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Artigo de periodico

Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates (2016)

  • Authors:
  • Autor USP: MORELHAO, SERGIO LUIZ - IF
  • Unidade: IF
  • DOI: 10.1038/srep28128
  • Subjects: SEMICONDUTORES; RAIOS X
  • Language: Inglês
  • Imprenta:
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    • DOI
    Informações sobre o DOI: 10.1038/srep28128 (Fonte: oaDOI API)
    • Este periódico é de acesso aberto
    • Este artigo é de acesso aberto
    • URL de acesso aberto
    • Cor do Acesso Aberto: gold
    • Licença: cc-by
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    • ABNT

      DOMAGALA, Jaroslaw Z.; SARZYNSKI, Marcin; MAZDZIARZ, Marcin; et al. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography, Chester, v. 49, n. ju 2016, p. 798-805, 2016. DOI: 10.1038/srep28128.

    • APA

      Domagala, J. Z., Sarzynski, M., Mazdziarz, M., Dluzewski, P., Leszczynski, M., & Morelhao, S. L. (2016). Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography, 49( ju 2016), 798-805. doi:10.1038/srep28128

    • NLM

      Domagala JZ, Sarzynski M, Mazdziarz M, Dluzewski P, Leszczynski M, Morelhao SL. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography. 2016 ; 49( ju 2016): 798-805.

    • Vancouver

      Domagala JZ, Sarzynski M, Mazdziarz M, Dluzewski P, Leszczynski M, Morelhao SL. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography. 2016 ; 49( ju 2016): 798-805.

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