Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA (2022)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF
- Unidade: IF
- DOI: 10.1109/RADECS47380.2019.9745650
- Subjects: FÍSICA NUCLEAR; RADIAÇÃO IONIZANTE; ELETRÔNICA QUÂNTICA; NANOTECNOLOGIA
- Keywords: TID; Radiation effects; GaN; HEMT
- Language: Inglês
- Imprenta:
- Conference titles: European Conference on Radiation and its Effects on Components and Systems (RADECS)
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
BENEVENUTI, Fabio et al. Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA. 2022, Anais.. New York: IEEE, 2022. . Acesso em: 31 mar. 2023. -
APA
Benevenuti, F., Oliveira, Á., Lopes, I. da C., Kastensmidt, F., Medina, N. H., Added, N., et al. (2022). Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA. In . New York: IEEE. doi:10.1109/RADECS47380.2019.9745650 -
NLM
Benevenuti F, Oliveira Á, Lopes I da C, Kastensmidt F, Medina NH, Added N, Aguiar VÂP de, Guazzelli MA. Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA. 2022 ;[citado 2023 mar. 31 ] -
Vancouver
Benevenuti F, Oliveira Á, Lopes I da C, Kastensmidt F, Medina NH, Added N, Aguiar VÂP de, Guazzelli MA. Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA. 2022 ;[citado 2023 mar. 31 ] - Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs
- Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects
- Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy
- Natural radioactivity and external hazard index in Brazilian sands
- Neutron-Induced Radiation Effects in UMOS Transistor
- Ionizing radiation effect mechanisms in electronic devices: how and what to measure
- Variability in the electrical parameters of power devices by total ionizing dose radiation effects
- Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis
- Understanding single event effects measurements
- Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits
Informações sobre o DOI: 10.1109/RADECS47380.2019.9745650 (Fonte: oaDOI API)
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
