Influence of the N-type finFET width on the zero temperature coefficient (2007)
- Authors:
- Autor USP: MARTINO, JOÃO ANTONIO - EP
- Unidade: EP
- Assunto: MICROELETRÔNICA
- Language: Inglês
- Imprenta:
- Publisher: The Electrochemical Society
- Publisher place: Pennington
- Date published: 2007
- Source:
- Título: SBMicro 2007
- ISSN: 1938-5862
- Conference titles: International Symposium on Microelectronics Technology and Devices SBMICRO
-
ABNT
BELLODI, Marcello et al. Influence of the N-type finFET width on the zero temperature coefficient. 2007, Anais.. Pennington: The Electrochemical Society, 2007. . Acesso em: 18 fev. 2026. -
APA
Bellodi, M., Martino, J. A., Claeys, C., Camillo, L. M., & Simoen, E. (2007). Influence of the N-type finFET width on the zero temperature coefficient. In SBMicro 2007. Pennington: The Electrochemical Society. -
NLM
Bellodi M, Martino JA, Claeys C, Camillo LM, Simoen E. Influence of the N-type finFET width on the zero temperature coefficient. SBMicro 2007. 2007 ;[citado 2026 fev. 18 ] -
Vancouver
Bellodi M, Martino JA, Claeys C, Camillo LM, Simoen E. Influence of the N-type finFET width on the zero temperature coefficient. SBMicro 2007. 2007 ;[citado 2026 fev. 18 ] - Impact of TiN metal gate thickness and the HsSiO nitridation on MuGFETs electrical performance
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