A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results (2022)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1107/S2053273322007215
- Subjects: FÍSICO-QUÍMICA; CRISTALOGRAFIA DE RAIOS X; NANOPARTÍCULAS; ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS; MATERIAIS NANOESTRUTURADOS
- Keywords: Guinier approximation; Scherrer equation; X-ray scattering and diffraction; nanocrystalline materials; nanoparticle size distribution
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Publisher place: New Jersey
- Date published: 2022
- Source:
- Título: Acta Crystallographica Section A: Foundations and Advances
- ISSN: 2053-2733
- Volume/Número/Paginação/Ano: v. 78, n. 1, p. 459-462, setembro de 2022
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
SERGIO L. MORELHÃO, e KYCIA, Stefan. A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results. Acta Crystallographica Section A: Foundations and Advances, v. 78, n. 1, p. 459-462, 2022Tradução . . Disponível em: https://doi.org/10.1107/S2053273322007215. Acesso em: 12 jan. 2026. -
APA
Sergio L. Morelhão,, & Kycia, S. (2022). A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results. Acta Crystallographica Section A: Foundations and Advances, 78( 1), 459-462. doi:10.1107/S2053273322007215 -
NLM
Sergio L. Morelhão, Kycia S. A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results [Internet]. Acta Crystallographica Section A: Foundations and Advances. 2022 ; 78( 1): 459-462.[citado 2026 jan. 12 ] Available from: https://doi.org/10.1107/S2053273322007215 -
Vancouver
Sergio L. Morelhão, Kycia S. A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results [Internet]. Acta Crystallographica Section A: Foundations and Advances. 2022 ; 78( 1): 459-462.[citado 2026 jan. 12 ] Available from: https://doi.org/10.1107/S2053273322007215 - Dynamics of Defects in van der Waals Epitaxy of Bismuth Telluride Topological Insulators
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Informações sobre o DOI: 10.1107/S2053273322007215 (Fonte: oaDOI API)
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