Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals (2019)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Subjects: NANOPARTÍCULAS; RAIOS X
- Language: Inglês
- Imprenta:
-
ABNT
MORELHÃO, Sergio Luiz et al. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/abs/1911.00396. Acesso em: 17 out. 2024. , 2019 -
APA
Morelhão, S. L., Kycia, S., Netzke, S., Fornari, C. I., & Rappl, P. H. O. (2019). Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/abs/1911.00396 -
NLM
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals [Internet]. 2019 ;[citado 2024 out. 17 ] Available from: https://arxiv.org/abs/1911.00396 -
Vancouver
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals [Internet]. 2019 ;[citado 2024 out. 17 ] Available from: https://arxiv.org/abs/1911.00396 - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
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