Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection (2024)
- Authors:
- USP affiliated authors: ADDED, NEMITALA - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; MEDINA, NILBERTO HEDER - IF ; ALBERTON, SAULO GABRIEL PEREIRA NASCIMENTO - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF
- Unidade: IF
- DOI: 10.1109/LATS62223.2024.10534599
- Subjects: FÍSICA DE PARTÍCULAS; RADIAÇÃO IONIZANTE; ÍONS PESADOS
- Keywords: RADIATION EFFECTS; FAULT TOLERANCE; PROGRAM PROCESSORS; SYSTEMATICS; OPERATING SYSTEMS; FAULT TOLERANT SYSTEMS; BENCHMARK TESTING; FAULT INJECTION; EMBEDDED PROCESSORS; RADIATION; HEAVY IONS
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher: IEEE
- Publisher place: Piscataway, NJ
- Date published: 2024
- Conference titles: IEEE 25th Latin American Test Symposium (LATS)
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
GOBATTO, Leonardo R. et al. Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection. 2024, Anais.. Piscataway, NJ: IEEE, 2024. Disponível em: https://doi.org/10.1109/LATS62223.2024.10534599. Acesso em: 26 dez. 2025. -
APA
Gobatto, L. R., Benevenuti, F., Added, N., Alberton, S., Macchione, E. L. A., Aguiar, V. A. P., et al. (2024). Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection. In . Piscataway, NJ: IEEE. doi:10.1109/LATS62223.2024.10534599 -
NLM
Gobatto LR, Benevenuti F, Added N, Alberton S, Macchione ELA, Aguiar VAP, Medina NH, Kastensmidt FL, Azambuja JR. Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection [Internet]. 2024 ;[citado 2025 dez. 26 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534599 -
Vancouver
Gobatto LR, Benevenuti F, Added N, Alberton S, Macchione ELA, Aguiar VAP, Medina NH, Kastensmidt FL, Azambuja JR. Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection [Internet]. 2024 ;[citado 2025 dez. 26 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534599 - Neutron-Induced Radiation Effects in UMOS Transistor
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Informações sobre o DOI: 10.1109/LATS62223.2024.10534599 (Fonte: oaDOI API)
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