Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices (2019)
- Authors:
- Aguiar, Vitor Ângelo Paulino de
- Medina, Nilberto Heder
- Added, Nemitala
- Macchione, Eduardo Luiz Augusto
- Alberton, Saulo Gabriel Pereira Nascimento
- Scarduelli, Valdir Brunetti
- Allegro, Paula Rangel Pestana
- Escudeiro, Rafael
- Santos, Hellen Cristine dos
- Silva, Tiago Fiorini da
- Rodrigues, Cleber Lima
- Leite, Alisson Rodolfo
- Santos, Osvaldo Camargo Botelho dos
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; RODRIGUES, CLEBER LIMA - IF ; LEITE, ALISSON RODOLFO - IF ; SILVA, TIAGO FIORINI DA - IF ; ESCUDEIRO, RAFAEL - IF ; SANTOS, HELLEN CRISTINE DOS - IF ; SANTOS, OSVALDO CAMARGO BOTELHO DOS - IF ; ALLEGRO, PAULA RANGEL PESTANA - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF ; ALBERTON, SAULO GABRIEL PEREIRA NASCIMENTO - IF ; SCARDUELLI, VALDIR BRUNETTI - IF
- School: IF
- Subject: RADIAÇÃO IONIZANTE
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher: Sociedade Brasileira de Física
- Place of publication: São Paulo
- Date published: 2019
- Source:
- Título do periódico: Abstracts
- Conference title: Reunião de Trabalho sobre Física Nuclear no Brasil
-
ABNT
AGUIAR, Vitor Ângelo Paulino de et al. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. 2019, Anais.. São Paulo: Sociedade Brasileira de Física, 2019. . Acesso em: 29 jun. 2022. -
APA
Aguiar, V. Â. P. de, Medina, N. H., Added, N., Macchione, E. L. A., Alberton, S. G. P. N., Scarduelli, V. B., et al. (2019). Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. In Abstracts. São Paulo: Sociedade Brasileira de Física. -
NLM
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Alberton SGPN, Scarduelli VB, Allegro PRP, Escudeiro R, Santos HC dos, Silva TF da, Rodrigues CL, Leite AR, Santos OCB dos. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. Abstracts. 2019 ;[citado 2022 jun. 29 ] -
Vancouver
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Alberton SGPN, Scarduelli VB, Allegro PRP, Escudeiro R, Santos HC dos, Silva TF da, Rodrigues CL, Leite AR, Santos OCB dos. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. Abstracts. 2019 ;[citado 2022 jun. 29 ] - Passivation layer and charge collection depth in electronic devices
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