Study of the Main Digital and Analog Parameters of Underlapped MuGFETs (2012)
- Authors:
- Autor USP: MARTINO, JOAO ANTONIO - EP
- Unidade: EP
- Assunto: MICROELETRÔNICA (CONGRESSOS)
- Language: Inglês
- Imprenta:
- Publisher: Institut d'Électronique
- Publisher place: S.l
- Date published: 2012
- Source:
- Conference titles: European Workshop on Silicon on Insulator Technology, Devices and Circuits
-
ABNT
MARTINO, João Antonio et al. Study of the Main Digital and Analog Parameters of Underlapped MuGFETs. VIII Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits. S.l: Institut d'Électronique. . Acesso em: 27 jan. 2026. , 2012 -
APA
Martino, J. A., Santos, S. D. dos, Nicoletti, T., Aoulaiche, M., Simoen, E., & Claeys, C. (2012). Study of the Main Digital and Analog Parameters of Underlapped MuGFETs. VIII Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits. S.l: Institut d'Électronique. -
NLM
Martino JA, Santos SD dos, Nicoletti T, Aoulaiche M, Simoen E, Claeys C. Study of the Main Digital and Analog Parameters of Underlapped MuGFETs. VIII Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits. 2012 ;[citado 2026 jan. 27 ] -
Vancouver
Martino JA, Santos SD dos, Nicoletti T, Aoulaiche M, Simoen E, Claeys C. Study of the Main Digital and Analog Parameters of Underlapped MuGFETs. VIII Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits. 2012 ;[citado 2026 jan. 27 ] - Analog circuit design using graded-channel SOI NMOSFETs
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