Filtros : "PEREYRA, INÊS" Removido: "Brasil" Limpar

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  • Source: Journal of Applied Electrochemistry. Unidades: EP, IQ

    Subjects: ESPECTROSCOPIA RAMAN, MICROSCOPIA

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      RIBEIRO, Leonardo Marquez Alves et al. Low-cost laser for fabrication of affordable graphene-induced microband sensors. Journal of Applied Electrochemistry, 2024Tradução . . Disponível em: https://dx.doi.org/10.1007/s10800-024-02132-w. Acesso em: 11 out. 2024.
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      Ribeiro, L. M. A., Feria, D. J., Falcoswki, P. C., Carreño, M. N. P., Pereyra, I., & Bertotti, M. (2024). Low-cost laser for fabrication of affordable graphene-induced microband sensors. Journal of Applied Electrochemistry. doi:10.1007/s10800-024-02132-w
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      Ribeiro LMA, Feria DJ, Falcoswki PC, Carreño MNP, Pereyra I, Bertotti M. Low-cost laser for fabrication of affordable graphene-induced microband sensors [Internet]. Journal of Applied Electrochemistry. 2024 ;[citado 2024 out. 11 ] Available from: https://dx.doi.org/10.1007/s10800-024-02132-w
    • Vancouver

      Ribeiro LMA, Feria DJ, Falcoswki PC, Carreño MNP, Pereyra I, Bertotti M. Low-cost laser for fabrication of affordable graphene-induced microband sensors [Internet]. Journal of Applied Electrochemistry. 2024 ;[citado 2024 out. 11 ] Available from: https://dx.doi.org/10.1007/s10800-024-02132-w
  • Source: Brazilian Journal of Chemical Engineering. Unidades: EP, IF

    Assunto: FLUORESCÊNCIA

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      SOARES, Marco C P et al. Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials. Brazilian Journal of Chemical Engineering, 2023Tradução . . Disponível em: https://doi.org/10.1007/s43153-023-00408-w. Acesso em: 11 out. 2024.
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      Soares, M. C. P., Carreño, M. N. P., Pereyra, I., Ramos, C. A. S., Cid Sánchez, M., Goveia, G. S., & Chubaci, J. F. D. (2023). Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials. Brazilian Journal of Chemical Engineering. doi:10.1007/s43153-023-00408-w
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      Soares MCP, Carreño MNP, Pereyra I, Ramos CAS, Cid Sánchez M, Goveia GS, Chubaci JFD. Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials [Internet]. Brazilian Journal of Chemical Engineering. 2023 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1007/s43153-023-00408-w
    • Vancouver

      Soares MCP, Carreño MNP, Pereyra I, Ramos CAS, Cid Sánchez M, Goveia GS, Chubaci JFD. Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials [Internet]. Brazilian Journal of Chemical Engineering. 2023 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1007/s43153-023-00408-w
  • Source: ACS Biomaterials Science & Engineering. Unidade: EP

    Subjects: COBRE, SUPERFÍCIES

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      SILVA, Daniel José da et al. Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2. ACS Biomaterials Science & Engineering, p. 9 , 2023Tradução . . Disponível em: https://doi.org/10.1021/acsbiomaterials.2c01529. Acesso em: 11 out. 2024.
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      Silva, D. J. da, Duran, A., Cabral, A. D., Fonseca, F. L. A., Hui, W. S., Parra, D. F., et al. (2023). Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2. ACS Biomaterials Science & Engineering, 9 . doi:10.1021/acsbiomaterials.2c01529
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      Silva DJ da, Duran A, Cabral AD, Fonseca FLA, Hui WS, Parra DF, Bueno RF, Pereyra I, Rosa DS. Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2 [Internet]. ACS Biomaterials Science & Engineering. 2023 ;9 .[citado 2024 out. 11 ] Available from: https://doi.org/10.1021/acsbiomaterials.2c01529
    • Vancouver

      Silva DJ da, Duran A, Cabral AD, Fonseca FLA, Hui WS, Parra DF, Bueno RF, Pereyra I, Rosa DS. Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2 [Internet]. ACS Biomaterials Science & Engineering. 2023 ;9 .[citado 2024 out. 11 ] Available from: https://doi.org/10.1021/acsbiomaterials.2c01529
  • Conference titles: Symposium on Microelectronics Technology and Devices - SBMicro. Unidades: IQ, EP

    Assunto: ELETROQUÍMICA

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      FARIA, D. J et al. Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide. 2022, Anais.. Piscataway: IEEE, 2022. Disponível em: https://doi.org/10.1109/SBMICRO55822.2022.9881043. Acesso em: 11 out. 2024.
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      Faria, D. J., Pinto, A. L. M., Bertotti, M., Carreño, M. N. P., & Pereyra, I. (2022). Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide. In . Piscataway: IEEE. doi:10.1109/SBMICRO55822.2022.9881043
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      Faria DJ, Pinto ALM, Bertotti M, Carreño MNP, Pereyra I. Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide [Internet]. 2022 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1109/SBMICRO55822.2022.9881043
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      Faria DJ, Pinto ALM, Bertotti M, Carreño MNP, Pereyra I. Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide [Internet]. 2022 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1109/SBMICRO55822.2022.9881043
  • Source: Canadian Journal of Physics. Unidade: EP

    Subjects: RASTREAMENTO, ULTRASSONOGRAFIA

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      ARMAS ALVARADO, Maria Elisia et al. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide. Canadian Journal of Physics, v. 92, p. 952-954, 2014Tradução . . Disponível em: https://doi.org/10.1139/cjp-2013-0587. Acesso em: 11 out. 2024.
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      Armas Alvarado, M. E., Pelegrini, M. V., Pereyra, I., Assumpção, T. A. A. de, Kassab, L. R. P., & Alayo Chávez, M. I. (2014). Fabrication and characterization of aluminum nitride pedestal-type optical waveguide. Canadian Journal of Physics, 92, 952-954. doi:10.1139/cjp-2013-0587
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      Armas Alvarado ME, Pelegrini MV, Pereyra I, Assumpção TAA de, Kassab LRP, Alayo Chávez MI. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide [Internet]. Canadian Journal of Physics. 2014 ;92 952-954.[citado 2024 out. 11 ] Available from: https://doi.org/10.1139/cjp-2013-0587
    • Vancouver

      Armas Alvarado ME, Pelegrini MV, Pereyra I, Assumpção TAA de, Kassab LRP, Alayo Chávez MI. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide [Internet]. Canadian Journal of Physics. 2014 ;92 952-954.[citado 2024 out. 11 ] Available from: https://doi.org/10.1139/cjp-2013-0587
  • Source: Canadian Journal of Physics. Unidade: EP

    Subjects: FILMES FINOS, FOTÔNICA

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      PELEGRINI, Marcelo Aparecido et al. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1. Canadian Journal of Physics, v. 92, n. 7/8, p. 940-942, 2014Tradução . . Disponível em: https://doi.org/10.1139/cjp-2013-0556. Acesso em: 11 out. 2024.
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      Pelegrini, M. A., Pereyra, I., Alvarado, M. A., & Alayo Chávez, M. I. (2014). Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1. Canadian Journal of Physics, 92( 7/8), 940-942. doi:10.1139/cjp-2013-0556
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      Pelegrini MA, Pereyra I, Alvarado MA, Alayo Chávez MI. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1 [Internet]. Canadian Journal of Physics. 2014 ; 92( 7/8): 940-942.[citado 2024 out. 11 ] Available from: https://doi.org/10.1139/cjp-2013-0556
    • Vancouver

      Pelegrini MA, Pereyra I, Alvarado MA, Alayo Chávez MI. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1 [Internet]. Canadian Journal of Physics. 2014 ; 92( 7/8): 940-942.[citado 2024 out. 11 ] Available from: https://doi.org/10.1139/cjp-2013-0556
  • Source: Canadian Journal of Physics. Unidade: EP

    Assunto: RADIOGRAFIA

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      PELEGRINI, Marcus Vinícius et al. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering. Canadian Journal of Physics, v. 92, p. 940-942, 2014Tradução . . Disponível em: https://doi.org/10.1139/cjp-2013-0556. Acesso em: 11 out. 2024.
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      Pelegrini, M. V., Alayo Chávez, M. I., Armas Alvarado, M. E., & Pereyra, I. (2014). Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering. Canadian Journal of Physics, 92, 940-942. doi:10.1139/cjp-2013-0556
    • NLM

      Pelegrini MV, Alayo Chávez MI, Armas Alvarado ME, Pereyra I. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering [Internet]. Canadian Journal of Physics. 2014 ;92 940-942.[citado 2024 out. 11 ] Available from: https://doi.org/10.1139/cjp-2013-0556
    • Vancouver

      Pelegrini MV, Alayo Chávez MI, Armas Alvarado ME, Pereyra I. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering [Internet]. Canadian Journal of Physics. 2014 ;92 940-942.[citado 2024 out. 11 ] Available from: https://doi.org/10.1139/cjp-2013-0556
  • Source: Microelectronics technology and devices, SBMicro. Conference titles: International Symposium on Microelectronics Technology and Devices. Unidade: EP

    Assunto: MICROELETRÔNICA

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      FRAGA, Tiago Marques e ALBERTIN, Katia Franklin e PEREYRA, Inés. TiO2 nanotubes production and characterization. 2012, Anais.. Pennington: Escola Politécnica, Universidade de São Paulo, 2012. Disponível em: https://doi.org/10.1149/04901.0199ecst. Acesso em: 11 out. 2024.
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      Fraga, T. M., Albertin, K. F., & Pereyra, I. (2012). TiO2 nanotubes production and characterization. In Microelectronics technology and devices, SBMicro. Pennington: Escola Politécnica, Universidade de São Paulo. doi:10.1149/04901.0199ecst
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      Fraga TM, Albertin KF, Pereyra I. TiO2 nanotubes production and characterization [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1149/04901.0199ecst
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      Fraga TM, Albertin KF, Pereyra I. TiO2 nanotubes production and characterization [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1149/04901.0199ecst
  • Source: Microelectronics technology and devices, SBMicro. Conference titles: International Symposium on Microelectronics Technology and Devices. Unidade: EP

    Assunto: MICROELETRÔNICA

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      ABE, Igor Yamamoto e PEREYRA, Inés. Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes. 2012, Anais.. Pennington: Escola Politécnica, Universidade de São Paulo, 2012. Disponível em: https://doi.org/10.1149/04901.0255ecst. Acesso em: 11 out. 2024.
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      Abe, I. Y., & Pereyra, I. (2012). Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes. In Microelectronics technology and devices, SBMicro. Pennington: Escola Politécnica, Universidade de São Paulo. doi:10.1149/04901.0255ecst
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      Abe IY, Pereyra I. Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1149/04901.0255ecst
    • Vancouver

      Abe IY, Pereyra I. Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1149/04901.0255ecst
  • Source: AIP Conference Proceedings. Conference titles: X-Ray Absorption Fine Structure - XAFS 13th International Conference. Unidades: IF, EP

    Subjects: FILMES FINOS, DIFRAÇÃO POR RAIOS X

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      PRADO, Rogerio Junqueira et al. Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS. AIP Conference Proceedings. New York: The Institute. Disponível em: http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips. Acesso em: 11 out. 2024. , 2007
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      Prado, R. J., Fantini, M. C. de A., Páez Carreño, M. N., Pereyra, I., & Flank, A. M. (2007). Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS. AIP Conference Proceedings. New York: The Institute. Recuperado de http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips
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      Prado RJ, Fantini MC de A, Páez Carreño MN, Pereyra I, Flank AM. Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS [Internet]. AIP Conference Proceedings. 2007 ; 882 529-531.[citado 2024 out. 11 ] Available from: http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips
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      Prado RJ, Fantini MC de A, Páez Carreño MN, Pereyra I, Flank AM. Al thermal diffusion in `alfa´-`Si IND.1-X´`C IND.X´:H Thin Film Studied by XAFS [Internet]. AIP Conference Proceedings. 2007 ; 882 529-531.[citado 2024 out. 11 ] Available from: http://proceedings.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APCPCS000882000001000529000001&idtype=cvips
  • Source: SBMicro 2007. Conference titles: International Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP

    Assunto: MICROELETRÔNICA

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      ALBERTIN, Katia Franklin e VALLE, Marcio A e PEREYRA, Inés. Study of MOS capacitors with annealed TiO2 gate dielectric layer. 2007, Anais.. Pennington: The Electrochemical Society, 2007. Disponível em: https://doi.org/10.1149/1.2766918. Acesso em: 11 out. 2024.
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      Albertin, K. F., Valle, M. A., & Pereyra, I. (2007). Study of MOS capacitors with annealed TiO2 gate dielectric layer. In SBMicro 2007. Pennington: The Electrochemical Society. doi:10.1149/1.2766918
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      Albertin KF, Valle MA, Pereyra I. Study of MOS capacitors with annealed TiO2 gate dielectric layer [Internet]. SBMicro 2007. 2007 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1149/1.2766918
    • Vancouver

      Albertin KF, Valle MA, Pereyra I. Study of MOS capacitors with annealed TiO2 gate dielectric layer [Internet]. SBMicro 2007. 2007 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1149/1.2766918
  • Source: Journal of non-crystalline solids. Unidades: IF, EP

    Subjects: DIFRAÇÃO POR RAIOS X, ESTRUTURA DOS SÓLIDOS, FILMES FINOS

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      CRIADO, Denise et al. Study of the mechanical and structural properties of silicon oxynitride films for optical applications. Journal of non-crystalline solids, v. 352, n. 23-25, p. 2319-2323, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.jnoncrysol.2006.03.012. Acesso em: 11 out. 2024.
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      Criado, D., Alayo Chávez, M. I., Fantini, M. C. de A., & Pereyra, I. (2006). Study of the mechanical and structural properties of silicon oxynitride films for optical applications. Journal of non-crystalline solids, 352( 23-25), 2319-2323. doi:10.1016/j.jnoncrysol.2006.03.012
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      Criado D, Alayo Chávez MI, Fantini MC de A, Pereyra I. Study of the mechanical and structural properties of silicon oxynitride films for optical applications [Internet]. Journal of non-crystalline solids. 2006 ; 352( 23-25): 2319-2323.[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/j.jnoncrysol.2006.03.012
    • Vancouver

      Criado D, Alayo Chávez MI, Fantini MC de A, Pereyra I. Study of the mechanical and structural properties of silicon oxynitride films for optical applications [Internet]. Journal of non-crystalline solids. 2006 ; 352( 23-25): 2319-2323.[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/j.jnoncrysol.2006.03.012
  • Source: Journal of Non-Crystalline Solids. Unidades: IF, EP

    Subjects: FILMES FINOS, ESPECTROSCOPIA DE RAIO X

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      CRIADO, Denise et al. Local bonding in PECVD-"SiO IND.X" "N IND.Y" films. Journal of Non-Crystalline Solids, v. 352, n. 9-20, p. 1298-1302, 2006Tradução . . Disponível em: http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e. Acesso em: 11 out. 2024.
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      Criado, D., Alayo Chávez, M. I., Fantini, M. C. de A., & Pereyra, I. (2006). Local bonding in PECVD-"SiO IND.X" "N IND.Y" films. Journal of Non-Crystalline Solids, 352( 9-20), 1298-1302. Recuperado de http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e
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      Criado D, Alayo Chávez MI, Fantini MC de A, Pereyra I. Local bonding in PECVD-"SiO IND.X" "N IND.Y" films [Internet]. Journal of Non-Crystalline Solids. 2006 ; 352( 9-20): 1298-1302.[citado 2024 out. 11 ] Available from: http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e
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      Criado D, Alayo Chávez MI, Fantini MC de A, Pereyra I. Local bonding in PECVD-"SiO IND.X" "N IND.Y" films [Internet]. Journal of Non-Crystalline Solids. 2006 ; 352( 9-20): 1298-1302.[citado 2024 out. 11 ] Available from: http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e
  • Source: Materials Science and Engineering B. Unidades: IF, EP

    Subjects: MATERIAIS, MATÉRIA CONDENSADA, FILMES FINOS, FÍSICA DE PLASMAS

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      CRIADO, Denise et al. Structural analysis of silicon oxynitride films deposited by PECVD. Materials Science and Engineering B, 2004Tradução . . Disponível em: https://doi.org/10.1016/j.mseb.2004.05.017. Acesso em: 11 out. 2024.
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      Criado, D., Alayo Chávez, M. I., Pereyra, I., & Fantini, M. C. de A. (2004). Structural analysis of silicon oxynitride films deposited by PECVD. Materials Science and Engineering B. doi:10.1016/j.mseb.2004.05.017
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      Criado D, Alayo Chávez MI, Pereyra I, Fantini MC de A. Structural analysis of silicon oxynitride films deposited by PECVD [Internet]. Materials Science and Engineering B. 2004 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/j.mseb.2004.05.017
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      Criado D, Alayo Chávez MI, Pereyra I, Fantini MC de A. Structural analysis of silicon oxynitride films deposited by PECVD [Internet]. Materials Science and Engineering B. 2004 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/j.mseb.2004.05.017
  • Source: Materials Science and Engineering B. Unidades: IF, EP

    Subjects: MATERIAIS, MATÉRIA CONDENSADA, FOTOLUMINESCÊNCIA

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      PEREYRA, Inés et al. Evidence of clusters size-dependent photoluminescence on silicon-rich silicon oxynitride films. Materials Science and Engineering B, 2004Tradução . . Disponível em: https://doi.org/10.1016/j.mseb.2004.05.015. Acesso em: 11 out. 2024.
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      Pereyra, I., Fantini, M. C. de A., Alayo Chávez, M. I., Oliveira, R. A. R., Ribeiro, M., & Scopel, W. L. (2004). Evidence of clusters size-dependent photoluminescence on silicon-rich silicon oxynitride films. Materials Science and Engineering B. doi:10.1016/j.mseb.2004.05.015
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      Pereyra I, Fantini MC de A, Alayo Chávez MI, Oliveira RAR, Ribeiro M, Scopel WL. Evidence of clusters size-dependent photoluminescence on silicon-rich silicon oxynitride films [Internet]. Materials Science and Engineering B. 2004 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/j.mseb.2004.05.015
    • Vancouver

      Pereyra I, Fantini MC de A, Alayo Chávez MI, Oliveira RAR, Ribeiro M, Scopel WL. Evidence of clusters size-dependent photoluminescence on silicon-rich silicon oxynitride films [Internet]. Materials Science and Engineering B. 2004 ;[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/j.mseb.2004.05.015
  • Source: Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. Conference titles: Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP

    Subjects: MICROELETRÔNICA, CAPACITORES, FILMES FINOS

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      ALBERTIN, Katia Franklin e PEREYRA, Inés. One mask step a-Si:H/a-SiOxNy thin film transistor. 2004, Anais.. Pennington: The Electrochemical Society, 2004. . Acesso em: 11 out. 2024.
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      Albertin, K. F., & Pereyra, I. (2004). One mask step a-Si:H/a-SiOxNy thin film transistor. In Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. Pennington: The Electrochemical Society.
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      Albertin KF, Pereyra I. One mask step a-Si:H/a-SiOxNy thin film transistor. Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. 2004 ;[citado 2024 out. 11 ]
    • Vancouver

      Albertin KF, Pereyra I. One mask step a-Si:H/a-SiOxNy thin film transistor. Microelectronics technology and devices SBMicro 2004. Proceedings, v. 2004-03. 2004 ;[citado 2024 out. 11 ]
  • Source: Thin Solids Films. Unidades: IF, EP

    Subjects: FILMES FINOS, FOTOLUMINESCÊNCIA

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      SCOPEL, Wanderla Luis et al. Structural investigation of Si-rich amorphous silicon oxynitride films. Thin Solids Films, v. 425, n. 1-2, p. 275-281, 2003Tradução . . Disponível em: https://doi.org/10.1016/s0040-6090(02)01053-2. Acesso em: 11 out. 2024.
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      Scopel, W. L., Fantini, M. C. de A., Alayo Chávez, M. I., & Pereyra, I. (2003). Structural investigation of Si-rich amorphous silicon oxynitride films. Thin Solids Films, 425( 1-2), 275-281. doi:10.1016/s0040-6090(02)01053-2
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      Scopel WL, Fantini MC de A, Alayo Chávez MI, Pereyra I. Structural investigation of Si-rich amorphous silicon oxynitride films [Internet]. Thin Solids Films. 2003 ; 425( 1-2): 275-281.[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/s0040-6090(02)01053-2
    • Vancouver

      Scopel WL, Fantini MC de A, Alayo Chávez MI, Pereyra I. Structural investigation of Si-rich amorphous silicon oxynitride films [Internet]. Thin Solids Films. 2003 ; 425( 1-2): 275-281.[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/s0040-6090(02)01053-2
  • Source: Physical Review B. Unidades: IF, EP

    Subjects: ESTRUTURA ATÔMICA (FÍSICA MODERNA), MÉTODO DE MONTE CARLO

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      SCOPEL, Wanderla Luis et al. Theoretical and experimental studies of the atomic structure of oxygen-rich amorphous silicon oxynitride films. Physical Review B, v. 68, n. 15, p. 155332/1-155332/6, 2003Tradução . . Disponível em: https://doi.org/10.1103/physrevb.68.155332. Acesso em: 11 out. 2024.
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      Scopel, W. L., Silva, A. J. R. da, Orellana, W. M., Prado, R. J., Fantini, M. C. de A., Fazzio, A., & Pereyra, I. (2003). Theoretical and experimental studies of the atomic structure of oxygen-rich amorphous silicon oxynitride films. Physical Review B, 68( 15), 155332/1-155332/6. doi:10.1103/physrevb.68.155332
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      Scopel WL, Silva AJR da, Orellana WM, Prado RJ, Fantini MC de A, Fazzio A, Pereyra I. Theoretical and experimental studies of the atomic structure of oxygen-rich amorphous silicon oxynitride films [Internet]. Physical Review B. 2003 ; 68( 15): 155332/1-155332/6.[citado 2024 out. 11 ] Available from: https://doi.org/10.1103/physrevb.68.155332
    • Vancouver

      Scopel WL, Silva AJR da, Orellana WM, Prado RJ, Fantini MC de A, Fazzio A, Pereyra I. Theoretical and experimental studies of the atomic structure of oxygen-rich amorphous silicon oxynitride films [Internet]. Physical Review B. 2003 ; 68( 15): 155332/1-155332/6.[citado 2024 out. 11 ] Available from: https://doi.org/10.1103/physrevb.68.155332
  • Source: Journal of Non-Crystalline Solids. Unidades: IF, EP

    Assunto: QUÍMICA

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      PRADO, Rogerio Junqueira et al. Improvements on the local order of amorphous hydrogenated silicon carbide films. Journal of Non-Crystalline Solids, v. 283, n. 1-3, p. 1-10, 2001Tradução . . Disponível em: https://doi.org/10.1016/s0022-3093(01)00489-6. Acesso em: 11 out. 2024.
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      Prado, R. J., Fantini, M. C. de A., Tabacniks, M. H., Villacorta Cardoso, C. A., Pereyra, I., & Flank, A. M. (2001). Improvements on the local order of amorphous hydrogenated silicon carbide films. Journal of Non-Crystalline Solids, 283( 1-3), 1-10. doi:10.1016/s0022-3093(01)00489-6
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      Prado RJ, Fantini MC de A, Tabacniks MH, Villacorta Cardoso CA, Pereyra I, Flank AM. Improvements on the local order of amorphous hydrogenated silicon carbide films [Internet]. Journal of Non-Crystalline Solids. 2001 ; 283( 1-3): 1-10.[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/s0022-3093(01)00489-6
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      Prado RJ, Fantini MC de A, Tabacniks MH, Villacorta Cardoso CA, Pereyra I, Flank AM. Improvements on the local order of amorphous hydrogenated silicon carbide films [Internet]. Journal of Non-Crystalline Solids. 2001 ; 283( 1-3): 1-10.[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/s0022-3093(01)00489-6
  • Source: Thin Solid Films. Unidade: EP

    Subjects: MATERIAIS (PROPRIEDADES MECÂNICAS), MATERIAIS (PROPRIEDADES PLÁSTICAS), ÓXIDO NÍTRICO

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      GUIMARÃES, Marcelo Silva et al. Mechanical and thermophysical properties of PECVD oxynitride films measured by mems. Thin Solid Films, v. no 2001, p. 626-631, 2001Tradução . . Disponível em: https://doi.org/10.1016/s0040-6090(01)01329-3. Acesso em: 11 out. 2024.
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      Guimarães, M. S., Sinatora, A., Aloyo, M. I., Pereyra, I., & Páez Carreño, M. N. (2001). Mechanical and thermophysical properties of PECVD oxynitride films measured by mems. Thin Solid Films, no 2001, 626-631. doi:10.1016/s0040-6090(01)01329-3
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      Guimarães MS, Sinatora A, Aloyo MI, Pereyra I, Páez Carreño MN. Mechanical and thermophysical properties of PECVD oxynitride films measured by mems [Internet]. Thin Solid Films. 2001 ; no 2001 626-631.[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/s0040-6090(01)01329-3
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      Guimarães MS, Sinatora A, Aloyo MI, Pereyra I, Páez Carreño MN. Mechanical and thermophysical properties of PECVD oxynitride films measured by mems [Internet]. Thin Solid Films. 2001 ; no 2001 626-631.[citado 2024 out. 11 ] Available from: https://doi.org/10.1016/s0040-6090(01)01329-3

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