Passivation layer and charge collection depth in electronic devices (2018)
- Authors:
- Aguiar, Vitor Ângelo Paulino de
- Medina, Nilberto Heder
- Added, Nemitala
- Macchione, Eduardo Luiz Augusto
- Leite, Alisson Rodolfo
- Silva, Tiago Fiorini da
- Rodrigues, Cleber Lima
- Escudeiro, Rafael
- Allegro, Paula Rangel Pestana
- Santos, Hellen Cristine dos
- Alberton, Saulo Gabriel Pereira Nascimento
- Scarduelli, Valdir Brunetti
- Silveira, Marcilei Aparecida Guazzelli da
- Melo, M A A de
- Santos, R B B
- Giacomini, Renato
- Oliveira, J A
- Leite, F G H
- Aguiar, Vitor Ângelo Paulino de
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; ADDED, NEMITALA - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; LEITE, ALISSON RODOLFO - IF ; SILVA, TIAGO FIORINI DA - IF ; RODRIGUES, CLEBER LIMA - IF ; SANTOS, HELLEN CRISTINE DOS - IF ; SCARDUELLI, VALDIR BRUNETTI - IF
- Unidade: IF
- Subjects: FÍSICA NUCLEAR; ÍONS PESADOS
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Abstracts
- Conference titles: Brazilian Meeting on Nuclear Physics
-
ABNT
AGUIAR, Vitor Ângelo Paulino de et al. Passivation layer and charge collection depth in electronic devices. 2018, Anais.. São Paulo: SBF, 2018. Disponível em: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0013-1.pdf. Acesso em: 13 fev. 2026. -
APA
Aguiar, V. Â. P. de, Medina, N. H., Added, N., Macchione, E. L. A., Leite, A. R., Silva, T. F. da, et al. (2018). Passivation layer and charge collection depth in electronic devices. In Abstracts. São Paulo: SBF. Recuperado de https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0013-1.pdf -
NLM
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Leite AR, Silva TF da, Rodrigues CL, Escudeiro R, Allegro PRP, Santos HC dos, Alberton SGPN, Scarduelli VB, Silveira MAG da, Melo MAA de, Santos RBB, Giacomini R, Oliveira JA, Leite FGH. Passivation layer and charge collection depth in electronic devices [Internet]. Abstracts. 2018 ;[citado 2026 fev. 13 ] Available from: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0013-1.pdf -
Vancouver
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Leite AR, Silva TF da, Rodrigues CL, Escudeiro R, Allegro PRP, Santos HC dos, Alberton SGPN, Scarduelli VB, Silveira MAG da, Melo MAA de, Santos RBB, Giacomini R, Oliveira JA, Leite FGH. Passivation layer and charge collection depth in electronic devices [Internet]. Abstracts. 2018 ;[citado 2026 fev. 13 ] Available from: https://sec.sbfisica.org.br/eventos/rtfnb/xli/sys/resumos/R0013-1.pdf - Studying total dose irradiation on a power transistor
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