Critical dependencies of heavy ion-induced destructive failures in electronic devices (2019)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF ; MENEGASSO, RICARDO - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; ESCUDEIRO, RAFAEL - IF ; ALBERTON, SAULO GABRIEL PEREIRA NASCIMENTO - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF
- Unidade: IF
- Assunto: ÍONS PESADOS
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher: Sociedade Brasileira de Física
- Publisher place: São Paulo
- Date published: 2019
- Source:
- Título do periódico: Abstracts
- Conference titles: Reunião de Trabalho sobre Física Nuclear no Brasil
-
ABNT
ALBERTON, Saulo Gabriel Pereira Nascimento et al. Critical dependencies of heavy ion-induced destructive failures in electronic devices. 2019, Anais.. São Paulo: Sociedade Brasileira de Física, 2019. . Acesso em: 24 jul. 2024. -
APA
Alberton, S. G. P. N., Medina, N. H., Added, N., Aguiar, V. Â. P. de, Menegasso, R., Macchione, E. L. A., et al. (2019). Critical dependencies of heavy ion-induced destructive failures in electronic devices. In Abstracts. São Paulo: Sociedade Brasileira de Física. -
NLM
Alberton SGPN, Medina NH, Added N, Aguiar VÂP de, Menegasso R, Macchione ELA, Escudeiro R, Guazzelli MA, Flechas D. Critical dependencies of heavy ion-induced destructive failures in electronic devices. Abstracts. 2019 ;[citado 2024 jul. 24 ] -
Vancouver
Alberton SGPN, Medina NH, Added N, Aguiar VÂP de, Menegasso R, Macchione ELA, Escudeiro R, Guazzelli MA, Flechas D. Critical dependencies of heavy ion-induced destructive failures in electronic devices. Abstracts. 2019 ;[citado 2024 jul. 24 ] - Destructive single-event effects in semiconductor devices
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