An x-ray diffractometer for accurate structural invariant phase determination (2003)
- Autor:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1107/s0909049503003789
- Subjects: DIFRAÇÃO POR RAIOS X; CRISTALOGRAFIA
- Language: Inglês
- Imprenta:
- Publisher place: Copenhagen
- Date published: 2003
- Source:
- Título do periódico: Journal of Synchrotron Radiation
- ISSN: 0909-0495
- Volume/Número/Paginação/Ano: v. 10, pt. 3, p. 236-241, 2003
- Este periódico é de assinatura
- Este artigo é de acesso aberto
- URL de acesso aberto
- Cor do Acesso Aberto: bronze
-
ABNT
MORELHÃO, Sérgio Luiz. An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchrotron Radiation, v. 10, p. 236-241, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0909049503003789. Acesso em: 23 abr. 2024. -
APA
Morelhão, S. L. (2003). An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchrotron Radiation, 10, 236-241. doi:10.1107/s0909049503003789 -
NLM
Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchrotron Radiation. 2003 ; 10 236-241.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1107/s0909049503003789 -
Vancouver
Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchrotron Radiation. 2003 ; 10 236-241.[citado 2024 abr. 23 ] Available from: https://doi.org/10.1107/s0909049503003789 - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
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Informações sobre o DOI: 10.1107/s0909049503003789 (Fonte: oaDOI API)
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