Source: Microscopy Research and Technique. Unidade: IF
Subjects: FÍSICA NUCLEAR, FILMES FINOS, ESPECTROSCOPIA DE RAIO X, CROMO, ALUMÍNIO, NÍQUEL, SILÍCIO, MICROANÁLISE
ABNT
OBLITAS, Raissa Lima de e TEIXEIRA, Fernanda S. e SALVADORI, M. C. Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis. Microscopy Research and Technique, p. 10 , 2021Tradução . . Disponível em: https://doi.org/10.1002/jemt.23917. Acesso em: 17 out. 2024.APA
Oblitas, R. L. de, Teixeira, F. S., & Salvadori, M. C. (2021). Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis. Microscopy Research and Technique, 10 . doi:10.1002/jemt.23917NLM
Oblitas RL de, Teixeira FS, Salvadori MC. Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis [Internet]. Microscopy Research and Technique. 2021 ;10 .[citado 2024 out. 17 ] Available from: https://doi.org/10.1002/jemt.23917Vancouver
Oblitas RL de, Teixeira FS, Salvadori MC. Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis [Internet]. Microscopy Research and Technique. 2021 ;10 .[citado 2024 out. 17 ] Available from: https://doi.org/10.1002/jemt.23917