Study of radiation effects in embedded systems (2018)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF
- Unidade: IF
- Subjects: ACELERADOR DE PARTÍCULAS; ÍONS PESADOS
- Language: Português
- Abstract: Electronic components in embedded systems are strongly in°uenced by ionizing radiation and the need for radiation tolerant devices is growing for applications in hazardous environments such as space, nuclear reactors and particle accelerators [1,2]. The e®ects due to the hit of heavy ions in electronic components, namely Single-Event E®ect, can be transient in which free charge, generated by heavy-ions striking directly the component may disturb its behavior, provoking a soft error associated to transients and logical information changes or can be a destructive hard error. To study the e®ects of protons and heavy-ions in embedded systems a new beamline was installed at the S~ao Paulo 8UD Pelletron accelerator [3]. This beamline is being prepared also to other Applied Nuclear Physics studies using techniques such as ERDA, RBS, time-of-°ight, external PIXE, etc. This experimental setup has been designed to produce low-°ux, high uniformity and large area heavy-ion beams up to 28Si by defocusing and multiple scattering techniques and from 35Cl to 107Ag by a defocussing technique [4]. These special characteristics are required by the European standards for testing electronic devices under the in°ue
- Imprenta:
- Source:
- Título: Resumos
- Conference titles: Brazilian Meeting on Nuclear Physics
-
ABNT
MEDINA, Nilberto Heder et al. Study of radiation effects in embedded systems. 2018, Anais.. São Paulo: Instituto de Física, Universidade de São Paulo, 2018. Disponível em: https://sec.sbfisica.org.br/eventos/rtfnb/xli/programa/trabalhos.asp?sesId=3. Acesso em: 10 nov. 2024. -
APA
Medina, N. H., Added, N., Aguiar, V. Â. P. de, Alberton, S. G., Macchione, E. L. A., & Silveira, M. A. G. (2018). Study of radiation effects in embedded systems. In Resumos. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://sec.sbfisica.org.br/eventos/rtfnb/xli/programa/trabalhos.asp?sesId=3 -
NLM
Medina NH, Added N, Aguiar VÂP de, Alberton SG, Macchione ELA, Silveira MAG. Study of radiation effects in embedded systems [Internet]. Resumos. 2018 ;[citado 2024 nov. 10 ] Available from: https://sec.sbfisica.org.br/eventos/rtfnb/xli/programa/trabalhos.asp?sesId=3 -
Vancouver
Medina NH, Added N, Aguiar VÂP de, Alberton SG, Macchione ELA, Silveira MAG. Study of radiation effects in embedded systems [Internet]. Resumos. 2018 ;[citado 2024 nov. 10 ] Available from: https://sec.sbfisica.org.br/eventos/rtfnb/xli/programa/trabalhos.asp?sesId=3 - A proposal to study long-lived isotopes produced by thermal neutron irradiation in digital systems
- A proposal to study long-lived isotopes produced by thermal neutron irradiation in digital systems
- Lockstep dual-core ARM A9: implementation and resilience analysis under heavy ion-induced soft errors
- Preliminary TID and SEU effects on an ARM COTS processor
- Ionizing Radiation Effects on a COTS LowCost RISC Microcontroller
- Gamma-ray and X-ray fluorescence spectrometry on radionuclides, macro and micronutrients from South American coffee powder.
- Single event effects studies on 3N163 MOSFET
- Experimental setup for single event effects at the são paulo 8UD pelletron accelerator
- Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy
- Ionizing radiation effect mechanisms in electronic devices: how and what to measure
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas