A commercial off-the-shelf pMOS transistor as X-ray and heavy ion detector (2014)
- Authors:
- Silveira, Marcilei Aparecida Guazzelli da
- Santos, Roberto B. B.
- Giacomini, Renato
- Melo, Marco A. A.
- Cirne, Karin Huscher
- Leite, Felipe G.
- Cunha, Felipe G.
- Oliveira, Juliano A. de
- Rallo, Augusto
- Seixas Junior, Luis Eduardo
- Aguiar, Vitor Ângelo Paulino de
- Macchionne, Eduardo
- Medina, Nilberto Heder
- Added, Nemitala
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF
- Unidade: IF
- Subjects: FÍSICA NUCLEAR; ÍONS PESADOS
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: SBF
- Conference titles: Reunião de Trabalho sobre Física Nuclear no Brasil
-
ABNT
SILVEIRA, Marcilei Aparecida Guazzelli da et al. A commercial off-the-shelf pMOS transistor as X-ray and heavy ion detector. 2014, Anais.. São Paulo: Instituto de Física, Universidade de São Paulo, 2014. Disponível em: http://www.sbf1.sbfisica.org.br/eventos/rtfnb/xxxvii/sys/resumos/R0084-2.pdf. Acesso em: 19 set. 2024. -
APA
Silveira, M. A. G. da, Santos, R. B. B., Giacomini, R., Melo, M. A. A., Cirne, K. H., Leite, F. G., et al. (2014). A commercial off-the-shelf pMOS transistor as X-ray and heavy ion detector. In SBF. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de http://www.sbf1.sbfisica.org.br/eventos/rtfnb/xxxvii/sys/resumos/R0084-2.pdf -
NLM
Silveira MAG da, Santos RBB, Giacomini R, Melo MAA, Cirne KH, Leite FG, Cunha FG, Oliveira JA de, Rallo A, Seixas Junior LE, Aguiar VÂP de, Macchionne E, Medina NH, Added N. A commercial off-the-shelf pMOS transistor as X-ray and heavy ion detector [Internet]. SBF. 2014 ;[citado 2024 set. 19 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/rtfnb/xxxvii/sys/resumos/R0084-2.pdf -
Vancouver
Silveira MAG da, Santos RBB, Giacomini R, Melo MAA, Cirne KH, Leite FG, Cunha FG, Oliveira JA de, Rallo A, Seixas Junior LE, Aguiar VÂP de, Macchionne E, Medina NH, Added N. A commercial off-the-shelf pMOS transistor as X-ray and heavy ion detector [Internet]. SBF. 2014 ;[citado 2024 set. 19 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/rtfnb/xxxvii/sys/resumos/R0084-2.pdf - Ionizing radiation effect mechanisms in electronic devices: how and what to measure
- Variability in the electrical parameters of power devices by total ionizing dose radiation effects
- Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis
- Understanding single event effects measurements
- Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits
- Variability in the electrical parameters of power devices by total ionizing dose radiation effects
- Gamma-ray and X-ray fluorescence spectrometry on radionuclides, macro and micronutrients from South American coffee powder.
- Radiation effects for high-energy protons and x-ray in integrated circuits
- Effects of total dose of ionizing radiation on integrated circuits
- Development of a system for studies on radiation effects in electronic devices
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas