Low temperature and channel engineering influence on harmonic distortion of soi nmosfets for analog applications (2005)
- Authors:
- Autor USP: MARTINO, JOAO ANTONIO - EP
- Unidade: EP
- Subjects: MICROELETRÔNICA; CIRCUITOS INTEGRADOS
- Language: Inglês
- Imprenta:
- Publisher: The Electrochemical Society
- Publisher place: Pennington
- Date published: 2005
- Source:
- Conference titles: International Symposium on Silicon-on-Insulator Technology and Devices
-
ABNT
PAVANELLO, Marcelo Antonio et al. Low temperature and channel engineering influence on harmonic distortion of soi nmosfets for analog applications. International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings. Tradução . Pennington: The Electrochemical Society, 2005. . . Acesso em: 31 dez. 2025. -
APA
Pavanello, M. A., Cerdeira, A., Alemán, M. A., Martino, J. A., Vancaillie, L., & Flandre, D. (2005). Low temperature and channel engineering influence on harmonic distortion of soi nmosfets for analog applications. In International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings. Pennington: The Electrochemical Society. -
NLM
Pavanello MA, Cerdeira A, Alemán MA, Martino JA, Vancaillie L, Flandre D. Low temperature and channel engineering influence on harmonic distortion of soi nmosfets for analog applications. In: International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings. Pennington: The Electrochemical Society; 2005. [citado 2025 dez. 31 ] -
Vancouver
Pavanello MA, Cerdeira A, Alemán MA, Martino JA, Vancaillie L, Flandre D. Low temperature and channel engineering influence on harmonic distortion of soi nmosfets for analog applications. In: International Symposium on Silicon-on-Insulator Technology and Devices XII: proceedings. Pennington: The Electrochemical Society; 2005. [citado 2025 dez. 31 ] - Temperature influences on the drain leakage current behavior in graded-channel SOI nMOSFETs
- Projeto de processos de fabricação avançados aplicáveis nas tecnologias CMOS micrométricas
- Analysis of the linear kink effect in partially depleted SOI nMOSFETs
- Simple method to extract the length dependent mobility degradation factor at 77 K
- Analysis of the capacitance vs. voltage in graded channel SOI capacitor
- A simple technique to reduce the influence of the series resistance on the BULK and SOI MOSFET parameter extraction
- Metodo simples para a obtencao da densidade de armadilhas na primeira e segunda interface em soi-mosfet
- Simple method for the determination of the interface trap density at 77k in fully depleted acumulation mode soi mosfets
- Transistor soi-nmosfet nao auto-alinhado
- Combined l and series resistance extraction of ldd mosfets
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
