Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs

Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs (2013)

Authors:
Autor USP: MARTINO, JOAO ANTONIO - EP
Unidade: EP
Assunto: MICROELETRÔNICA (CONGRESSOS)
Language: Inglês
Imprenta:
- Publisher: Institut Superieur d'Électronique
- Publisher place: Paris
- Date published: 2013
Source:
- Título do periódico: EUROSOI 2013
Conference titles: European Workshop on Silicon on Insulator Technology, Devices and Circuits

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ABNT

MARTINO, João Antonio; SANTOS, S. D.; SIMOEN, E.; et al. Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs. Anais.. Paris: Institut Superieur d'Électronique, 2013.
APA

Martino, J. A., Santos, S. D., Simoen, E., Strobe, V., Cretu, B., Routoure, J. -M., et al. (2013). Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs. In EUROSOI 2013. Paris: Institut Superieur d'Électronique.
NLM

Martino JA, Santos SD, Simoen E, Strobe V, Cretu B, Routoure J-M, Carin R, Aoulaiche M, Veloso A, Claeys C. Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs. EUROSOI 2013. 2013 ;
Vancouver

Martino JA, Santos SD, Simoen E, Strobe V, Cretu B, Routoure J-M, Carin R, Aoulaiche M, Veloso A, Claeys C. Low-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs. EUROSOI 2013. 2013 ;