Filtros : "Pereyra, Inés" "Produção científica" Removido: "2007" Limpar

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  • Source: Journal of Applied Electrochemistry. Unidades: EP, IQ

    Subjects: ESPECTROSCOPIA RAMAN, MICROSCOPIA

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      RIBEIRO, Leonardo Marquez Alves et al. Low-cost laser for fabrication of affordable graphene-induced microband sensors. Journal of Applied Electrochemistry, 2024Tradução . . Disponível em: https://dx.doi.org/10.1007/s10800-024-02132-w. Acesso em: 26 jul. 2024.
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      Ribeiro, L. M. A., Feria, D. J., Falcoswki, P. C., Carreño, M. N. P., Pereyra, I., & Bertotti, M. (2024). Low-cost laser for fabrication of affordable graphene-induced microband sensors. Journal of Applied Electrochemistry. doi:10.1007/s10800-024-02132-w
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      Ribeiro LMA, Feria DJ, Falcoswki PC, Carreño MNP, Pereyra I, Bertotti M. Low-cost laser for fabrication of affordable graphene-induced microband sensors [Internet]. Journal of Applied Electrochemistry. 2024 ;[citado 2024 jul. 26 ] Available from: https://dx.doi.org/10.1007/s10800-024-02132-w
    • Vancouver

      Ribeiro LMA, Feria DJ, Falcoswki PC, Carreño MNP, Pereyra I, Bertotti M. Low-cost laser for fabrication of affordable graphene-induced microband sensors [Internet]. Journal of Applied Electrochemistry. 2024 ;[citado 2024 jul. 26 ] Available from: https://dx.doi.org/10.1007/s10800-024-02132-w
  • Source: Brazilian Journal of Chemical Engineering. Unidades: EP, IF

    Assunto: FLUORESCÊNCIA

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      SOARES, Marco C P et al. Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials. Brazilian Journal of Chemical Engineering, 2023Tradução . . Disponível em: https://doi.org/10.1007/s43153-023-00408-w. Acesso em: 26 jul. 2024.
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      Soares, M. C. P., Carreño, M. N. P., Pereyra, I., Ramos, C. A. S., Cid Sánchez, M., Goveia, G. S., & Chubaci, J. F. D. (2023). Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials. Brazilian Journal of Chemical Engineering. doi:https://doi.org/10.1007/s43153-023-00408-w
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      Soares MCP, Carreño MNP, Pereyra I, Ramos CAS, Cid Sánchez M, Goveia GS, Chubaci JFD. Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials [Internet]. Brazilian Journal of Chemical Engineering. 2023 ;[citado 2024 jul. 26 ] Available from: https://doi.org/10.1007/s43153-023-00408-w
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      Soares MCP, Carreño MNP, Pereyra I, Ramos CAS, Cid Sánchez M, Goveia GS, Chubaci JFD. Fabrication of fluorescent PMMA-carbon nanodots optical films and their feasibility in improving solar cells efficiency using low-cost sustainable materials [Internet]. Brazilian Journal of Chemical Engineering. 2023 ;[citado 2024 jul. 26 ] Available from: https://doi.org/10.1007/s43153-023-00408-w
  • Source: ACS Biomaterials Science & Engineering. Unidade: EP

    Subjects: COBRE, SUPERFÍCIES

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      SILVA, Daniel José da et al. Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2. ACS Biomaterials Science & Engineering, p. 9 , 2023Tradução . . Disponível em: https://doi.org/10.1021/acsbiomaterials.2c01529. Acesso em: 26 jul. 2024.
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      Silva, D. J. da, Duran, A., Cabral, A. D., Fonseca, F. L. A., Hui, W. S., Parra, D. F., et al. (2023). Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2. ACS Biomaterials Science & Engineering, 9 . doi:10.1021/acsbiomaterials.2c01529
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      Silva DJ da, Duran A, Cabral AD, Fonseca FLA, Hui WS, Parra DF, Bueno RF, Pereyra I, Rosa DS. Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2 [Internet]. ACS Biomaterials Science & Engineering. 2023 ;9 .[citado 2024 jul. 26 ] Available from: https://doi.org/10.1021/acsbiomaterials.2c01529
    • Vancouver

      Silva DJ da, Duran A, Cabral AD, Fonseca FLA, Hui WS, Parra DF, Bueno RF, Pereyra I, Rosa DS. Bioinspired Antimicrobial PLA with Nanocones on the Surface for Rapid Deactivation of Omicron SARS-CoV-2 [Internet]. ACS Biomaterials Science & Engineering. 2023 ;9 .[citado 2024 jul. 26 ] Available from: https://doi.org/10.1021/acsbiomaterials.2c01529
  • Conference titles: Symposium on Microelectronics Technology and Devices - SBMicro. Unidades: IQ, EP

    Assunto: ELETROQUÍMICA

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      FARIA, D. J et al. Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide. 2022, Anais.. Piscataway: IEEE, 2022. Disponível em: https://doi.org/10.1109/SBMICRO55822.2022.9881043. Acesso em: 26 jul. 2024.
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      Faria, D. J., Pinto, A. L. M., Bertotti, M., Carreño, M. N. P., & Pereyra, I. (2022). Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide. In . Piscataway: IEEE. doi:10.1109/SBMICRO55822.2022.9881043
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      Faria DJ, Pinto ALM, Bertotti M, Carreño MNP, Pereyra I. Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide [Internet]. 2022 ;[citado 2024 jul. 26 ] Available from: https://doi.org/10.1109/SBMICRO55822.2022.9881043
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      Faria DJ, Pinto ALM, Bertotti M, Carreño MNP, Pereyra I. Electrochemical electrodes based on laser induced graphene on PECVD a-SiC:H and polyimide [Internet]. 2022 ;[citado 2024 jul. 26 ] Available from: https://doi.org/10.1109/SBMICRO55822.2022.9881043
  • Source: Resumos. Conference titles: Encontro de Outono da Sociedade Brasileira de Física. Unidades: EP, IP, IF

    Assunto: TEMPERATURA

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      MEDEIROS, Marina Sparvoli de et al. Effect of annealing temperature on indium tin oxynitride (ITON) electrical and optical characteristics. 2022, Anais.. São Paulo: Sociedade Brasileira de Física, 2022. . Acesso em: 26 jul. 2024.
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      Medeiros, M. S. de, Pederzini, V., Abe, I. Y., Lopes, A., Pereyra, I., & Onmori, R. K. (2022). Effect of annealing temperature on indium tin oxynitride (ITON) electrical and optical characteristics. In Resumos. São Paulo: Sociedade Brasileira de Física.
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      Medeiros MS de, Pederzini V, Abe IY, Lopes A, Pereyra I, Onmori RK. Effect of annealing temperature on indium tin oxynitride (ITON) electrical and optical characteristics. Resumos. 2022 ;[citado 2024 jul. 26 ]
    • Vancouver

      Medeiros MS de, Pederzini V, Abe IY, Lopes A, Pereyra I, Onmori RK. Effect of annealing temperature on indium tin oxynitride (ITON) electrical and optical characteristics. Resumos. 2022 ;[citado 2024 jul. 26 ]
  • Source: Chemical Engineering Transactions. Unidade: EP

    Subjects: CARBONO, NANOCOMPOSITOS, CÉLULAS SOLARES, NITROGÊNIO

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      AMATO, Francesco et al. Nitrogen-doped Carbon Nanodots/PMMA nancomposites for solar cells applications. Chemical Engineering Transactions, v. 74, p. 1105-1110, 2019Tradução . . Disponível em: https://doi.org/10.3303/CET1974185. Acesso em: 26 jul. 2024.
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      Amato, F., Cacioppo, M., Arcudi, F., Prato, M., Mituo, M., Fernandes, E. G., et al. (2019). Nitrogen-doped Carbon Nanodots/PMMA nancomposites for solar cells applications. Chemical Engineering Transactions, 74, 1105-1110. doi:10.3303/CET1974185
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      Amato F, Cacioppo M, Arcudi F, Prato M, Mituo M, Fernandes EG, Carreño MNP, Pereyra I, Bartoli JR. Nitrogen-doped Carbon Nanodots/PMMA nancomposites for solar cells applications [Internet]. Chemical Engineering Transactions. 2019 ; 74 1105-1110.[citado 2024 jul. 26 ] Available from: https://doi.org/10.3303/CET1974185
    • Vancouver

      Amato F, Cacioppo M, Arcudi F, Prato M, Mituo M, Fernandes EG, Carreño MNP, Pereyra I, Bartoli JR. Nitrogen-doped Carbon Nanodots/PMMA nancomposites for solar cells applications [Internet]. Chemical Engineering Transactions. 2019 ; 74 1105-1110.[citado 2024 jul. 26 ] Available from: https://doi.org/10.3303/CET1974185
  • Source: Proceedings Science BWSP. Conference titles: Brazilian Workshop on Semiconductor Physics. Unidades: IF, EP

    Subjects: CRISTALOGRAFIA FÍSICA, FILMES FINOS, ESPECTROSCOPIA DE RAIO X

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      CASSIMIRO, Vinicius Roberto de Sylos et al. The structural properties of the protective layer of microlamps under polarization. Proceedings Science BWSP. São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://doi.org/10.17648/bwsp-2017-70051. Acesso em: 26 jul. 2024. , 2017
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      Cassimiro, V. R. de S., Fantini, M. C. de A., Pereyra, I., Páez Carreño, M. N., Alayo Chávez, M. I., Rehder, G. P., et al. (2017). The structural properties of the protective layer of microlamps under polarization. Proceedings Science BWSP. São Paulo: Instituto de Física, Universidade de São Paulo. doi:10.17648/bwsp-2017-70051
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      Cassimiro VR de S, Fantini MC de A, Pereyra I, Páez Carreño MN, Alayo Chávez MI, Rehder GP, Cunha Junior RM, Trcera N. The structural properties of the protective layer of microlamps under polarization [Internet]. Proceedings Science BWSP. 2017 ; 1 4 .[citado 2024 jul. 26 ] Available from: https://doi.org/10.17648/bwsp-2017-70051
    • Vancouver

      Cassimiro VR de S, Fantini MC de A, Pereyra I, Páez Carreño MN, Alayo Chávez MI, Rehder GP, Cunha Junior RM, Trcera N. The structural properties of the protective layer of microlamps under polarization [Internet]. Proceedings Science BWSP. 2017 ; 1 4 .[citado 2024 jul. 26 ] Available from: https://doi.org/10.17648/bwsp-2017-70051
  • Source: Canadian Journal of Physics. Unidade: EP

    Subjects: RASTREAMENTO, ULTRASSONOGRAFIA

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      ARMAS ALVARADO, Maria Elisia et al. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide. Canadian Journal of Physics, v. 92, p. 952-954, 2014Tradução . . Disponível em: https://doi.org/10.1139/cjp-2013-0587. Acesso em: 26 jul. 2024.
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      Armas Alvarado, M. E., Pelegrini, M. V., Pereyra, I., Assumpção, T. A. A. de, Kassab, L. R. P., & Alayo Chávez, M. I. (2014). Fabrication and characterization of aluminum nitride pedestal-type optical waveguide. Canadian Journal of Physics, 92, 952-954. doi:10.1139/cjp-2013-0587
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      Armas Alvarado ME, Pelegrini MV, Pereyra I, Assumpção TAA de, Kassab LRP, Alayo Chávez MI. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide [Internet]. Canadian Journal of Physics. 2014 ;92 952-954.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1139/cjp-2013-0587
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      Armas Alvarado ME, Pelegrini MV, Pereyra I, Assumpção TAA de, Kassab LRP, Alayo Chávez MI. Fabrication and characterization of aluminum nitride pedestal-type optical waveguide [Internet]. Canadian Journal of Physics. 2014 ;92 952-954.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1139/cjp-2013-0587
  • Source: Canadian Journal of Physics. Unidade: EP

    Subjects: FILMES FINOS, FOTÔNICA

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      PELEGRINI, Marcelo Aparecido et al. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1. Canadian Journal of Physics, v. 92, n. 7/8, p. 940-942, 2014Tradução . . Disponível em: https://doi.org/10.1139/cjp-2013-0556. Acesso em: 26 jul. 2024.
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      Pelegrini, M. A., Pereyra, I., Alvarado, M. A., & Alayo Chávez, M. I. (2014). Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1. Canadian Journal of Physics, 92( 7/8), 940-942. doi:10.1139/cjp-2013-0556
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      Pelegrini MA, Pereyra I, Alvarado MA, Alayo Chávez MI. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1 [Internet]. Canadian Journal of Physics. 2014 ; 92( 7/8): 940-942.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1139/cjp-2013-0556
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      Pelegrini MA, Pereyra I, Alvarado MA, Alayo Chávez MI. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering1 [Internet]. Canadian Journal of Physics. 2014 ; 92( 7/8): 940-942.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1139/cjp-2013-0556
  • Source: Canadian Journal of Physics. Unidade: EP

    Assunto: RADIOGRAFIA

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      PELEGRINI, Marcus Vinícius et al. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering. Canadian Journal of Physics, v. 92, p. 940-942, 2014Tradução . . Disponível em: https://doi.org/10.1139/cjp-2013-0556. Acesso em: 26 jul. 2024.
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      Pelegrini, M. V., Alayo Chávez, M. I., Armas Alvarado, M. E., & Pereyra, I. (2014). Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering. Canadian Journal of Physics, 92, 940-942. doi:10.1139/cjp-2013-0556
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      Pelegrini MV, Alayo Chávez MI, Armas Alvarado ME, Pereyra I. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering [Internet]. Canadian Journal of Physics. 2014 ;92 940-942.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1139/cjp-2013-0556
    • Vancouver

      Pelegrini MV, Alayo Chávez MI, Armas Alvarado ME, Pereyra I. Deposition and characterization of AlN thin films obtained by radio frequency reactive magnetron sputtering [Internet]. Canadian Journal of Physics. 2014 ;92 940-942.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1139/cjp-2013-0556
  • Source: Microelectronics technology and devices, SBMicro. Conference titles: International Symposium on Microelectronics Technology and Devices. Unidade: EP

    Assunto: MICROELETRÔNICA

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      ABE, Igor Yamamoto e PEREYRA, Inés. Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes. 2012, Anais.. Pennington: Escola Politécnica, Universidade de São Paulo, 2012. Disponível em: https://doi.org/10.1149/04901.0255ecst. Acesso em: 26 jul. 2024.
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      Abe, I. Y., & Pereyra, I. (2012). Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes. In Microelectronics technology and devices, SBMicro. Pennington: Escola Politécnica, Universidade de São Paulo. doi:10.1149/04901.0255ecst
    • NLM

      Abe IY, Pereyra I. Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 jul. 26 ] Available from: https://doi.org/10.1149/04901.0255ecst
    • Vancouver

      Abe IY, Pereyra I. Fabrication of transparent conductive thin films based on multi-walled carbon nanotubes [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 jul. 26 ] Available from: https://doi.org/10.1149/04901.0255ecst
  • Source: Microelectronics technology and devices, SBMicro. Conference titles: International Symposium on Microelectronics Technology and Devices. Unidade: EP

    Assunto: MICROELETRÔNICA

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      FRAGA, Tiago Marques e ALBERTIN, Katia Franklin e PEREYRA, Inés. TiO2 nanotubes production and characterization. 2012, Anais.. Pennington: Escola Politécnica, Universidade de São Paulo, 2012. Disponível em: https://doi.org/10.1149/04901.0199ecst. Acesso em: 26 jul. 2024.
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      Fraga, T. M., Albertin, K. F., & Pereyra, I. (2012). TiO2 nanotubes production and characterization. In Microelectronics technology and devices, SBMicro. Pennington: Escola Politécnica, Universidade de São Paulo. doi:10.1149/04901.0199ecst
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      Fraga TM, Albertin KF, Pereyra I. TiO2 nanotubes production and characterization [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 jul. 26 ] Available from: https://doi.org/10.1149/04901.0199ecst
    • Vancouver

      Fraga TM, Albertin KF, Pereyra I. TiO2 nanotubes production and characterization [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 jul. 26 ] Available from: https://doi.org/10.1149/04901.0199ecst
  • Source: Physica Status Solidi (C). Unidade: EP

    Subjects: FILMES FINOS, SEMICONDUTORES, DIELÉTRICOS

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      ALBERTIN, Katia Franklin e PEREYRA, Inés. Study of metal-oxide-semiconductor capacitors with r.f. magnetron sputtering TiOxNy films dielectric layer. Physica Status Solidi (C), v. 7, n. 3-4, p. 937-940, 2010Tradução . . Disponível em: https://doi.org/10.1002/pssc.200982656. Acesso em: 26 jul. 2024.
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      Albertin, K. F., & Pereyra, I. (2010). Study of metal-oxide-semiconductor capacitors with r.f. magnetron sputtering TiOxNy films dielectric layer. Physica Status Solidi (C), 7( 3-4), 937-940. doi:10.1002/pssc.200982656
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      Albertin KF, Pereyra I. Study of metal-oxide-semiconductor capacitors with r.f. magnetron sputtering TiOxNy films dielectric layer [Internet]. Physica Status Solidi (C). 2010 ; 7( 3-4): 937-940.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1002/pssc.200982656
    • Vancouver

      Albertin KF, Pereyra I. Study of metal-oxide-semiconductor capacitors with r.f. magnetron sputtering TiOxNy films dielectric layer [Internet]. Physica Status Solidi (C). 2010 ; 7( 3-4): 937-940.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1002/pssc.200982656
  • Source: Microelectronics Technology and Devices - SBMicro 2010. Unidades: EP, IEE

    Assunto: ELETROQUÍMICA

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      CAVALLARI, Marco Roberto et al. Voltage-dependent mobility characterization of MDMO-PPV thin-film transistors for flexible sensor applications. Microelectronics Technology and Devices - SBMicro 2010, v. 31, n. 1, p. 425-432, 2010Tradução . . Disponível em: https://doi.org/10.1149/1.3474188. Acesso em: 26 jul. 2024.
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      Cavallari, M. R., Albertin, K. F., Santos, G. dos, Ramos, C. A. S., Pereyra, I., Fonseca, F. J., & Andrade, A. M. de. (2010). Voltage-dependent mobility characterization of MDMO-PPV thin-film transistors for flexible sensor applications. Microelectronics Technology and Devices - SBMicro 2010, 31( 1), 425-432. doi:10.1149/1.3474188
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      Cavallari MR, Albertin KF, Santos G dos, Ramos CAS, Pereyra I, Fonseca FJ, Andrade AM de. Voltage-dependent mobility characterization of MDMO-PPV thin-film transistors for flexible sensor applications [Internet]. Microelectronics Technology and Devices - SBMicro 2010. 2010 ;31( 1): 425-432.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1149/1.3474188
    • Vancouver

      Cavallari MR, Albertin KF, Santos G dos, Ramos CAS, Pereyra I, Fonseca FJ, Andrade AM de. Voltage-dependent mobility characterization of MDMO-PPV thin-film transistors for flexible sensor applications [Internet]. Microelectronics Technology and Devices - SBMicro 2010. 2010 ;31( 1): 425-432.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1149/1.3474188
  • Source: Journal of Integrated Circuits and Systems. Unidades: EP, IEE

    Subjects: TRANSISTORES, SEMICONDUTORES

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      CAVALLARI, Marco Roberto et al. PECVD silicon oxynitrite as insulator for MDMO-PPV thin-film transistors. Journal of Integrated Circuits and Systems, v. 5, n. 2, p. 116-124, 2010Tradução . . Acesso em: 26 jul. 2024.
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      Cavallari, M. R., Albertin, K. F., Santos, G. dos, Ramos, C. A. S., Pereyra, I., Fonseca, F. J., & Andrade, A. M. de. (2010). PECVD silicon oxynitrite as insulator for MDMO-PPV thin-film transistors. Journal of Integrated Circuits and Systems, 5( 2), 116-124.
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      Cavallari MR, Albertin KF, Santos G dos, Ramos CAS, Pereyra I, Fonseca FJ, Andrade AM de. PECVD silicon oxynitrite as insulator for MDMO-PPV thin-film transistors. Journal of Integrated Circuits and Systems. 2010 ;5( 2): 116-124.[citado 2024 jul. 26 ]
    • Vancouver

      Cavallari MR, Albertin KF, Santos G dos, Ramos CAS, Pereyra I, Fonseca FJ, Andrade AM de. PECVD silicon oxynitrite as insulator for MDMO-PPV thin-film transistors. Journal of Integrated Circuits and Systems. 2010 ;5( 2): 116-124.[citado 2024 jul. 26 ]
  • Source: Physica Status Solidi C. Unidade: EP

    Subjects: FILMES FINOS, SEMICONDUTORES, METAIS, PROCESSOS DE MICROELETRÔNICA, SISTEMAS MICROELETROMECÂNICOS

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      OLIVEIRA, Alessandro Ricardo e PEREYRA, Inés e PÁEZ CARREÑO, Marcelo Nelson. A study of metal contact properties on thermal annealed PECVD SiC thin films for MEMS applications. Physica Status Solidi C, v. 7, n. 3/4, p. 793-796, 2010Tradução . . Disponível em: https://doi.org/10.1002/pssc.200982839. Acesso em: 26 jul. 2024.
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      Oliveira, A. R., Pereyra, I., & Páez Carreño, M. N. (2010). A study of metal contact properties on thermal annealed PECVD SiC thin films for MEMS applications. Physica Status Solidi C, 7( 3/4), 793-796. doi:10.1002/pssc.200982839
    • NLM

      Oliveira AR, Pereyra I, Páez Carreño MN. A study of metal contact properties on thermal annealed PECVD SiC thin films for MEMS applications [Internet]. Physica Status Solidi C. 2010 ; 7( 3/4): 793-796.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1002/pssc.200982839
    • Vancouver

      Oliveira AR, Pereyra I, Páez Carreño MN. A study of metal contact properties on thermal annealed PECVD SiC thin films for MEMS applications [Internet]. Physica Status Solidi C. 2010 ; 7( 3/4): 793-796.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1002/pssc.200982839
  • Source: Microelectronics Technology and Devices - SBMicro 2010. Unidade: EP

    Subjects: CAPACITORES, MICROSCOPIA ELETRÔNICA

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      ALBERTIN, Katia Franklin et al. Study of TiOxNy MOS capacitors. Microelectronics Technology and Devices - SBMicro 2010, v. 31, n. 1, p. 349-358, 2010Tradução . . Disponível em: https://doi.org/10.1149/1.3183707. Acesso em: 26 jul. 2024.
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      Albertin, K. F., Souza, D. C. P. de, Zuñiga Paez, A. A., & Pereyra, I. (2010). Study of TiOxNy MOS capacitors. Microelectronics Technology and Devices - SBMicro 2010, 31( 1), 349-358. doi:10.1149/1.3183707
    • NLM

      Albertin KF, Souza DCP de, Zuñiga Paez AA, Pereyra I. Study of TiOxNy MOS capacitors [Internet]. Microelectronics Technology and Devices - SBMicro 2010. 2010 ; 31( 1): 349-358.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1149/1.3183707
    • Vancouver

      Albertin KF, Souza DCP de, Zuñiga Paez AA, Pereyra I. Study of TiOxNy MOS capacitors [Internet]. Microelectronics Technology and Devices - SBMicro 2010. 2010 ; 31( 1): 349-358.[citado 2024 jul. 26 ] Available from: https://doi.org/10.1149/1.3183707
  • Source: Journal of Vacuum Science and Technology B. Unidade: EP

    Assunto: DIELÉTRICOS

    How to cite
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    • ABNT

      ALBERTIN, Katia Franklin e PEREYRA, Inés. Study of metal oxide-semiconductor capacitors with rf magnetron sputtering TiOx and TiOxNy gate dielectric layer. Journal of Vacuum Science and Technology B, v. 27, n. ja/feb. 2009, p. 236-245, 2009Tradução . . Acesso em: 26 jul. 2024.
    • APA

      Albertin, K. F., & Pereyra, I. (2009). Study of metal oxide-semiconductor capacitors with rf magnetron sputtering TiOx and TiOxNy gate dielectric layer. Journal of Vacuum Science and Technology B, 27( ja/feb. 2009), 236-245.
    • NLM

      Albertin KF, Pereyra I. Study of metal oxide-semiconductor capacitors with rf magnetron sputtering TiOx and TiOxNy gate dielectric layer. Journal of Vacuum Science and Technology B. 2009 ; 27( ja/feb. 2009): 236-245.[citado 2024 jul. 26 ]
    • Vancouver

      Albertin KF, Pereyra I. Study of metal oxide-semiconductor capacitors with rf magnetron sputtering TiOx and TiOxNy gate dielectric layer. Journal of Vacuum Science and Technology B. 2009 ; 27( ja/feb. 2009): 236-245.[citado 2024 jul. 26 ]
  • Source: siPDusp. Conference titles: Simpósio Internacional de Pós-Doutorado. Unidade: EP

    Subjects: FILMES FINOS, MICROELETRÔNICA

    How to cite
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    • ABNT

      OLIVEIRA, Alessandro Ricardo de e PEREYRA, Inés e PÁEZ CARREÑO, Marcelo Nelson. Caracterização elétrica de contatos de Al, Ni e Ti em filmes cristalizados de SiC obtidos por PECVD. 2008, Anais.. São Paulo: USP, 2008. . Acesso em: 26 jul. 2024.
    • APA

      Oliveira, A. R. de, Pereyra, I., & Páez Carreño, M. N. (2008). Caracterização elétrica de contatos de Al, Ni e Ti em filmes cristalizados de SiC obtidos por PECVD. In siPDusp. São Paulo: USP.
    • NLM

      Oliveira AR de, Pereyra I, Páez Carreño MN. Caracterização elétrica de contatos de Al, Ni e Ti em filmes cristalizados de SiC obtidos por PECVD. siPDusp. 2008 ;[citado 2024 jul. 26 ]
    • Vancouver

      Oliveira AR de, Pereyra I, Páez Carreño MN. Caracterização elétrica de contatos de Al, Ni e Ti em filmes cristalizados de SiC obtidos por PECVD. siPDusp. 2008 ;[citado 2024 jul. 26 ]
  • Source: SBMICRO 2008: Anais. Conference titles: International Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP

    Assunto: MICROELETRÔNICA

    How to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      ALBERTIN, Katia Franklin e PEREYRA, Inés. Improved density of states and effective charge density in SI/PECVD Si/OxNy interface. 2008, Anais.. Pennington: The Electrochemical Society, 2008. . Acesso em: 26 jul. 2024.
    • APA

      Albertin, K. F., & Pereyra, I. (2008). Improved density of states and effective charge density in SI/PECVD Si/OxNy interface. In SBMICRO 2008: Anais. Pennington: The Electrochemical Society.
    • NLM

      Albertin KF, Pereyra I. Improved density of states and effective charge density in SI/PECVD Si/OxNy interface. SBMICRO 2008: Anais. 2008 ;[citado 2024 jul. 26 ]
    • Vancouver

      Albertin KF, Pereyra I. Improved density of states and effective charge density in SI/PECVD Si/OxNy interface. SBMICRO 2008: Anais. 2008 ;[citado 2024 jul. 26 ]

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