. ; Aguirre, Fernando R.; Allegro, Paula Rangel Pestana ; Zaggato, Hellen C. S. ; Sayeg, Isaac J.
Source: IEEE Transactions on Electron Devices. Unidades: IF, IGC, EP
Subjects: RADIAÇÃO IONIZANTE, ÍONS
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ABNT
AGUIAR, Vitor A. P. et al. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge. IEEE Transactions on Electron Devices, p. 31 - 36, 2025Tradução . . Disponível em: https://doi.org/10.1109/TED.2024.3497927. Acesso em: 05 nov. 2025.
APA
Aguiar, V. A. P., Medina, N. H., Added, N., Alberton, S., Macchione, E. L. A., Guazzelli, M. A., et al. (2025). Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge. IEEE Transactions on Electron Devices, 31 - 36. doi:10.1109/TED.2024.3497927
NLM
Aguiar VAP, Medina NH, Added N, Alberton S, Macchione ELA, Guazzelli MA, Melo MAA, Oliveira JA, Giacomini RC, Aguirre FR, Allegro PRP, Zaggato HCS, Sayeg IJ. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge [Internet]. IEEE Transactions on Electron Devices. 2025 ; 31 - 36.[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/TED.2024.3497927
Vancouver
Aguiar VAP, Medina NH, Added N, Alberton S, Macchione ELA, Guazzelli MA, Melo MAA, Oliveira JA, Giacomini RC, Aguirre FR, Allegro PRP, Zaggato HCS, Sayeg IJ. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge [Internet]. IEEE Transactions on Electron Devices. 2025 ; 31 - 36.[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/TED.2024.3497927
Artigo de periodico
Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs (2025)
Alberton, Saulo G; Vilas-Bôas, Alexis C; Guazzelli, Marcilei A; Aguiar, Vitor A. P.; Pereira, Matheus S.; Added, Nemitala; Medina, Nilberto Heder
Source: Physical Review D. Unidade: IF
Subjects: FÍSICA DE PARTÍCULAS, NÊUTRONS, DETECÇÃO DE PARTÍCULAS, REAÇÕES NUCLEARES
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ALBERTON, Saulo G et al. Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs. Physical Review D, v. 111, 2025Tradução . . Disponível em: https://doi.org/10.1109/TDMR.2025.3572829. Acesso em: 05 nov. 2025.
APA
Alberton, S. G., Vilas-Bôas, A. C., Guazzelli, M. A., Aguiar, V. A. P., Pereira, M. S., Added, N., & Medina, N. H. (2025). Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs. Physical Review D, 111. doi:https://doi.org/10.1109/TDMR.2025.3572829
NLM
Alberton SG, Vilas-Bôas AC, Guazzelli MA, Aguiar VAP, Pereira MS, Added N, Medina NH. Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs [Internet]. Physical Review D. 2025 ; 111[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/TDMR.2025.3572829
Vancouver
Alberton SG, Vilas-Bôas AC, Guazzelli MA, Aguiar VAP, Pereira MS, Added N, Medina NH. Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs [Internet]. Physical Review D. 2025 ; 111[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/TDMR.2025.3572829
Trabalho de evento
Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA (2024)
Costa, Victor O.; Benevenuti, Fabio ; Menezes, Renan; Sato, Lidia Shibuya ; Loures, Luis; Kastensmidt, Fernanda L ; Added, Nemitala ; Alberton, Saulo ; Aguiar, Vitor A. P. ; Medina, Nilberto H.
Conference titles: IEEE 25th Latin American Test Symposium (LATS). Unidade: IF
Subjects: FÍSICA DE PARTÍCULAS, RADIAÇÃO IONIZANTE, ACELERADOR DE PARTÍCULAS, ÍONS
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COSTA, Victor O. et al. Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA. 2024, Anais.. Piscataway, NJ: IEEE, 2024. Disponível em: https://doi.org/10.1109/LATS62223.2024.10534591. Acesso em: 05 nov. 2025.
APA
Costa, V. O., Benevenuti, F., Menezes, R., Sato, L. S., Loures, L., Kastensmidt, F. L., et al. (2024). Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA. In . Piscataway, NJ: IEEE. doi:10.1109/LATS62223.2024.10534591
NLM
Costa VO, Benevenuti F, Menezes R, Sato LS, Loures L, Kastensmidt FL, Added N, Alberton S, Aguiar VAP, Medina NH. Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA [Internet]. 2024 ;[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534591
Vancouver
Costa VO, Benevenuti F, Menezes R, Sato LS, Loures L, Kastensmidt FL, Added N, Alberton S, Aguiar VAP, Medina NH. Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA [Internet]. 2024 ;[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534591
Trabalho de evento
Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection (2024)
Gobatto, Leonardo R.; Benevenuti, Fabio ; Added, Nemitala ; Alberton, Saulo ; Macchione, Eduardo L. A. ; Aguiar, Vitor A. P. ; Medina, Nilberto H. ; Kastensmidt, Fernanda L ; Azambuja, Jose Rodrigo
Conference titles: IEEE 25th Latin American Test Symposium (LATS). Unidade: IF
Subjects: FÍSICA DE PARTÍCULAS, RADIAÇÃO IONIZANTE, ÍONS PESADOS
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ABNT
GOBATTO, Leonardo R. et al. Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection. 2024, Anais.. Piscataway, NJ: IEEE, 2024. Disponível em: https://doi.org/10.1109/LATS62223.2024.10534599. Acesso em: 05 nov. 2025.
APA
Gobatto, L. R., Benevenuti, F., Added, N., Alberton, S., Macchione, E. L. A., Aguiar, V. A. P., et al. (2024). Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection. In . Piscataway, NJ: IEEE. doi:10.1109/LATS62223.2024.10534599
NLM
Gobatto LR, Benevenuti F, Added N, Alberton S, Macchione ELA, Aguiar VAP, Medina NH, Kastensmidt FL, Azambuja JR. Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection [Internet]. 2024 ;[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534599
Vancouver
Gobatto LR, Benevenuti F, Added N, Alberton S, Macchione ELA, Aguiar VAP, Medina NH, Kastensmidt FL, Azambuja JR. Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection [Internet]. 2024 ;[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534599
Artigo de periodico
Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge (2024)
Aguiar, Vitor A. P. ; Medina, Nilberto H. ; Added, Nemitala ; Alberton, Saulo G ; Macchione, Eduardo L. A. ; Guazzelli, Marcilei A ; Melo, Marco A A; Oliveira, Juliano A; Giacomini, Renato C. ; Aguirre, Fernando R; Allegro, Paula Rangel Pestana ; Zaggato, Hellen C. S. ; Sayeg, Isaac J.
Source: IEEE Transactions on Electron Devices. Unidades: IF, IGC, EP
Subjects: ÍONS PESADOS, FEIXES, RADIAÇÃO IONIZANTE
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ABNT
AGUIAR, Vitor A. P. et al. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge. IEEE Transactions on Electron Devices, 2024Tradução . . Disponível em: https://doi.org/10.1109/TED.2024.3497927. Acesso em: 05 nov. 2025.
APA
Aguiar, V. A. P., Medina, N. H., Added, N., Alberton, S. G., Macchione, E. L. A., Guazzelli, M. A., et al. (2024). Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge. IEEE Transactions on Electron Devices. doi:10.1109/TED.2024.3497927
NLM
Aguiar VAP, Medina NH, Added N, Alberton SG, Macchione ELA, Guazzelli MA, Melo MAA, Oliveira JA, Giacomini RC, Aguirre FR, Allegro PRP, Zaggato HCS, Sayeg IJ. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge [Internet]. IEEE Transactions on Electron Devices. 2024 ;[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/TED.2024.3497927
Vancouver
Aguiar VAP, Medina NH, Added N, Alberton SG, Macchione ELA, Guazzelli MA, Melo MAA, Oliveira JA, Giacomini RC, Aguirre FR, Allegro PRP, Zaggato HCS, Sayeg IJ. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge [Internet]. IEEE Transactions on Electron Devices. 2024 ;[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/TED.2024.3497927
Artigo de periodico
Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects (2023)
Allegro, Paula Rangel Pestana ; Aguiar, Vitor Ângelo Paulino de ; Added, Nemitala ; Medina, Nilberto Heder; Macchione, Eduardo Luiz Augusto ; Alberton, Saulo Gabriel Pereira Nascimento
Source: Microelectronics Reliability. Unidade: IF
Assunto: RADIAÇÃO IONIZANTE
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ABNT
ALLEGRO, Paula Rangel Pestana et al. Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects. Microelectronics Reliability, v. 142, 2023Tradução . . Disponível em: https://doi.org/10.1016/j.microrel.2023.114916. Acesso em: 05 nov. 2025.
APA
Allegro, P. R. P., Aguiar, V. Â. P. de, Added, N., Medina, N. H., Macchione, E. L. A., & Alberton, S. G. P. N. (2023). Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects. Microelectronics Reliability, 142. doi:10.1016/j.microrel.2023.114916
NLM
Allegro PRP, Aguiar VÂP de, Added N, Medina NH, Macchione ELA, Alberton SGPN. Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects [Internet]. Microelectronics Reliability. 2023 ; 142[citado 2025 nov. 05 ] Available from: https://doi.org/10.1016/j.microrel.2023.114916
Vancouver
Allegro PRP, Aguiar VÂP de, Added N, Medina NH, Macchione ELA, Alberton SGPN. Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects [Internet]. Microelectronics Reliability. 2023 ; 142[citado 2025 nov. 05 ] Available from: https://doi.org/10.1016/j.microrel.2023.114916
Trabalho de evento
Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA (2022)
Benevenuti, Fabio ; Oliveira, Ádria ; Lopes, Israel da Costa ; Kastensmidt, Fernanda ; Medina, Nilberto Heder ; Added, Nemitala ; Aguiar, Vitor Ângelo Paulino de ; Guazzelli, Marcilei Aparecida
Conference titles: European Conference on Radiation and its Effects on Components and Systems (RADECS). Unidade: IF
Subjects: FÍSICA NUCLEAR, RADIAÇÃO IONIZANTE, ELETRÔNICA QUÂNTICA, NANOTECNOLOGIA
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ABNT
BENEVENUTI, Fabio et al. Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA. 2022, Anais.. New York: IEEE, 2022. Disponível em: https://doi.org/10.1109/RADECS47380.2019.9745650. Acesso em: 05 nov. 2025.
APA
Benevenuti, F., Oliveira, Á., Lopes, I. da C., Kastensmidt, F., Medina, N. H., Added, N., et al. (2022). Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA. In . New York: IEEE. doi:10.1109/RADECS47380.2019.9745650
NLM
Benevenuti F, Oliveira Á, Lopes I da C, Kastensmidt F, Medina NH, Added N, Aguiar VÂP de, Guazzelli MA. Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA [Internet]. 2022 ;[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/RADECS47380.2019.9745650
Vancouver
Benevenuti F, Oliveira Á, Lopes I da C, Kastensmidt F, Medina NH, Added N, Aguiar VÂP de, Guazzelli MA. Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA [Internet]. 2022 ;[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/RADECS47380.2019.9745650
Trabalho de evento-anais periodico
Neutron-Induced Radiation Effects in UMOS Transistor (2022)
Alberton, Saulo Gabriel Pereira Nascimento ; Medina, Nilberto Heder ; Aguiar, Vitor Ângelo Paulino de ; Added, Nemitala
Source: Journal of Physics: Conference Series. Conference titles: Brazilian Workshop on Nuclear Physics. Unidade: IF
Assunto: PARTÍCULAS (FÍSICA NUCLEAR)
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ABNT
ALBERTON, Saulo Gabriel Pereira Nascimento et al. Neutron-Induced Radiation Effects in UMOS Transistor. Journal of Physics: Conference Series. Bristol: IOP Publishing. Disponível em: https://doi.org/10.1088/1742-6596/2340/1/012046. Acesso em: 05 nov. 2025. , 2022
APA
Alberton, S. G. P. N., Medina, N. H., Aguiar, V. Â. P. de, & Added, N. (2022). Neutron-Induced Radiation Effects in UMOS Transistor. Journal of Physics: Conference Series. Bristol: IOP Publishing. doi:10.1088/1742-6596/2340/1/012046
NLM
Alberton SGPN, Medina NH, Aguiar VÂP de, Added N. Neutron-Induced Radiation Effects in UMOS Transistor [Internet]. Journal of Physics: Conference Series. 2022 ; 2340[citado 2025 nov. 05 ] Available from: https://doi.org/10.1088/1742-6596/2340/1/012046
Vancouver
Alberton SGPN, Medina NH, Aguiar VÂP de, Added N. Neutron-Induced Radiation Effects in UMOS Transistor [Internet]. Journal of Physics: Conference Series. 2022 ; 2340[citado 2025 nov. 05 ] Available from: https://doi.org/10.1088/1742-6596/2340/1/012046
Artigo de periodico
Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET (2022)
Alberton, S. G. ; Aguiar, Vitor^Ângelo Paulino de ; Medina, Nilberto H. ; Added, Nemitala ; Macchione, E L A ; Menegasso, R. ; Cesário, G. J.; Santos, Hellen Cristine ; Scarduelli, V B ; Alcántara-Núñez, J. A.; Guazzelli, M. A.; Santos, R. B. B.; Flechas, D.
Source: Microelectronics Reliability. Unidade: IF
Subjects: FÍSICA NUCLEAR, ÍONS PESADOS, SEMICONDUTORES
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ABNT
ALBERTON, S. G. et al. Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET. Microelectronics Reliability, v. 137, 2022Tradução . . Disponível em: https://doi.org/10.1016/j.microrel.2022.114784. Acesso em: 05 nov. 2025.
APA
Alberton, S. G., Aguiar, V. ^Â. P. de, Medina, N. H., Added, N., Macchione, E. L. A., Menegasso, R., et al. (2022). Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET. Microelectronics Reliability, 137. doi:10.1016/j.microrel.2022.114784
NLM
Alberton SG, Aguiar V^ÂP de, Medina NH, Added N, Macchione ELA, Menegasso R, Cesário GJ, Santos HC, Scarduelli VB, Alcántara-Núñez JA, Guazzelli MA, Santos RBB, Flechas D. Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET [Internet]. Microelectronics Reliability. 2022 ; 137[citado 2025 nov. 05 ] Available from: https://doi.org/10.1016/j.microrel.2022.114784
Vancouver
Alberton SG, Aguiar V^ÂP de, Medina NH, Added N, Macchione ELA, Menegasso R, Cesário GJ, Santos HC, Scarduelli VB, Alcántara-Núñez JA, Guazzelli MA, Santos RBB, Flechas D. Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET [Internet]. Microelectronics Reliability. 2022 ; 137[citado 2025 nov. 05 ] Available from: https://doi.org/10.1016/j.microrel.2022.114784
Trabalho de evento-anais periodico
Isomeric state in the odd-odd 68Ga nucleus (2022)
Escudeiro, Rafael ; Medina, Nilberto Heder ; Guazzelli, Marcilei Aparecida ; Vasconcellos, Caio Eduardo Cabral de; Oliveira, José Roberto Brandão de ; Allegro, Paula Rangel Pestana ; Núñez, Juan Antonio Alcantara; Ribas, Roberto Vicençotto ; Added, Nemitala ; Aguiar, Vitor Ângelo Paulino de ; Macchione, Eduardo Luiz Augusto ; Scarduelli, Valdir Brunetti ; Alberton, Saulo Gabriel Pereira Nascimento ; Toufen, Dennis Lozano
Source: Journal of Physics: Conference Series. Conference titles: Brazilian Workshop on Nuclear Physics. Unidade: IF
Assunto: FÍSICA NUCLEAR
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ABNT
ESCUDEIRO, Rafael et al. Isomeric state in the odd-odd 68Ga nucleus. Journal of Physics: Conference Series. Bristol: IOP Publishing. Disponível em: https://doi.org/10.1088/1742-6596/2340/1/012043. Acesso em: 05 nov. 2025. , 2022
APA
Escudeiro, R., Medina, N. H., Guazzelli, M. A., Vasconcellos, C. E. C. de, Oliveira, J. R. B. de, Allegro, P. R. P., et al. (2022). Isomeric state in the odd-odd 68Ga nucleus. Journal of Physics: Conference Series. Bristol: IOP Publishing. doi:10.1088/1742-6596/2340/1/012043
NLM
Escudeiro R, Medina NH, Guazzelli MA, Vasconcellos CEC de, Oliveira JRB de, Allegro PRP, Núñez JAA, Ribas RV, Added N, Aguiar VÂP de, Macchione ELA, Scarduelli VB, Alberton SGPN, Toufen DL. Isomeric state in the odd-odd 68Ga nucleus [Internet]. Journal of Physics: Conference Series. 2022 ;[citado 2025 nov. 05 ] Available from: https://doi.org/10.1088/1742-6596/2340/1/012043
Vancouver
Escudeiro R, Medina NH, Guazzelli MA, Vasconcellos CEC de, Oliveira JRB de, Allegro PRP, Núñez JAA, Ribas RV, Added N, Aguiar VÂP de, Macchione ELA, Scarduelli VB, Alberton SGPN, Toufen DL. Isomeric state in the odd-odd 68Ga nucleus [Internet]. Journal of Physics: Conference Series. 2022 ;[citado 2025 nov. 05 ] Available from: https://doi.org/10.1088/1742-6596/2340/1/012043
Artigo de periodico
Determination of stable isotope ratios using nuclear reaction analysis coupled with a particle–gamma coincidence method (2021)
Paula Allegro ; Rizzutto, Marcia A. ; Added, Nemitala ; Aguiar, Vitor^Ângelo Paulino de ; Toufen, Dennis Lozano; Macchione, Eduardo Luiz Augusto ; Medina, Nilberto H. ; Ribas, Roberto Vicençotto; Oliveira, José Roberto Brandão de ; Escudeiro, Rafael ; Alcantara, Juan ; Curado, Jessica Fleury; Scarduelli, Valdir Brunetti; Zagatto, Vinicius Antonio Bocaline; Rodrigues, Cleber ; Tabacniks, Manfredo
Source: Journal of Analytical Atomic Spectrometry. Unidade: IF
Subjects: FÍSICA NUCLEAR, REAÇÕES NUCLEARES, ESPECTROMETRIA, ISÓTOPOS ESTÁVEIS, COBRE
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ABNT
PAULA ALLEGRO, et al. Determination of stable isotope ratios using nuclear reaction analysis coupled with a particle–gamma coincidence method. Journal of Analytical Atomic Spectrometry, v. 36, n. 1, p. 120-132, 2021Tradução . . Disponível em: https://doi.org/10.1039/D0JA00283F. Acesso em: 05 nov. 2025.
APA
Paula Allegro,, Rizzutto, M. A., Added, N., Aguiar, V. ^Â. P. de, Toufen, D. L., Macchione, E. L. A., et al. (2021). Determination of stable isotope ratios using nuclear reaction analysis coupled with a particle–gamma coincidence method. Journal of Analytical Atomic Spectrometry, 36( 1), 120-132. doi:10.1039/D0JA00283F
NLM
Paula Allegro, Rizzutto MA, Added N, Aguiar V^ÂP de, Toufen DL, Macchione ELA, Medina NH, Ribas RV, Oliveira JRB de, Escudeiro R, Alcantara J, Curado JF, Scarduelli VB, Zagatto VAB, Rodrigues C, Tabacniks M. Determination of stable isotope ratios using nuclear reaction analysis coupled with a particle–gamma coincidence method [Internet]. Journal of Analytical Atomic Spectrometry. 2021 ; 36( 1): 120-132.[citado 2025 nov. 05 ] Available from: https://doi.org/10.1039/D0JA00283F
Vancouver
Paula Allegro, Rizzutto MA, Added N, Aguiar V^ÂP de, Toufen DL, Macchione ELA, Medina NH, Ribas RV, Oliveira JRB de, Escudeiro R, Alcantara J, Curado JF, Scarduelli VB, Zagatto VAB, Rodrigues C, Tabacniks M. Determination of stable isotope ratios using nuclear reaction analysis coupled with a particle–gamma coincidence method [Internet]. Journal of Analytical Atomic Spectrometry. 2021 ; 36( 1): 120-132.[citado 2025 nov. 05 ] Available from: https://doi.org/10.1039/D0JA00283F
Relatorio tecnico
Self-consistent ion beam analysis: an approach by multi-objective optimization (2021)
Silva, T. F.; Höschen, T.; Toussaint, U. von; Mayer, M.; Rodrigues, Cleber Lima ; Tabacniks, Manfredo Harri ; Added, Nemitala ; Rizzutto, Márcia de Almeida
Unidade: IF
Subjects: ÍONS, SIMULAÇÃO
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ABNT
SILVA, T. F. et al. Self-consistent ion beam analysis: an approach by multi-objective optimization. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/pdf/2108.01498.pdf. Acesso em: 05 nov. 2025. , 2021
APA
Silva, T. F., Höschen, T., Toussaint, U. von, Mayer, M., Rodrigues, C. L., Tabacniks, M. H., et al. (2021). Self-consistent ion beam analysis: an approach by multi-objective optimization. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/pdf/2108.01498.pdf
NLM
Silva TF, Höschen T, Toussaint U von, Mayer M, Rodrigues CL, Tabacniks MH, Added N, Rizzutto M de A. Self-consistent ion beam analysis: an approach by multi-objective optimization [Internet]. 2021 ;[citado 2025 nov. 05 ] Available from: https://arxiv.org/pdf/2108.01498.pdf
Vancouver
Silva TF, Höschen T, Toussaint U von, Mayer M, Rodrigues CL, Tabacniks MH, Added N, Rizzutto M de A. Self-consistent ion beam analysis: an approach by multi-objective optimization [Internet]. 2021 ;[citado 2025 nov. 05 ] Available from: https://arxiv.org/pdf/2108.01498.pdf
Artigo de periodico
Self-consistent ion beam analysis: An approach by multi-objective optimization (2021)
Silva, Tiago Fiorini da ; Rodrigues, Cleber ; Added, Nemitala ; Rizzutto, Marcia A. ; Tabacniks, Manfredo ; Höschen, T.; Toussaint, U. von; Mayer, M.
Source: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Unidade: IF
Subjects: FÍSICA NUCLEAR, MATERIAIS, ÍONS ELETRÔNICOS, ALGORITMOS ÚTEIS E ESPECÍFICOS
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ABNT
SILVA, Tiago Fiorini da et al. Self-consistent ion beam analysis: An approach by multi-objective optimization. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, v. 506, p. 32-40, 2021Tradução . . Disponível em: https://doi.org/10.1016/j.nimb.2021.09.007. Acesso em: 05 nov. 2025.
APA
Silva, T. F. da, Rodrigues, C., Added, N., Rizzutto, M. A., Tabacniks, M., Höschen, T., et al. (2021). Self-consistent ion beam analysis: An approach by multi-objective optimization. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 506, 32-40. doi:10.1016/j.nimb.2021.09.007
NLM
Silva TF da, Rodrigues C, Added N, Rizzutto MA, Tabacniks M, Höschen T, Toussaint U von, Mayer M. Self-consistent ion beam analysis: An approach by multi-objective optimization [Internet]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2021 ; 506 32-40.[citado 2025 nov. 05 ] Available from: https://doi.org/10.1016/j.nimb.2021.09.007
Vancouver
Silva TF da, Rodrigues C, Added N, Rizzutto MA, Tabacniks M, Höschen T, Toussaint U von, Mayer M. Self-consistent ion beam analysis: An approach by multi-objective optimization [Internet]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2021 ; 506 32-40.[citado 2025 nov. 05 ] Available from: https://doi.org/10.1016/j.nimb.2021.09.007
Apresentacao sonora/cenica/entrevista
O Professor Nemitala Added fala sobre "Como íons pesados interagem com dispositivos eletrônicos" [Palestra] (2020)
Added, Nemitala
Source: Canal do Youtube: Observatório Nacional. Unidade: IF
Subjects: FÍSICA NUCLEAR, INSTRUMENTAÇÃO (FÍSICA), ÍONS PESADOS, DISPOSITIVOS ELETRÔNICOS, RADIAÇÃO IONIZANTE
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ADDED, Nemitala. O Professor Nemitala Added fala sobre "Como íons pesados interagem com dispositivos eletrônicos" [Palestra]. Canal do Youtube: Observatório Nacional. Rio de Janeiro: ON-Observatório Nacional. Disponível em: https://www.youtube.com/watch?v=nAcvKMEfPNs. Acesso em: 05 nov. 2025. , 2020
APA
Added, N. (2020). O Professor Nemitala Added fala sobre "Como íons pesados interagem com dispositivos eletrônicos" [Palestra]. Canal do Youtube: Observatório Nacional. Rio de Janeiro: ON-Observatório Nacional. Recuperado de https://www.youtube.com/watch?v=nAcvKMEfPNs
NLM
Added N. O Professor Nemitala Added fala sobre "Como íons pesados interagem com dispositivos eletrônicos" [Palestra] [Internet]. Canal do Youtube: Observatório Nacional. 2020 ;[citado 2025 nov. 05 ] Available from: https://www.youtube.com/watch?v=nAcvKMEfPNs
Vancouver
Added N. O Professor Nemitala Added fala sobre "Como íons pesados interagem com dispositivos eletrônicos" [Palestra] [Internet]. Canal do Youtube: Observatório Nacional. 2020 ;[citado 2025 nov. 05 ] Available from: https://www.youtube.com/watch?v=nAcvKMEfPNs
Artigo de periodico
Cluster Configuration Effects in the Elastic Scattering of Boron Isotopes 8 B, 10 B, 11 B and 12 B on 58 Ni (2020)
Guimarães, Valdir ; Natividad Zevallos, Erick Oscar ; Cardozo, E. N.; Lubian, Jesus ; Santos, O. C. B.; Linares, Roberto ; Assunção, M.; Alcantara-Nunez, Juan Antonio; Lara, Alessandro Luiz de ; Lichtenthaler Filho, Rubens ; Pires, Kelly Cristina Cezaretto ; Silva, Uiran Umbelino da ; Selaboina, Appannababu ; Added, Nemitala ; Monteiro, D. S.; Morcelle, Viviane
Source: Recent Progress in Few-Body Physics. Unidade: IF
Subjects: FÍSICA NUCLEAR, REAÇÕES NUCLEARES, ISÓTOPOS, ESPALHAMENTO, ASTROFÍSICA
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ABNT
GUIMARÃES, Valdir et al. Cluster Configuration Effects in the Elastic Scattering of Boron Isotopes 8 B, 10 B, 11 B and 12 B on 58 Ni. Recent Progress in Few-Body Physics, v. 238, 2020Tradução . . Disponível em: https://doi.org/10.1007/978-3-030-32357-8_34. Acesso em: 05 nov. 2025.
APA
Guimarães, V., Natividad Zevallos, E. O., Cardozo, E. N., Lubian, J., Santos, O. C. B., Linares, R., et al. (2020). Cluster Configuration Effects in the Elastic Scattering of Boron Isotopes 8 B, 10 B, 11 B and 12 B on 58 Ni. Recent Progress in Few-Body Physics, 238. doi:10.1007/978-3-030-32357-8_34
NLM
Guimarães V, Natividad Zevallos EO, Cardozo EN, Lubian J, Santos OCB, Linares R, Assunção M, Alcantara-Nunez JA, Lara AL de, Lichtenthaler Filho R, Pires KCC, Silva UU da, Selaboina A, Added N, Monteiro DS, Morcelle V. Cluster Configuration Effects in the Elastic Scattering of Boron Isotopes 8 B, 10 B, 11 B and 12 B on 58 Ni [Internet]. Recent Progress in Few-Body Physics. 2020 ; 238[citado 2025 nov. 05 ] Available from: https://doi.org/10.1007/978-3-030-32357-8_34
Vancouver
Guimarães V, Natividad Zevallos EO, Cardozo EN, Lubian J, Santos OCB, Linares R, Assunção M, Alcantara-Nunez JA, Lara AL de, Lichtenthaler Filho R, Pires KCC, Silva UU da, Selaboina A, Added N, Monteiro DS, Morcelle V. Cluster Configuration Effects in the Elastic Scattering of Boron Isotopes 8 B, 10 B, 11 B and 12 B on 58 Ni [Internet]. Recent Progress in Few-Body Physics. 2020 ; 238[citado 2025 nov. 05 ] Available from: https://doi.org/10.1007/978-3-030-32357-8_34
Artigo de periodico
Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects (2020)
Oliveira, Ádria ; Tambara, Lucas A.; Benevenuti, Fabio; Benites, Luis A. C.; Added, Nemitala ; Aguiar, Vitor^Ângelo Paulino de ; Medina, N. H.; Guazzelli, Marcilei Aparecida ; Kastensmidt, Fernanda
Source: IEEE Transactions on Nuclear Science. Unidade: IF
Subjects: FÍSICA NUCLEAR, ÍONS PESADOS, DISPOSITIVOS ELETRÔNICOS, MATERIAIS
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ABNT
OLIVEIRA, Ádria et al. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects. IEEE Transactions on Nuclear Science, v. 67, n. 7, p. 1503-1510, 2020Tradução . . Disponível em: https://doi.org/10.1109/TNS.2020.2995729. Acesso em: 05 nov. 2025.
APA
Oliveira, Á., Tambara, L. A., Benevenuti, F., Benites, L. A. C., Added, N., Aguiar, V. ^Â. P. de, et al. (2020). Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects. IEEE Transactions on Nuclear Science, 67( 7), 1503-1510. doi:10.1109/TNS.2020.2995729
NLM
Oliveira Á, Tambara LA, Benevenuti F, Benites LAC, Added N, Aguiar V^ÂP de, Medina NH, Guazzelli MA, Kastensmidt F. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects [Internet]. IEEE Transactions on Nuclear Science. 2020 ; 67( 7): 1503-1510.[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/TNS.2020.2995729
Vancouver
Oliveira Á, Tambara LA, Benevenuti F, Benites LAC, Added N, Aguiar V^ÂP de, Medina NH, Guazzelli MA, Kastensmidt F. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects [Internet]. IEEE Transactions on Nuclear Science. 2020 ; 67( 7): 1503-1510.[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/TNS.2020.2995729
Artigo de periodico
Neutron radiation effects on an electronic system on module (2020)
Lo Presti, Domenico ; Medina, Nilberto H. ; Aguiar, Vitor Ângelo Paulino de ; Oliveira, José Roberto Brandão de ; Added, Nemitala ; Macchione, Eduardo Luiz Augusto
Source: Review of Scientific Instruments. Unidade: IF
Subjects: FÍSICA NUCLEAR, FÍSICA DE PARTÍCULAS, ACELERADOR DE PARTÍCULAS, NÊUTRONS, DISPOSITIVOS ELETRÔNICOS, REAÇÕES NUCLEARES, REATORES NUCLEARES DE FISSÃO, ISÓTOPOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
LO PRESTI, Domenico et al. Neutron radiation effects on an electronic system on module. Review of Scientific Instruments, v. 91, n. 8, 2020Tradução . . Disponível em: https://doi.org/10.1063/5.0010968. Acesso em: 05 nov. 2025.
APA
Lo Presti, D., Medina, N. H., Aguiar, V. Â. P. de, Oliveira, J. R. B. de, Added, N., & Macchione, E. L. A. (2020). Neutron radiation effects on an electronic system on module. Review of Scientific Instruments, 91( 8). doi:10.1063/5.0010968
NLM
Lo Presti D, Medina NH, Aguiar VÂP de, Oliveira JRB de, Added N, Macchione ELA. Neutron radiation effects on an electronic system on module [Internet]. Review of Scientific Instruments. 2020 ; 91( 8):[citado 2025 nov. 05 ] Available from: https://doi.org/10.1063/5.0010968
Vancouver
Lo Presti D, Medina NH, Aguiar VÂP de, Oliveira JRB de, Added N, Macchione ELA. Neutron radiation effects on an electronic system on module [Internet]. Review of Scientific Instruments. 2020 ; 91( 8):[citado 2025 nov. 05 ] Available from: https://doi.org/10.1063/5.0010968
Artigo de periodico
Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy (2020)
González, Carlos J; Added, Nemitala ; Macchione, Eduardo Luiz Augusto ; Aguiar, Vitor Ângelo Paulino de ; Kastensmidt, Fernanda G L; Puchner, Helmut K; Guazzelli, Marcilei A ; Medina, Nilberto Heder ; Balen, Tiago R
Source: IEEE Transactions on Nuclear Science. Unidade: IF
Assunto: ÍONS PESADOS
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ABNT
GONZÁLEZ, Carlos J et al. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, v. . 67, n. 3, p. 518-524, 2020Tradução . . Disponível em: https://doi.org/10.1109/TNS.2019.2952775. Acesso em: 05 nov. 2025.
APA
González, C. J., Added, N., Macchione, E. L. A., Aguiar, V. Â. P. de, Kastensmidt, F. G. L., Puchner, H. K., et al. (2020). Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, . 67( 3), 518-524. doi:10.1109/TNS.2019.2952775
NLM
González CJ, Added N, Macchione ELA, Aguiar VÂP de, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy [Internet]. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524.[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/TNS.2019.2952775
Vancouver
González CJ, Added N, Macchione ELA, Aguiar VÂP de, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy [Internet]. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524.[citado 2025 nov. 05 ] Available from: https://doi.org/10.1109/TNS.2019.2952775
Artigo de periodico
SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil (2020)
Aguiar, Vitor Ângelo Paulino de ; Medina, Nilberto Heder ; Added, Nemitala ; Macchione, Eduardo Luiz Augusto ; Alberton, Saulo Gabriel Pereira Nascimento ; Leite, A. R. ; Aguirre, F. R.; Ribas, R. V.; Perego, C. C.; Fagundes, L. M.; Terassi, J. C.; Brage, J. A. P.; Simões, R. F.; Morais, O. B.; Almeida, E. A.; Joaquim, P. M.; Souza, M. S.; Cecotte, Alex Fernando Monego; Martins, R.; Duarte, J. G. ; Scarduelli, V. B.; Allegro, Paula Rangel Pestana ; Escudeiro, Rafael ; Leistenschneider, Erich ; Oliveira, R. A. N.; Servelo, W. A.; Silva, M. T.; Sarmento, V. E.; Carreira, C. A.; Abreu, J. C.; Silva, S. C.; Santos, H. C.; Rodrigues, C. L.; Assis, R. F.; Silva, T. F. ; Tabacniks, Manfredo Harri ; Joaquim, A. S.; Minas, J. H. P.; Kashinskiy, D.; Guazzelli, M. A. ; Seixas Jr., L. E. ; Finco, S.; Benevenutti, F.
Source: AIP Review of Scientific Instruments. Unidade: IF
Subjects: FÍSICA NUCLEAR, ÍONS PESADOS, DISPOSITIVOS ÓPTICOS, SEMICONDUTORES (FÍSICO-QUÍMICA), ACELERADOR DE PARTÍCULAS, DISPOSITIVOS ELETRÔNICOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
AGUIAR, Vitor Ângelo Paulino de et al. SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil. AIP Review of Scientific Instruments, v. 91, n. 5, 2020Tradução . . Disponível em: https://doi.org/10.1063/1.5138644. Acesso em: 05 nov. 2025.
APA
Aguiar, V. Â. P. de, Medina, N. H., Added, N., Macchione, E. L. A., Alberton, S. G. P. N., Leite, A. R., et al. (2020). SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil. AIP Review of Scientific Instruments, 91( 5). doi:10.1063/1.5138644
NLM
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Alberton SGPN, Leite AR, Aguirre FR, Ribas RV, Perego CC, Fagundes LM, Terassi JC, Brage JAP, Simões RF, Morais OB, Almeida EA, Joaquim PM, Souza MS, Cecotte AFM, Martins R, Duarte JG, Scarduelli VB, Allegro PRP, Escudeiro R, Leistenschneider E, Oliveira RAN, Servelo WA, Silva MT, Sarmento VE, Carreira CA, Abreu JC, Silva SC, Santos HC, Rodrigues CL, Assis RF, Silva TF, Tabacniks MH, Joaquim AS, Minas JHP, Kashinskiy D, Guazzelli MA, Seixas Jr. LE, Finco S, Benevenutti F. SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil [Internet]. AIP Review of Scientific Instruments. 2020 ; 91( 5):[citado 2025 nov. 05 ] Available from: https://doi.org/10.1063/1.5138644
Vancouver
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Alberton SGPN, Leite AR, Aguirre FR, Ribas RV, Perego CC, Fagundes LM, Terassi JC, Brage JAP, Simões RF, Morais OB, Almeida EA, Joaquim PM, Souza MS, Cecotte AFM, Martins R, Duarte JG, Scarduelli VB, Allegro PRP, Escudeiro R, Leistenschneider E, Oliveira RAN, Servelo WA, Silva MT, Sarmento VE, Carreira CA, Abreu JC, Silva SC, Santos HC, Rodrigues CL, Assis RF, Silva TF, Tabacniks MH, Joaquim AS, Minas JHP, Kashinskiy D, Guazzelli MA, Seixas Jr. LE, Finco S, Benevenutti F. SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil [Internet]. AIP Review of Scientific Instruments. 2020 ; 91( 5):[citado 2025 nov. 05 ] Available from: https://doi.org/10.1063/1.5138644
Artigo de periodico
Scattering of 16,18O beams on 63,65Cu targets: A systematic study of different reaction channels (2019)
Zagatto, Vinicius Antonio Bocaline ; Crema, Edilson ; Added, Nemitala ; Simões, Rone Flávio
Source: Physical Review C. Unidade: IF
Assunto: PARTÍCULAS (FÍSICA NUCLEAR)
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ZAGATTO, Vinicius Antonio Bocaline et al. Scattering of 16,18O beams on 63,65Cu targets: A systematic study of different reaction channels. Physical Review C, v. 100, p. 044602(11), 2019Tradução . . Disponível em: https://doi.org/10.1103/PhysRevC.100.044602. Acesso em: 05 nov. 2025.
APA
Zagatto, V. A. B., Crema, E., Added, N., & Simões, R. F. (2019). Scattering of 16,18O beams on 63,65Cu targets: A systematic study of different reaction channels. Physical Review C, 100, 044602(11). doi:10.1103/PhysRevC.100.044602
NLM
Zagatto VAB, Crema E, Added N, Simões RF. Scattering of 16,18O beams on 63,65Cu targets: A systematic study of different reaction channels [Internet]. Physical Review C. 2019 ;100 044602(11).[citado 2025 nov. 05 ] Available from: https://doi.org/10.1103/PhysRevC.100.044602
Vancouver
Zagatto VAB, Crema E, Added N, Simões RF. Scattering of 16,18O beams on 63,65Cu targets: A systematic study of different reaction channels [Internet]. Physical Review C. 2019 ;100 044602(11).[citado 2025 nov. 05 ] Available from: https://doi.org/10.1103/PhysRevC.100.044602

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