Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs (2018)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF
- Unidade: IF
- DOI: 10.1109/TNS.2018.2844250
- Subjects: FÍSICA NUCLEAR; ESPECTROSCOPIA DE RAIO GAMA
- Keywords: HARDWARE; SOFTWARE RELIABILITY; PROGRAM PROCESSORS; RELIABILITY ENGENEERING; FIELD PROGRAMMABLE GATE ARRAYS
- Language: Inglês
- Imprenta:
- Source:
- Título: IEEE Transactions on Nuclear Science
- ISSN: 0018-9499
- Volume/Número/Paginação/Ano: v. 65, n. 8, p. 1935 - 1942, 2018
- Status:
- Artigo possui versão em acesso aberto em repositório (Green Open Access)
- Versão do Documento:
- Versão submetida (Pré-print)
- Acessar versão aberta:
-
ABNT
TAMBARA, Lucas Antunes et al. Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs. IEEE Transactions on Nuclear Science, v. 65, n. 8, p. 1935 - 1942, 2018Tradução . . Disponível em: https://doi.org/10.1109/TNS.2018.2844250. Acesso em: 31 mar. 2026. -
APA
Tambara, L. A., Kastensmidt, F. L., Rech, P., Lins, F., Medina, N. H., Added, N., et al. (2018). Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs. IEEE Transactions on Nuclear Science, 65( 8), 1935 - 1942. doi:10.1109/TNS.2018.2844250 -
NLM
Tambara LA, Kastensmidt FL, Rech P, Lins F, Medina NH, Added N, Aguiar VÂP de, Silveira MAG da. Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs [Internet]. IEEE Transactions on Nuclear Science. 2018 ; 65( 8): 1935 - 1942.[citado 2026 mar. 31 ] Available from: https://doi.org/10.1109/TNS.2018.2844250 -
Vancouver
Tambara LA, Kastensmidt FL, Rech P, Lins F, Medina NH, Added N, Aguiar VÂP de, Silveira MAG da. Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs [Internet]. IEEE Transactions on Nuclear Science. 2018 ; 65( 8): 1935 - 1942.[citado 2026 mar. 31 ] Available from: https://doi.org/10.1109/TNS.2018.2844250 - Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA
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