Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan (2010)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Subjects: EPITAXIA POR FEIXE MOLECULAR; RADIAÇÃO SINCROTRON
- Language: Inglês
- Imprenta:
- Publisher: The Society
- Publisher place: Washington, DC
- Date published: 2010
- Source:
- Título: Crystal Growth & Design
- ISSN: 1528-7483
- Volume/Número/Paginação/Ano: v. 10, n. 8, p. 3436-3441, 2010
- Conference titles: 40th Anniversary Conference of the British Association for Crystal Growth (BACG)
-
ABNT
MENEZES, Alan S de et al. Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan. Crystal Growth & Design. Washington, DC: The Society. Disponível em: http://pubs.acs.org/doi/pdf/10.1021/cg100146x. Acesso em: 06 fev. 2026. , 2010 -
APA
Menezes, A. S. de, Santos, A. O. dos, Almeida, J. M. A., Bortoleto, J. R. R., Cotta, M. A., Morelhão, S. L., & Cardoso, L. P. (2010). Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan. Crystal Growth & Design. Washington, DC: The Society. Recuperado de http://pubs.acs.org/doi/pdf/10.1021/cg100146x -
NLM
Menezes AS de, Santos AO dos, Almeida JMA, Bortoleto JRR, Cotta MA, Morelhão SL, Cardoso LP. Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan [Internet]. Crystal Growth & Design. 2010 ; 10( 8): 3436-3441.[citado 2026 fev. 06 ] Available from: http://pubs.acs.org/doi/pdf/10.1021/cg100146x -
Vancouver
Menezes AS de, Santos AO dos, Almeida JMA, Bortoleto JRR, Cotta MA, Morelhão SL, Cardoso LP. Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan [Internet]. Crystal Growth & Design. 2010 ; 10( 8): 3436-3441.[citado 2026 fev. 06 ] Available from: http://pubs.acs.org/doi/pdf/10.1021/cg100146x - Sensitivity Bragg surface diffraction to analyze ion-implanted semiconductors
- Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators
- Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique
- Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals
- Dislocations in dendritic web silicon
- Investigação da polarização da radiação síncrotron por varredura "fi"
- Synchrotron radiation X-ray multiple diffraction in the study of doped KDP
- An x-ray diffractometer for accurate structural invariant phase determination
- Determinação do coeficiente piezoelétrico do cristal de KDP sando difração múltipla com fonte de radiação síncroton
- Automatic x-ray crystallographic phasing at LNLS
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
