Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects (2020)
- Authors:
- USP affiliated authors: ADDED, NEMITALA - IF ; MEDINA, NILBERTO HEDER - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF
- Unidade: IF
- DOI: 10.1109/TNS.2020.2995729
- Subjects: FÍSICA NUCLEAR; ÍONS PESADOS; DISPOSITIVOS ELETRÔNICOS; MATERIAIS
- Keywords: Commercial Off-The-Shelf (COTS) SRAM-based field-programmable gate array (FPGA); fault injection (FI); fault tolerance; heavy ion; RISC-V; rocket
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher place: New Jersey
- Date published: 2020
- Source:
- Título: IEEE Transactions on Nuclear Science
- ISSN: 1558-1578
- Volume/Número/Paginação/Ano: v. 67, n. 7, p. 1503-1510, julho, 2020
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
OLIVEIRA, Ádria et al. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects. IEEE Transactions on Nuclear Science, v. 67, n. 7, p. 1503-1510, 2020Tradução . . Disponível em: https://doi.org/10.1109/TNS.2020.2995729. Acesso em: 10 nov. 2024. -
APA
Oliveira, Á., Tambara, L. A., Benevenuti, F., Benites, L. A. C., Added, N., Aguiar, V. ^Â. P. de, et al. (2020). Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects. IEEE Transactions on Nuclear Science, 67( 7), 1503-1510. doi:10.1109/TNS.2020.2995729 -
NLM
Oliveira Á, Tambara LA, Benevenuti F, Benites LAC, Added N, Aguiar V^ÂP de, Medina NH, Guazzelli MA, Kastensmidt F. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects [Internet]. IEEE Transactions on Nuclear Science. 2020 ; 67( 7): 1503-1510.[citado 2024 nov. 10 ] Available from: https://doi.org/10.1109/TNS.2020.2995729 -
Vancouver
Oliveira Á, Tambara LA, Benevenuti F, Benites LAC, Added N, Aguiar V^ÂP de, Medina NH, Guazzelli MA, Kastensmidt F. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects [Internet]. IEEE Transactions on Nuclear Science. 2020 ; 67( 7): 1503-1510.[citado 2024 nov. 10 ] Available from: https://doi.org/10.1109/TNS.2020.2995729 - Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA
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Informações sobre o DOI: 10.1109/TNS.2020.2995729 (Fonte: oaDOI API)
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