Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy (2020)
- Authors:
- USP affiliated authors: ADDED, NEMITALA - IF ; MEDINA, NILBERTO HEDER - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF
- Unidade: IF
- DOI: 10.1109/TNS.2019.2952775
- Assunto: ÍONS PESADOS
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher place: Piscataway, NJ
- Date published: 2020
- Source:
- Título do periódico: IEEE Transactions on Nuclear Science
- Volume/Número/Paginação/Ano: v.. 67, n. 3, p. 518-524, 2020
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
GONZÁLEZ, Carlos J; KASTENSMIDT, Fernanda G L; PUCHNER, Helmut K; et al. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, Piscataway, NJ, v. . 67, n. 3, p. 518-524, 2020. DOI: 10.1109/TNS.2019.2952775. -
APA
González, C. J., Kastensmidt, F. G. L., Puchner, H. K., Guazzelli, M. A., Medina, N. H., Balen, T. R., et al. (2020). Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, . 67( 3), 518-524. doi:10.1109/TNS.2019.2952775 -
NLM
González CJ, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR, Added N, Macchione ELA, Aguiar VÂP de. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524. -
Vancouver
González CJ, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR, Added N, Macchione ELA, Aguiar VÂP de. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524. - Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs
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Informações sobre o DOI: 10.1109/TNS.2019.2952775 (Fonte: oaDOI API)
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