Photoreflectance investigations of semiconductor device structures (1995)
- Authors:
- Autor USP: LEITE, JOSE ROBERTO - IF
- Unidade: IF
- Assunto: MATÉRIA CONDENSADA
- Language: Português
- Imprenta:
- Publisher: Sociedade Brasileira de Fisica
- Publisher place: Sao Paulo
- Date published: 1995
- Source:
- Título do periódico: Resumos
- Conference titles: Encontro Nacional de Fisica da Materia Condensada
-
ABNT
SOARES, J A N T et al. Photoreflectance investigations of semiconductor device structures. 1995, Anais.. Sao Paulo: Sociedade Brasileira de Fisica, 1995. . Acesso em: 19 set. 2024. -
APA
Soares, J. A. N. T., Enderlein, R., Leite, J. R., & Saito, M. (1995). Photoreflectance investigations of semiconductor device structures. In Resumos. Sao Paulo: Sociedade Brasileira de Fisica. -
NLM
Soares JANT, Enderlein R, Leite JR, Saito M. Photoreflectance investigations of semiconductor device structures. Resumos. 1995 ;[citado 2024 set. 19 ] -
Vancouver
Soares JANT, Enderlein R, Leite JR, Saito M. Photoreflectance investigations of semiconductor device structures. Resumos. 1995 ;[citado 2024 set. 19 ] - Propriedades eletronicas dos complexos ouro substitucional-metal de transicao intersticial em silicio
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