Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films (2020)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Subjects: DIFRAÇÃO POR RAIOS X; SEMICONDUTORES; CRISTALOGRAFIA DE RAIOS X
- Agências de fomento:
- Language: Inglês
- Imprenta:
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ABNT
MORELHÃO, Sérgio Luiz et al. Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films. . Melville: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/pdf/2007.15042.pdf. Acesso em: 17 mar. 2026. , 2020 -
APA
Morelhão, S. L., Kycia, S., Netzke, S., Fornari, C. I., Rappl, P. H. O., & Abramof, E. (2020). Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films. Melville: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/pdf/2007.15042.pdf -
NLM
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO, Abramof E. Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films [Internet]. 2020 ;[citado 2026 mar. 17 ] Available from: https://arxiv.org/pdf/2007.15042.pdf -
Vancouver
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO, Abramof E. Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films [Internet]. 2020 ;[citado 2026 mar. 17 ] Available from: https://arxiv.org/pdf/2007.15042.pdf - Sensitivity Bragg surface diffraction to analyze ion-implanted semiconductors
- Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators
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- Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals
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- Investigação da polarização da radiação síncrotron por varredura "fi"
- Synchrotron radiation X-ray multiple diffraction in the study of doped KDP
- An x-ray diffractometer for accurate structural invariant phase determination
- Determinação do coeficiente piezoelétrico do cristal de KDP sando difração múltipla com fonte de radiação síncroton
- Automatic x-ray crystallographic phasing at LNLS
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