Temporal evolution of roughness in electroless copper films (2001)
- Authors:
- Autor USP: SANTOS FILHO, SEBASTIAO GOMES DOS - EP
- Unidade: EP
- Assunto: CIRCUITOS INTEGRADOS
- Language: Inglês
- Imprenta:
- Source:
- Título: SBMicro 2001: proceedings
- Conference titles: International Conference on Microelectronics and Packaging
-
ABNT
HASAN, Nasser Mahmoud e SANTOS FILHO, Sebastião Gomes dos e SCHWAZACHER, Walter. Temporal evolution of roughness in electroless copper films. 2001, Anais.. Brasília: SBMicro, 2001. . Acesso em: 23 jan. 2026. -
APA
Hasan, N. M., Santos Filho, S. G. dos, & Schwazacher, W. (2001). Temporal evolution of roughness in electroless copper films. In SBMicro 2001: proceedings. Brasília: SBMicro. -
NLM
Hasan NM, Santos Filho SG dos, Schwazacher W. Temporal evolution of roughness in electroless copper films. SBMicro 2001: proceedings. 2001 ;[citado 2026 jan. 23 ] -
Vancouver
Hasan NM, Santos Filho SG dos, Schwazacher W. Temporal evolution of roughness in electroless copper films. SBMicro 2001: proceedings. 2001 ;[citado 2026 jan. 23 ] - Formation and stability of Ni(Pt)Si/Poly-Si layered structure
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