Filtros : "PEREYRA, INÊS" Removido: "2017" Limpar

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  • Source: Journal of Applied Electrochemistry. Unidades: EP, IQ

    Subjects: ESPECTROSCOPIA RAMAN, MICROSCOPIA

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      RIBEIRO, Leonardo Marquez Alves et al. Low-cost laser for fabrication of affordable graphene-induced microband sensors. Journal of Applied Electrochemistry, 2024Tradução . . Disponível em: https://dx.doi.org/10.1007/s10800-024-02132-w. Acesso em: 15 nov. 2024.
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      Ribeiro, L. M. A., Feria, D. J., Falcoswki, P. C., Carreño, M. N. P., Pereyra, I., & Bertotti, M. (2024). Low-cost laser for fabrication of affordable graphene-induced microband sensors. Journal of Applied Electrochemistry. doi:10.1007/s10800-024-02132-w
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      Ribeiro LMA, Feria DJ, Falcoswki PC, Carreño MNP, Pereyra I, Bertotti M. Low-cost laser for fabrication of affordable graphene-induced microband sensors [Internet]. Journal of Applied Electrochemistry. 2024 ;[citado 2024 nov. 15 ] Available from: https://dx.doi.org/10.1007/s10800-024-02132-w
    • Vancouver

      Ribeiro LMA, Feria DJ, Falcoswki PC, Carreño MNP, Pereyra I, Bertotti M. Low-cost laser for fabrication of affordable graphene-induced microband sensors [Internet]. Journal of Applied Electrochemistry. 2024 ;[citado 2024 nov. 15 ] Available from: https://dx.doi.org/10.1007/s10800-024-02132-w
  • Source: Brazilian Journal of Chemical Engineering. Unidades: EP, IF

    Assunto: FLUORESCÊNCIA

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      SOARES, Marco C P et al. Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials. Brazilian Journal of Chemical Engineering, 2023Tradução . . Disponível em: https://doi.org/10.1007/s43153-023-00408-w. Acesso em: 15 nov. 2024.
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      Soares, M. C. P., Carreño, M. N. P., Pereyra, I., Ramos, C. A. S., Cid Sánchez, M., Goveia, G. S., & Chubaci, J. F. D. (2023). Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials. Brazilian Journal of Chemical Engineering. doi:10.1007/s43153-023-00408-w
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      Soares MCP, Carreño MNP, Pereyra I, Ramos CAS, Cid Sánchez M, Goveia GS, Chubaci JFD. Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials [Internet]. Brazilian Journal of Chemical Engineering. 2023 ;[citado 2024 nov. 15 ] Available from: https://doi.org/10.1007/s43153-023-00408-w
    • Vancouver

      Soares MCP, Carreño MNP, Pereyra I, Ramos CAS, Cid Sánchez M, Goveia GS, Chubaci JFD. Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials [Internet]. Brazilian Journal of Chemical Engineering. 2023 ;[citado 2024 nov. 15 ] Available from: https://doi.org/10.1007/s43153-023-00408-w
  • Source: ACS Biomaterials Science & Engineering. Unidade: EP

    Subjects: COBRE, SUPERFÍCIES

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      SILVA, Daniel José da et al. Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2. ACS Biomaterials Science & Engineering, p. 9 , 2023Tradução . . Disponível em: https://doi.org/10.1021/acsbiomaterials.2c01529. Acesso em: 15 nov. 2024.
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      Silva, D. J. da, Duran, A., Cabral, A. D., Fonseca, F. L. A., Hui, W. S., Parra, D. F., et al. (2023). Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2. ACS Biomaterials Science & Engineering, 9 . doi:10.1021/acsbiomaterials.2c01529
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      Silva DJ da, Duran A, Cabral AD, Fonseca FLA, Hui WS, Parra DF, Bueno RF, Pereyra I, Rosa DS. Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2 [Internet]. ACS Biomaterials Science & Engineering. 2023 ;9 .[citado 2024 nov. 15 ] Available from: https://doi.org/10.1021/acsbiomaterials.2c01529
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      Silva DJ da, Duran A, Cabral AD, Fonseca FLA, Hui WS, Parra DF, Bueno RF, Pereyra I, Rosa DS. Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2 [Internet]. ACS Biomaterials Science & Engineering. 2023 ;9 .[citado 2024 nov. 15 ] Available from: https://doi.org/10.1021/acsbiomaterials.2c01529
  • Conference titles: Symposium on Microelectronics Technology and Devices - SBMicro. Unidades: IQ, EP

    Assunto: ELETROQUÍMICA

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      FARIA, D. J et al. Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide. 2022, Anais.. Piscataway: IEEE, 2022. Disponível em: https://doi.org/10.1109/SBMICRO55822.2022.9881043. Acesso em: 15 nov. 2024.
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      Faria, D. J., Pinto, A. L. M., Bertotti, M., Carreño, M. N. P., & Pereyra, I. (2022). Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide. In . Piscataway: IEEE. doi:10.1109/SBMICRO55822.2022.9881043
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      Faria DJ, Pinto ALM, Bertotti M, Carreño MNP, Pereyra I. Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide [Internet]. 2022 ;[citado 2024 nov. 15 ] Available from: https://doi.org/10.1109/SBMICRO55822.2022.9881043
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      Faria DJ, Pinto ALM, Bertotti M, Carreño MNP, Pereyra I. Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide [Internet]. 2022 ;[citado 2024 nov. 15 ] Available from: https://doi.org/10.1109/SBMICRO55822.2022.9881043
  • Source: Resumos. Conference titles: Encontro de Outono da Sociedade Brasileira de Física. Unidades: EP, IP, IF

    Assunto: TEMPERATURA

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      MEDEIROS, Marina Sparvoli de et al. Effect of annealing temperature on indium tin oxynitride (ITON) electrical and optical characteristics. 2022, Anais.. São Paulo: Sociedade Brasileira de Física, 2022. . Acesso em: 15 nov. 2024.
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      Medeiros, M. S. de, Pederzini, V., Abe, I. Y., Lopes, A., Pereyra, I., & Onmori, R. K. (2022). Effect of annealing temperature on indium tin oxynitride (ITON) electrical and optical characteristics. In Resumos. São Paulo: Sociedade Brasileira de Física.
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      Medeiros MS de, Pederzini V, Abe IY, Lopes A, Pereyra I, Onmori RK. Effect of annealing temperature on indium tin oxynitride (ITON) electrical and optical characteristics. Resumos. 2022 ;[citado 2024 nov. 15 ]
    • Vancouver

      Medeiros MS de, Pederzini V, Abe IY, Lopes A, Pereyra I, Onmori RK. Effect of annealing temperature on indium tin oxynitride (ITON) electrical and optical characteristics. Resumos. 2022 ;[citado 2024 nov. 15 ]
  • Source: Canadian Journal of Physics. Unidade: EP

    Subjects: RASTREAMENTO, ULTRASSONOGRAFIA

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      ARMAS ALVARADO, Maria Elisia et al. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide. Canadian Journal of Physics, v. 92, p. 952-954, 2014Tradução . . Disponível em: https://doi.org/10.1139/cjp-2013-0587. Acesso em: 15 nov. 2024.
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      Armas Alvarado, M. E., Pelegrini, M. V., Pereyra, I., Assumpção, T. A. A. de, Kassab, L. R. P., & Alayo Chávez, M. I. (2014). Fabrication and characterization of aluminum nitride pedestal-type optical waveguide. Canadian Journal of Physics, 92, 952-954. doi:10.1139/cjp-2013-0587
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      Armas Alvarado ME, Pelegrini MV, Pereyra I, Assumpção TAA de, Kassab LRP, Alayo Chávez MI. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide [Internet]. Canadian Journal of Physics. 2014 ;92 952-954.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1139/cjp-2013-0587
    • Vancouver

      Armas Alvarado ME, Pelegrini MV, Pereyra I, Assumpção TAA de, Kassab LRP, Alayo Chávez MI. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide [Internet]. Canadian Journal of Physics. 2014 ;92 952-954.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1139/cjp-2013-0587
  • Source: Canadian Journal of Physics. Unidade: EP

    Subjects: FILMES FINOS, FOTÔNICA

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      PELEGRINI, Marcelo Aparecido et al. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1. Canadian Journal of Physics, v. 92, n. 7/8, p. 940-942, 2014Tradução . . Disponível em: https://doi.org/10.1139/cjp-2013-0556. Acesso em: 15 nov. 2024.
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      Pelegrini, M. A., Pereyra, I., Alvarado, M. A., & Alayo Chávez, M. I. (2014). Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1. Canadian Journal of Physics, 92( 7/8), 940-942. doi:10.1139/cjp-2013-0556
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      Pelegrini MA, Pereyra I, Alvarado MA, Alayo Chávez MI. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1 [Internet]. Canadian Journal of Physics. 2014 ; 92( 7/8): 940-942.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1139/cjp-2013-0556
    • Vancouver

      Pelegrini MA, Pereyra I, Alvarado MA, Alayo Chávez MI. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1 [Internet]. Canadian Journal of Physics. 2014 ; 92( 7/8): 940-942.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1139/cjp-2013-0556
  • Source: Canadian Journal of Physics. Unidade: EP

    Assunto: RADIOGRAFIA

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      PELEGRINI, Marcus Vinícius et al. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering. Canadian Journal of Physics, v. 92, p. 940-942, 2014Tradução . . Disponível em: https://doi.org/10.1139/cjp-2013-0556. Acesso em: 15 nov. 2024.
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      Pelegrini, M. V., Alayo Chávez, M. I., Armas Alvarado, M. E., & Pereyra, I. (2014). Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering. Canadian Journal of Physics, 92, 940-942. doi:10.1139/cjp-2013-0556
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      Pelegrini MV, Alayo Chávez MI, Armas Alvarado ME, Pereyra I. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering [Internet]. Canadian Journal of Physics. 2014 ;92 940-942.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1139/cjp-2013-0556
    • Vancouver

      Pelegrini MV, Alayo Chávez MI, Armas Alvarado ME, Pereyra I. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering [Internet]. Canadian Journal of Physics. 2014 ;92 940-942.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1139/cjp-2013-0556
  • Source: Microelectronics technology and devices, SBMicro. Conference titles: International Symposium on Microelectronics Technology and Devices. Unidade: EP

    Assunto: MICROELETRÔNICA

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      FRAGA, Tiago Marques e ALBERTIN, Katia Franklin e PEREYRA, Inés. TiO2 nanotubes production and characterization. 2012, Anais.. Pennington: Escola Politécnica, Universidade de São Paulo, 2012. Disponível em: https://doi.org/10.1149/04901.0199ecst. Acesso em: 15 nov. 2024.
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      Fraga, T. M., Albertin, K. F., & Pereyra, I. (2012). TiO2 nanotubes production and characterization. In Microelectronics technology and devices, SBMicro. Pennington: Escola Politécnica, Universidade de São Paulo. doi:10.1149/04901.0199ecst
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      Fraga TM, Albertin KF, Pereyra I. TiO2 nanotubes production and characterization [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 nov. 15 ] Available from: https://doi.org/10.1149/04901.0199ecst
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      Fraga TM, Albertin KF, Pereyra I. TiO2 nanotubes production and characterization [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 nov. 15 ] Available from: https://doi.org/10.1149/04901.0199ecst
  • Source: Microelectronics technology and devices, SBMicro. Conference titles: International Symposium on Microelectronics Technology and Devices. Unidade: EP

    Assunto: MICROELETRÔNICA

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      ABE, Igor Yamamoto e PEREYRA, Inés. Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes. 2012, Anais.. Pennington: Escola Politécnica, Universidade de São Paulo, 2012. Disponível em: https://doi.org/10.1149/04901.0255ecst. Acesso em: 15 nov. 2024.
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      Abe, I. Y., & Pereyra, I. (2012). Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes. In Microelectronics technology and devices, SBMicro. Pennington: Escola Politécnica, Universidade de São Paulo. doi:10.1149/04901.0255ecst
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      Abe IY, Pereyra I. Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 nov. 15 ] Available from: https://doi.org/10.1149/04901.0255ecst
    • Vancouver

      Abe IY, Pereyra I. Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 nov. 15 ] Available from: https://doi.org/10.1149/04901.0255ecst
  • Source: AIP Conference Proceedings. Conference titles: X-Ray Absorption Fine Structure - XAFS 13th International Conference. Unidades: IF, EP

    Subjects: FILMES FINOS, DIFRAÇÃO POR RAIOS X

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      PRADO, Rogerio Junqueira et al. Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS. AIP Conference Proceedings. New York: The Institute. Disponível em: http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips. Acesso em: 15 nov. 2024. , 2007
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      Prado, R. J., Fantini, M. C. de A., Páez Carreño, M. N., Pereyra, I., & Flank, A. M. (2007). Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS. AIP Conference Proceedings. New York: The Institute. Recuperado de http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips
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      Prado RJ, Fantini MC de A, Páez Carreño MN, Pereyra I, Flank AM. Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS [Internet]. AIP Conference Proceedings. 2007 ; 882 529-531.[citado 2024 nov. 15 ] Available from: http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips
    • Vancouver

      Prado RJ, Fantini MC de A, Páez Carreño MN, Pereyra I, Flank AM. Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS [Internet]. AIP Conference Proceedings. 2007 ; 882 529-531.[citado 2024 nov. 15 ] Available from: http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips
  • Source: Journal of Integrated Circuits and Systems. Unidade: EP

    Subjects: MICROELETRÔNICA, CIÊNCIA DA COMPUTAÇÃO

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      ALBERTIN, Katia Franklin e VALLE, M A e PEREYRA, Inés. Study of MOS capacitor with TiO2 and SiO2 and SiO2/TiO2 gate dielectric. Journal of Integrated Circuits and Systems, v. 2, n. 2, 2007Tradução . . Acesso em: 15 nov. 2024.
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      Albertin, K. F., Valle, M. A., & Pereyra, I. (2007). Study of MOS capacitor with TiO2 and SiO2 and SiO2/TiO2 gate dielectric. Journal of Integrated Circuits and Systems, 2( 2).
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      Albertin KF, Valle MA, Pereyra I. Study of MOS capacitor with TiO2 and SiO2 and SiO2/TiO2 gate dielectric. Journal of Integrated Circuits and Systems. 2007 ;2( 2):[citado 2024 nov. 15 ]
    • Vancouver

      Albertin KF, Valle MA, Pereyra I. Study of MOS capacitor with TiO2 and SiO2 and SiO2/TiO2 gate dielectric. Journal of Integrated Circuits and Systems. 2007 ;2( 2):[citado 2024 nov. 15 ]
  • Source: SBMicro 2007. Conference titles: International Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP

    Assunto: MICROELETRÔNICA

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      ALBERTIN, Katia Franklin e VALLE, Marcio A e PEREYRA, Inés. Study of MOS capacitors with annealed TiO2 gate dielectric layer. 2007, Anais.. Pennington: The Electrochemical Society, 2007. Disponível em: https://doi.org/10.1149/1.2766918. Acesso em: 15 nov. 2024.
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      Albertin, K. F., Valle, M. A., & Pereyra, I. (2007). Study of MOS capacitors with annealed TiO2 gate dielectric layer. In SBMicro 2007. Pennington: The Electrochemical Society. doi:10.1149/1.2766918
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      Albertin KF, Valle MA, Pereyra I. Study of MOS capacitors with annealed TiO2 gate dielectric layer [Internet]. SBMicro 2007. 2007 ;[citado 2024 nov. 15 ] Available from: https://doi.org/10.1149/1.2766918
    • Vancouver

      Albertin KF, Valle MA, Pereyra I. Study of MOS capacitors with annealed TiO2 gate dielectric layer [Internet]. SBMicro 2007. 2007 ;[citado 2024 nov. 15 ] Available from: https://doi.org/10.1149/1.2766918
  • Source: Abstracts. Conference titles: Brazilian MRS Meeting. Unidades: IF, EP

    Assunto: MATERIAIS

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      CRIADO, Denise e FANTINI, Márcia Carvalho de Abreu e PEREYRA, Inés. EXAFS analysis on SiOxNy films. 2006, Anais.. Florianópolis: SBPMat - Sociedade Brasileira de Pesquisa em Materiais, 2006. . Acesso em: 15 nov. 2024.
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      Criado, D., Fantini, M. C. de A., & Pereyra, I. (2006). EXAFS analysis on SiOxNy films. In Abstracts. Florianópolis: SBPMat - Sociedade Brasileira de Pesquisa em Materiais.
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      Criado D, Fantini MC de A, Pereyra I. EXAFS analysis on SiOxNy films. Abstracts. 2006 ;[citado 2024 nov. 15 ]
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      Criado D, Fantini MC de A, Pereyra I. EXAFS analysis on SiOxNy films. Abstracts. 2006 ;[citado 2024 nov. 15 ]
  • Source: Poster Session G522. Conference titles: Encontro da Sociedade Brasileira de Pesquisas em Materiais (SBPMat. Unidades: IF, EP

    Assunto: MATERIAIS (PESQUISA)

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      PEREYRA, Inés e FANTINI, Márcia Carvalho de Abreu e CRIADO, Denise. Exafs analysis on sioxny films. 2006, Anais.. Rio de Janeiro: SBPMat, 2006. Disponível em: http://www.sbpmat.org.br/5encontro/IndexPosterG.pdf. Acesso em: 15 nov. 2024.
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      Pereyra, I., Fantini, M. C. de A., & Criado, D. (2006). Exafs analysis on sioxny films. In Poster Session G522. Rio de Janeiro: SBPMat. Recuperado de http://www.sbpmat.org.br/5encontro/IndexPosterG.pdf
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      Pereyra I, Fantini MC de A, Criado D. Exafs analysis on sioxny films [Internet]. Poster Session G522. 2006 ;[citado 2024 nov. 15 ] Available from: http://www.sbpmat.org.br/5encontro/IndexPosterG.pdf
    • Vancouver

      Pereyra I, Fantini MC de A, Criado D. Exafs analysis on sioxny films [Internet]. Poster Session G522. 2006 ;[citado 2024 nov. 15 ] Available from: http://www.sbpmat.org.br/5encontro/IndexPosterG.pdf
  • Source: Journal of non-crystalline solids. Unidades: IF, EP

    Subjects: DIFRAÇÃO POR RAIOS X, ESTRUTURA DOS SÓLIDOS, FILMES FINOS

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      CRIADO, Denise et al. Study of the mechanical and structural properties of silicon oxynitride films for optical applications. Journal of non-crystalline solids, v. 352, n. 23-25, p. 2319-2323, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.jnoncrysol.2006.03.012. Acesso em: 15 nov. 2024.
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      Criado, D., Alayo Chávez, M. I., Fantini, M. C. de A., & Pereyra, I. (2006). Study of the mechanical and structural properties of silicon oxynitride films for optical applications. Journal of non-crystalline solids, 352( 23-25), 2319-2323. doi:10.1016/j.jnoncrysol.2006.03.012
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      Criado D, Alayo Chávez MI, Fantini MC de A, Pereyra I. Study of the mechanical and structural properties of silicon oxynitride films for optical applications [Internet]. Journal of non-crystalline solids. 2006 ; 352( 23-25): 2319-2323.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1016/j.jnoncrysol.2006.03.012
    • Vancouver

      Criado D, Alayo Chávez MI, Fantini MC de A, Pereyra I. Study of the mechanical and structural properties of silicon oxynitride films for optical applications [Internet]. Journal of non-crystalline solids. 2006 ; 352( 23-25): 2319-2323.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1016/j.jnoncrysol.2006.03.012
  • Source: Journal of Non-Crystalline Solids. Unidades: IF, EP

    Subjects: FILMES FINOS, ESPECTROSCOPIA DE RAIO X

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      CRIADO, Denise et al. Local bonding in PECVD-"SiO IND.X" "N IND.Y" films. Journal of Non-Crystalline Solids, v. 352, n. 9-20, p. 1298-1302, 2006Tradução . . Disponível em: http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e. Acesso em: 15 nov. 2024.
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      Criado, D., Alayo Chávez, M. I., Fantini, M. C. de A., & Pereyra, I. (2006). Local bonding in PECVD-"SiO IND.X" "N IND.Y" films. Journal of Non-Crystalline Solids, 352( 9-20), 1298-1302. Recuperado de http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e
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      Criado D, Alayo Chávez MI, Fantini MC de A, Pereyra I. Local bonding in PECVD-"SiO IND.X" "N IND.Y" films [Internet]. Journal of Non-Crystalline Solids. 2006 ; 352( 9-20): 1298-1302.[citado 2024 nov. 15 ] Available from: http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e
    • Vancouver

      Criado D, Alayo Chávez MI, Fantini MC de A, Pereyra I. Local bonding in PECVD-"SiO IND.X" "N IND.Y" films [Internet]. Journal of Non-Crystalline Solids. 2006 ; 352( 9-20): 1298-1302.[citado 2024 nov. 15 ] Available from: http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e
  • Source: Journal of the Brazilian Chemical Society. Unidades: IF, EP

    Subjects: FÍSICO-QUÍMICA, CRISTALOGRAFIA FÍSICA, ESPECTROSCOPIA RAMAN, DIFRAÇÃO POR RAIOS X, ESPECTROSCOPIA INFRAVERMELHA, FILMES FINOS

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    • ABNT

      FORHAN, Neisy Amparo Escobar e FANTINI, Marcia e PEREYRA, Inés. Characterization of Si1-xCx:H thin films deposited by PECVD for SiCOI heterojuntion fabrication. Journal of the Brazilian Chemical Society, v. 17, n. 6, p. 1158-1162, 2006Tradução . . Disponível em: https://doi.org/10.1590/S0103-50532006000600013. Acesso em: 15 nov. 2024.
    • APA

      Forhan, N. A. E., Fantini, M., & Pereyra, I. (2006). Characterization of Si1-xCx:H thin films deposited by PECVD for SiCOI heterojuntion fabrication. Journal of the Brazilian Chemical Society, 17( 6), 1158-1162. doi:10.1590/S0103-50532006000600013
    • NLM

      Forhan NAE, Fantini M, Pereyra I. Characterization of Si1-xCx:H thin films deposited by PECVD for SiCOI heterojuntion fabrication [Internet]. Journal of the Brazilian Chemical Society. 2006 ; 17( 6): 1158-1162.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1590/S0103-50532006000600013
    • Vancouver

      Forhan NAE, Fantini M, Pereyra I. Characterization of Si1-xCx:H thin films deposited by PECVD for SiCOI heterojuntion fabrication [Internet]. Journal of the Brazilian Chemical Society. 2006 ; 17( 6): 1158-1162.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1590/S0103-50532006000600013
  • Source: Abstracts. Conference titles: Brazilian MRS Meeting. Unidade: EP

    Assunto: MATERIAIS

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    • ABNT

      RIBEIRO, M. et al. Photoluminescenct silicon-rich silicon oxynitride alloys grown by PECVD. 2006, Anais.. Florianópolis: SBPMat - Sociedade Brasileira de Pesquisa em Materiais, 2006. . Acesso em: 15 nov. 2024.
    • APA

      Ribeiro, M., Criado, D., Aparecido, R., & Pereyra, I. (2006). Photoluminescenct silicon-rich silicon oxynitride alloys grown by PECVD. In Abstracts. Florianópolis: SBPMat - Sociedade Brasileira de Pesquisa em Materiais.
    • NLM

      Ribeiro M, Criado D, Aparecido R, Pereyra I. Photoluminescenct silicon-rich silicon oxynitride alloys grown by PECVD. Abstracts. 2006 ;[citado 2024 nov. 15 ]
    • Vancouver

      Ribeiro M, Criado D, Aparecido R, Pereyra I. Photoluminescenct silicon-rich silicon oxynitride alloys grown by PECVD. Abstracts. 2006 ;[citado 2024 nov. 15 ]
  • Source: Abstracts. Conference titles: Brazilian MRS Meeting. Unidades: IF, EP

    Assunto: MATERIAIS

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    • ABNT

      ALBERTIN, Katia Franklin e FANTINI, Márcia Carvalho de Abreu e PEREYRA, Inés. Study of the structural properties of the PECVD SiOxNy dielectric layers obtained with different RF powers by XANES and EXAFS analysis. 2006, Anais.. Florianópolis: SBPMat - Sociedade Brasileira de Pesquisa em Materiais, 2006. . Acesso em: 15 nov. 2024.
    • APA

      Albertin, K. F., Fantini, M. C. de A., & Pereyra, I. (2006). Study of the structural properties of the PECVD SiOxNy dielectric layers obtained with different RF powers by XANES and EXAFS analysis. In Abstracts. Florianópolis: SBPMat - Sociedade Brasileira de Pesquisa em Materiais.
    • NLM

      Albertin KF, Fantini MC de A, Pereyra I. Study of the structural properties of the PECVD SiOxNy dielectric layers obtained with different RF powers by XANES and EXAFS analysis. Abstracts. 2006 ;[citado 2024 nov. 15 ]
    • Vancouver

      Albertin KF, Fantini MC de A, Pereyra I. Study of the structural properties of the PECVD SiOxNy dielectric layers obtained with different RF powers by XANES and EXAFS analysis. Abstracts. 2006 ;[citado 2024 nov. 15 ]

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