Destructive single-event effects in semiconductor devices (2019)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF ; RIBAS, ROBERTO VICENCOTTO - IF ; MENEGASSO, RICARDO - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; ALBERTON, SAULO GABRIEL PEREIRA NASCIMENTO - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF
- Unidade: IF
- Subjects: FÍSICA NUCLEAR; RADIAÇÃO IONIZANTE
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Abstracts
- Conference titles: Escola de Verão Jorge André Swieca Física Nuclear Teórica
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ABNT
ALBERTON, Saulo Gabriel Pereira Nascimento et al. Destructive single-event effects in semiconductor devices. 2019, Anais.. São Paulo: SBF, 2019. Disponível em: https://sec.sbfisica.org.br/eventos/evjas-fnt/xix/sys/resumos/R0027-1.pdf. Acesso em: 04 ago. 2025. -
APA
Alberton, S. G. P. N., Medina, N. H., Added, N., Menegasso, R., Macchione, E. L. A., Aguiar, V. Â. P. de, & Ribas, R. V. (2019). Destructive single-event effects in semiconductor devices. In Abstracts. São Paulo: SBF. Recuperado de https://sec.sbfisica.org.br/eventos/evjas-fnt/xix/sys/resumos/R0027-1.pdf -
NLM
Alberton SGPN, Medina NH, Added N, Menegasso R, Macchione ELA, Aguiar VÂP de, Ribas RV. Destructive single-event effects in semiconductor devices [Internet]. Abstracts. 2019 ;[citado 2025 ago. 04 ] Available from: https://sec.sbfisica.org.br/eventos/evjas-fnt/xix/sys/resumos/R0027-1.pdf -
Vancouver
Alberton SGPN, Medina NH, Added N, Menegasso R, Macchione ELA, Aguiar VÂP de, Ribas RV. Destructive single-event effects in semiconductor devices [Internet]. Abstracts. 2019 ;[citado 2025 ago. 04 ] Available from: https://sec.sbfisica.org.br/eventos/evjas-fnt/xix/sys/resumos/R0027-1.pdf - Critical dependencies of heavy ion-induced destructive failures in electronic devices
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