Variability in the electrical parameters of power devices by total ionizing dose radiation effects (2018)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF
- Unidade: IF
- Subjects: FÍSICA NUCLEAR; RADIAÇÃO IONIZANTE
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Abstracts
- Conference titles: Brazilian Meeting on Nuclear Physics
-
ABNT
BARROS, Felipe et al. Variability in the electrical parameters of power devices by total ionizing dose radiation effects. 2018, Anais.. São Paulo: SBF, 2018. Disponível em: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0023-3.pdf. Acesso em: 28 dez. 2025. -
APA
Barros, F., Silveira, M. A. G. da, Medina, N. H., Added, N., & Aguiar, V. Â. P. de. (2018). Variability in the electrical parameters of power devices by total ionizing dose radiation effects. In Abstracts. São Paulo: SBF. Recuperado de https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0023-3.pdf -
NLM
Barros F, Silveira MAG da, Medina NH, Added N, Aguiar VÂP de. Variability in the electrical parameters of power devices by total ionizing dose radiation effects [Internet]. Abstracts. 2018 ;[citado 2025 dez. 28 ] Available from: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0023-3.pdf -
Vancouver
Barros F, Silveira MAG da, Medina NH, Added N, Aguiar VÂP de. Variability in the electrical parameters of power devices by total ionizing dose radiation effects [Internet]. Abstracts. 2018 ;[citado 2025 dez. 28 ] Available from: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0023-3.pdf - Understanding single event effects measurements
- Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits
- Ionizing radiation effect mechanisms in electronic devices: how and what to measure
- Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis
- A commercial off-the-shelf pMOS transistor as X-ray and heavy ion detector
- Development of a system for studies on radiation effects in electronic devices
- Radiation effects for high-energy protons and x-ray in integrated circuits
- Study of radiation effects in embedded systems
- Effects of total dose of ionizing radiation on integrated circuits
- Study of radiation effects in embedded systems
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
