Characterization of thin MOS gate oxides grown in pyrogenic environment

Characterization of thin MOS gate oxides grown in pyrogenic environment (2004)

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ABNT

NOGUEIRA, Willian Aurélio; SANTOS FILHO, Sebastião Gomes dos. Characterization of thin MOS gate oxides grown in pyrogenic environment. Anais.. Pennington: The Electrochemical Society, 2004.
APA

Nogueira, W. A., & Santos Filho, S. G. dos. (2004). Characterization of thin MOS gate oxides grown in pyrogenic environment. In Microelectronics technology and devices SBMicro 2004.. Pennington: The Electrochemical Society.
NLM

Nogueira WA, Santos Filho SG dos. Characterization of thin MOS gate oxides grown in pyrogenic environment. Microelectronics technology and devices SBMicro 2004. 2004 ;
Vancouver

Nogueira WA, Santos Filho SG dos. Characterization of thin MOS gate oxides grown in pyrogenic environment. Microelectronics technology and devices SBMicro 2004. 2004 ;