Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge (2025)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; SAYEG, ISAAC JAMIL - IGC ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF ; ALBERTON, SAULO GABRIEL PEREIRA NASCIMENTO - IF ; AGUIRRE, FERNANDO RODRIGUES - IF ; ALLEGRO, PAULA RANGEL PESTANA - EP ; SANTOS, HELLEN CRISTINE DOS - IF
- Unidades: IF; IGC; EP
- DOI: 10.1109/TED.2024.3497927
- Subjects: RADIAÇÃO IONIZANTE; ÍONS
- Keywords: IONS; SILICON; INTEGRATED CIRCUIT MODELING; RADIATION EFFECTS; DATA MODELS,; ANALYTICAL MODELS; TRANSIENT ANALYSIS; ION BEAMS; HISTOGRAMS; PASSIVATION; CHARGE COLLECTION; FUNNELING,; ION-INDUCED CHARGE; SINGLE-EVENT TRANSIENT
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher: IEEE
- Publisher place: Piscataway, NJ
- Date published: 2025
- Source:
- Título: IEEE Transactions on Electron Devices
- Volume/Número/Paginação/Ano: Volume: 72, Issue: 1, p. 31 - 36, 2025
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
AGUIAR, Vitor A. P. et al. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge. IEEE Transactions on Electron Devices, p. 31 - 36, 2025Tradução . . Disponível em: https://doi.org/10.1109/TED.2024.3497927. Acesso em: 28 dez. 2025. -
APA
Aguiar, V. A. P., Medina, N. H., Added, N., Alberton, S., Macchione, E. L. A., Guazzelli, M. A., et al. (2025). Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge. IEEE Transactions on Electron Devices, 31 - 36. doi:10.1109/TED.2024.3497927 -
NLM
Aguiar VAP, Medina NH, Added N, Alberton S, Macchione ELA, Guazzelli MA, Melo MAA, Oliveira JA, Giacomini RC, Aguirre FR, Allegro PRP, Zaggato HCS, Sayeg IJ. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge [Internet]. IEEE Transactions on Electron Devices. 2025 ; 31 - 36.[citado 2025 dez. 28 ] Available from: https://doi.org/10.1109/TED.2024.3497927 -
Vancouver
Aguiar VAP, Medina NH, Added N, Alberton S, Macchione ELA, Guazzelli MA, Melo MAA, Oliveira JA, Giacomini RC, Aguirre FR, Allegro PRP, Zaggato HCS, Sayeg IJ. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge [Internet]. IEEE Transactions on Electron Devices. 2025 ; 31 - 36.[citado 2025 dez. 28 ] Available from: https://doi.org/10.1109/TED.2024.3497927 - Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects
- Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection
- Neutron-Induced Radiation Effects in UMOS Transistor
- Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA
- Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy
- Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs
- Critical dependencies of heavy ion-induced destructive failures in electronic devices
- Destructive single-event effects in semiconductor devices
- Study of radiation effects in embedded systems
- Study of radiation effects in embedded systems
Informações sobre o DOI: 10.1109/TED.2024.3497927 (Fonte: oaDOI API)
Download do texto completo
| Tipo | Nome | Link | |
|---|---|---|---|
 |
3232968.pdf |
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
