Electrical simulations of gate-controlled diodes in order to show their feasibility as luminous radiation sensors (2000)
- Authors:
- Autor USP: SANTOS FILHO, SEBASTIAO GOMES DOS - EP
- Unidade: EP
- Assunto: CIRCUITOS INTEGRADOS
- Language: Inglês
- Imprenta:
- Publisher: SBMicro/UA/UFRGS/UNICAMP/USP
- Publisher place: Manaus
- Date published: 2000
- Source:
- Título: SBMicro 2000 : proceedings
- Conference titles: International Conference on Microelectronics and Packaging
-
ABNT
ARAÚJO, Hugo Puertas de e SANTOS FILHO, Sebastião Gomes dos. Electrical simulations of gate-controlled diodes in order to show their feasibility as luminous radiation sensors. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 28 fev. 2026. -
APA
Araújo, H. P. de, & Santos Filho, S. G. dos. (2000). Electrical simulations of gate-controlled diodes in order to show their feasibility as luminous radiation sensors. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP. -
NLM
Araújo HP de, Santos Filho SG dos. Electrical simulations of gate-controlled diodes in order to show their feasibility as luminous radiation sensors. SBMicro 2000 : proceedings. 2000 ;[citado 2026 fev. 28 ] -
Vancouver
Araújo HP de, Santos Filho SG dos. Electrical simulations of gate-controlled diodes in order to show their feasibility as luminous radiation sensors. SBMicro 2000 : proceedings. 2000 ;[citado 2026 fev. 28 ] - Nano-crystalline palladium-film catalysts deposited by e-beam evaporation aiming hydrogen sensing
- Influence of the 'SI' / 'SI''O IND.2' interface roughness on electronic roughness
- Dynamic scaling of the surface roughness during electroless Cu plating onto Si in aqueous fluoride solution
- Fabrication and physical characterization of nickel nanowires formed by a template-based electrodeposition method
- Formation and stability of Ni(Pt)Si/Poly-Si layered structure
- Characterization of thin MOS gate oxides grown in pyrogenic environment
- Partial dielectric breakdown in MOS gate oxide grown by RTO
- Construcao de termopares sobre laminas de silicio para calibracao de fornos rtp
- Temporal evolution of roughness in electroless copper films
- Characterization of a ISFET device as a ph sensor for applications in the industrial, environmental and biomedical fields
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
