Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators (2020)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Subjects: FILMES FINOS; BISMUTO
- Agências de fomento:
- Language: Inglês
- Imprenta:
-
ABNT
FORNARI, Celso I et al. Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/ftp/arxiv/papers/2008/2008.02180.pdf. Acesso em: 25 fev. 2026. , 2020 -
APA
Fornari, C. I., Abramof, E., Rappl, P. H. O., Kycia, S. W., & Morelhão, S. L. (2020). Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/ftp/arxiv/papers/2008/2008.02180.pdf -
NLM
Fornari CI, Abramof E, Rappl PHO, Kycia SW, Morelhão SL. Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators [Internet]. 2020 ;[citado 2026 fev. 25 ] Available from: https://arxiv.org/ftp/arxiv/papers/2008/2008.02180.pdf -
Vancouver
Fornari CI, Abramof E, Rappl PHO, Kycia SW, Morelhão SL. Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators [Internet]. 2020 ;[citado 2026 fev. 25 ] Available from: https://arxiv.org/ftp/arxiv/papers/2008/2008.02180.pdf - Sensitivity Bragg surface diffraction to analyze ion-implanted semiconductors
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- Determinação do coeficiente piezoelétrico do cristal de KDP sando difração múltipla com fonte de radiação síncroton
- Automatic x-ray crystallographic phasing at LNLS
- Direct observation of tetragonal distortion in epitaxial structures through secondary peak split in a synchrotron radiation renninger scan
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