Neutron-Induced Radiation Effects in UMOS Transistor (2022)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF ; ALBERTON, SAULO GABRIEL PEREIRA NASCIMENTO - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF
- Unidade: IF
- DOI: 10.1088/1742-6596/2340/1/012046
- Assunto: PARTÍCULAS (FÍSICA NUCLEAR)
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher: IOP Publishing
- Publisher place: Bristol
- Date published: 2022
- Source:
- Título: Journal of Physics: Conference Series
- Volume/Número/Paginação/Ano: v. 2340, 012045, 2022
- Conference titles: Brazilian Workshop on Nuclear Physics
- Este periódico é de acesso aberto
- Este artigo é de acesso aberto
- URL de acesso aberto
- Cor do Acesso Aberto: gold
-
ABNT
ALBERTON, Saulo Gabriel Pereira Nascimento et al. Neutron-Induced Radiation Effects in UMOS Transistor. Journal of Physics: Conference Series. Bristol: IOP Publishing. Disponível em: https://doi.org/10.1088/1742-6596/2340/1/012046. Acesso em: 26 dez. 2025. , 2022 -
APA
Alberton, S. G. P. N., Medina, N. H., Aguiar, V. Â. P. de, & Added, N. (2022). Neutron-Induced Radiation Effects in UMOS Transistor. Journal of Physics: Conference Series. Bristol: IOP Publishing. doi:10.1088/1742-6596/2340/1/012046 -
NLM
Alberton SGPN, Medina NH, Aguiar VÂP de, Added N. Neutron-Induced Radiation Effects in UMOS Transistor [Internet]. Journal of Physics: Conference Series. 2022 ; 2340[citado 2025 dez. 26 ] Available from: https://doi.org/10.1088/1742-6596/2340/1/012046 -
Vancouver
Alberton SGPN, Medina NH, Aguiar VÂP de, Added N. Neutron-Induced Radiation Effects in UMOS Transistor [Internet]. Journal of Physics: Conference Series. 2022 ; 2340[citado 2025 dez. 26 ] Available from: https://doi.org/10.1088/1742-6596/2340/1/012046 - Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA
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Informações sobre o DOI: 10.1088/1742-6596/2340/1/012046 (Fonte: oaDOI API)
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