Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge (2024)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; SAYEG, ISAAC JAMIL - IGC ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF ; ALBERTON, SAULO GABRIEL PEREIRA NASCIMENTO - IF ; AGUIRRE, FERNANDO RODRIGUES - IF ; ALLEGRO, PAULA RANGEL PESTANA - EP ; SANTOS, HELLEN CRISTINE DOS - IF
- Unidades: IF; IGC; EP
- DOI: 10.1109/TED.2024.3497927
- Subjects: ÍONS PESADOS; FEIXES; RADIAÇÃO IONIZANTE
- Keywords: CHARGE COLLECTION; FUNNELING; ION-INDUCED CHARGE; SINGLE-EVENT TRANSIENT
- Language: Inglês
- Imprenta:
- Publisher: Institute of Electrical and Electronics Engineers
- Publisher place: Piscataway, NJ
- Date published: 2024
- Source:
- Título: IEEE Transactions on Electron Devices
- Volume/Número/Paginação/Ano: Volume: 72, Issue: 1, Page(s): 31 - 36, January 2025
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
AGUIAR, Vitor A. P. et al. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge. IEEE Transactions on Electron Devices, 2024Tradução . . Disponível em: https://doi.org/10.1109/TED.2024.3497927. Acesso em: 25 dez. 2025. -
APA
Aguiar, V. A. P., Medina, N. H., Added, N., Alberton, S. G., Macchione, E. L. A., Guazzelli, M. A., et al. (2024). Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge. IEEE Transactions on Electron Devices. doi:10.1109/TED.2024.3497927 -
NLM
Aguiar VAP, Medina NH, Added N, Alberton SG, Macchione ELA, Guazzelli MA, Melo MAA, Oliveira JA, Giacomini RC, Aguirre FR, Allegro PRP, Zaggato HCS, Sayeg IJ. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge [Internet]. IEEE Transactions on Electron Devices. 2024 ;[citado 2025 dez. 25 ] Available from: https://doi.org/10.1109/TED.2024.3497927 -
Vancouver
Aguiar VAP, Medina NH, Added N, Alberton SG, Macchione ELA, Guazzelli MA, Melo MAA, Oliveira JA, Giacomini RC, Aguirre FR, Allegro PRP, Zaggato HCS, Sayeg IJ. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge [Internet]. IEEE Transactions on Electron Devices. 2024 ;[citado 2025 dez. 25 ] Available from: https://doi.org/10.1109/TED.2024.3497927 - Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects
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Informações sobre o DOI: 10.1109/TED.2024.3497927 (Fonte: oaDOI API)
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