Lockstep dual-core ARM A9: implementation and resilience analysis under heavy ion-induced soft errors (2018)
- Authors:
- USP affiliated authors: ADDED, NEMITALA - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; MEDINA, NILBERTO HEDER - IF
- Unidade: IF
- DOI: 10.1109/TNS.2018.2852606
- Assunto: ÍONS PESADOS
- Keywords: EMBEDDED PROCESSORS RELIABILITY; FAULT INJECTION; FAULT TOLERANCE; HEAVY IONS; LOCKSTEP; RADIATION EXPERIMENTS; SOFT ERROR
- Agências de fomento:
- Language: Inglês
- Abstract: This paper presents a dual-core lockstep (DCLS) implementation to protect hard-core processors against radiationinduced soft errors. The proposed DCLS is applied to an Advanced RISC Machine Cortex-A9 embedded processor. Different software optimizations were evaluated to assess their impact on performance and fault tolerance. Heavy ions’ experiments and fault injection emulation were performed to analyze the system susceptibility to errors and the DCLS performance. Results show that the approach is able to decrease the system cross section and achieve high protection against errors. The DCLS successfully protects the system from up to 78% of the injected faults. The execution performance analysis shows that by reducing the number of verifications and augmenting the block partition execution time, it is possible to increase the system reliability with minimal performance losses
- Imprenta:
- Publisher place: New York, NY
- Date published: 2018
- Source:
- Título: IEEE Transaction on Nuclear Science
- Volume/Número/Paginação/Ano: v. 65, n. 8, p. 1783-1790, 2018
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
OLIVEIRA, Ádria Barros de et al. Lockstep dual-core ARM A9: implementation and resilience analysis under heavy ion-induced soft errors. IEEE Transaction on Nuclear Science, v. 65, n. 8, p. 1783-1790, 2018Tradução . . Disponível em: https://doi.org/10.1109/TNS.2018.2852606. Acesso em: 10 fev. 2026. -
APA
Oliveira, Á. B. de, Rodrigues , G. S., Kastensmidt, F. L., Added, N., Macchione, E. L. A., Aguiar, V. Â. P. de, et al. (2018). Lockstep dual-core ARM A9: implementation and resilience analysis under heavy ion-induced soft errors. IEEE Transaction on Nuclear Science, 65( 8), 1783-1790. doi:10.1109/TNS.2018.2852606 -
NLM
Oliveira ÁB de, Rodrigues GS, Kastensmidt FL, Added N, Macchione ELA, Aguiar VÂP de, Medina NH, Silveira MAG da. Lockstep dual-core ARM A9: implementation and resilience analysis under heavy ion-induced soft errors [Internet]. IEEE Transaction on Nuclear Science. 2018 ; 65( 8): 1783-1790.[citado 2026 fev. 10 ] Available from: https://doi.org/10.1109/TNS.2018.2852606 -
Vancouver
Oliveira ÁB de, Rodrigues GS, Kastensmidt FL, Added N, Macchione ELA, Aguiar VÂP de, Medina NH, Silveira MAG da. Lockstep dual-core ARM A9: implementation and resilience analysis under heavy ion-induced soft errors [Internet]. IEEE Transaction on Nuclear Science. 2018 ; 65( 8): 1783-1790.[citado 2026 fev. 10 ] Available from: https://doi.org/10.1109/TNS.2018.2852606 - Gamma-ray and X-ray fluorescence spectrometry on radionuclides, macro and micronutrients from South American coffee powder.
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Informações sobre o DOI: 10.1109/TNS.2018.2852606 (Fonte: oaDOI API)
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