Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA (2024)
- Authors:
- USP affiliated authors: ADDED, NEMITALA - IF ; MEDINA, NILBERTO HEDER - IF ; ALBERTON, SAULO GABRIEL PEREIRA NASCIMENTO - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF
- Unidade: IF
- DOI: 10.1109/LATS62223.2024.10534591
- Subjects: FÍSICA DE PARTÍCULAS; RADIAÇÃO IONIZANTE; ACELERADOR DE PARTÍCULAS; ÍONS
- Keywords: RADIATION EFFECTS; SMALL SATELLITES; FOCUSING; LOGIC GATES; RELIABILITY ENGENEERING; LINEAR PARTICLE ACCELERATOR; IONS; SERIAL COMMUNICATION; IONIZING RADIATION; FIELD-PROGRAMMABLE GATE ARRAYS; SINGLE EVENT EFFECTS
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher: IEEE
- Publisher place: Piscataway, NJ
- Date published: 2024
- Conference titles: IEEE 25th Latin American Test Symposium (LATS)
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
COSTA, Victor O. et al. Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA. 2024, Anais.. Piscataway, NJ: IEEE, 2024. Disponível em: https://doi.org/10.1109/LATS62223.2024.10534591. Acesso em: 27 dez. 2025. -
APA
Costa, V. O., Benevenuti, F., Menezes, R., Sato, L. S., Loures, L., Kastensmidt, F. L., et al. (2024). Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA. In . Piscataway, NJ: IEEE. doi:10.1109/LATS62223.2024.10534591 -
NLM
Costa VO, Benevenuti F, Menezes R, Sato LS, Loures L, Kastensmidt FL, Added N, Alberton S, Aguiar VAP, Medina NH. Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA [Internet]. 2024 ;[citado 2025 dez. 27 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534591 -
Vancouver
Costa VO, Benevenuti F, Menezes R, Sato LS, Loures L, Kastensmidt FL, Added N, Alberton S, Aguiar VAP, Medina NH. Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA [Internet]. 2024 ;[citado 2025 dez. 27 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534591 - Neutron-Induced Radiation Effects in UMOS Transistor
- Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs
- Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection
- Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA
- Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs
- Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects
- Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects
- Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy
- COTS Tolerant to Total Ionizing Dose (TID): AlGaN/GaN-based transistor 10 KeV X-ray Analysis
- Monte Carlo simulation to select nuclear targets for the production of low intensity heavy-ions beams
Informações sobre o DOI: 10.1109/LATS62223.2024.10534591 (Fonte: oaDOI API)
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
