Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits (2019)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF
- Unidade: IF
- DOI: 10.1016/j.microrel.2019.06.033
- Subjects: RADIAÇÃO IONIZANTE; INTERFERÊNCIA ELETROMAGNÉTICA; CIRCUITOS INTEGRADOS
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Microelectronics Reliability
- Volume/Número/Paginação/Ano: v. 100–101, p. 113341-7, 2019
- Status:
- Artigo possui acesso gratuito no site do editor (Bronze Open Access)
- Versão do Documento:
- Versão publicada (Published version)
- Acessar versão aberta:
-
ABNT
GOERL, Roger et al. Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits. Microelectronics Reliability, v. 100–101, p. 113341-7, 2019Tradução . . Disponível em: https://doi.org/10.1016/j.microrel.2019.06.033. Acesso em: 01 abr. 2026. -
APA
Goerl, R., Villa, P., Vargas, F. L., Marcon, C. A., Medina, N. H., Added, N., & Guazzelli, M. A. (2019). Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits. Microelectronics Reliability, 100–101, 113341-7. doi:10.1016/j.microrel.2019.06.033 -
NLM
Goerl R, Villa P, Vargas FL, Marcon CA, Medina NH, Added N, Guazzelli MA. Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits [Internet]. Microelectronics Reliability. 2019 ; 100–101 113341-7.[citado 2026 abr. 01 ] Available from: https://doi.org/10.1016/j.microrel.2019.06.033 -
Vancouver
Goerl R, Villa P, Vargas FL, Marcon CA, Medina NH, Added N, Guazzelli MA. Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits [Internet]. Microelectronics Reliability. 2019 ; 100–101 113341-7.[citado 2026 abr. 01 ] Available from: https://doi.org/10.1016/j.microrel.2019.06.033 - Understanding single event effects measurements
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