Brazilian facilities to study radiation effects in electronic devices (2013)
- Authors:
- USP affiliated authors: MEDINA, NILBERTO HEDER - IF ; SILVEIRA, MARCILEI APARECIDA GUAZZELLI DA - IF ; ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF ; MACCHIONE, EDUARDO LUIZ AUGUSTO - IF ; GIACOMINI, RENATO CAMARGO - EP ; AGUIRRE, FERNANDO RODRIGUES - IF ; AGUIAR, VITOR ÂNGELO PAULINO DE - IF ; MELO, MARCO ANTONIO ASSIS DE - EP ; SANTOS, ROBERTO BAGINSKI BATISTA - IF
- Unidades: IF; EP
- DOI: 10.1109/RADECS.2013.6937368
- Subjects: FÍSICA NUCLEAR; COLISÕES DE ÍONS PESADOS RELATIVÍSTICOS; DISPOSITIVOS ELETRÔNICOS; ACELERADOR DE PARTÍCULAS; RAIOS X
- Keywords: Proton and Heavy Ion Beams; Single Event Effect; Total Ionization Dose; X-Ray
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: IEEE Xplore
- Volume/Número/Paginação/Ano: 07p., Proc. RADECS 2013, Proceedings Paper
- Conference titles: European Conference on Radiation and its Effects on Components and Systems (RADECS)
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
MEDINA, Nilberto Heder et al. Brazilian facilities to study radiation effects in electronic devices. IEEE Xplore. New York: Instituto de Física, Universidade de São Paulo. Disponível em: https://doi.org/10.1109/RADECS.2013.6937368. Acesso em: 11 jan. 2026. , 2013 -
APA
Medina, N. H., Guazzelli, M. A., Added, N., Aguiar, V. Â. P. de, Aguirre, F., Giacomini, R., et al. (2013). Brazilian facilities to study radiation effects in electronic devices. IEEE Xplore. New York: Instituto de Física, Universidade de São Paulo. doi:10.1109/RADECS.2013.6937368 -
NLM
Medina NH, Guazzelli MA, Added N, Aguiar VÂP de, Aguirre F, Giacomini R, Macchione ELA, Melo MAA, Oliveira JA, Santos RBB, Seixas LE, Tabacniks MH. Brazilian facilities to study radiation effects in electronic devices [Internet]. IEEE Xplore. 2013 ;07.[citado 2026 jan. 11 ] Available from: https://doi.org/10.1109/RADECS.2013.6937368 -
Vancouver
Medina NH, Guazzelli MA, Added N, Aguiar VÂP de, Aguirre F, Giacomini R, Macchione ELA, Melo MAA, Oliveira JA, Santos RBB, Seixas LE, Tabacniks MH. Brazilian facilities to study radiation effects in electronic devices [Internet]. IEEE Xplore. 2013 ;07.[citado 2026 jan. 11 ] Available from: https://doi.org/10.1109/RADECS.2013.6937368 - Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy
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Informações sobre o DOI: 10.1109/RADECS.2013.6937368 (Fonte: oaDOI API)
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