Subjects: FÍSICA DE PARTÍCULAS, RADIAÇÃO IONIZANTE, ÍONS PESADOS
ABNT
GOBATTO, Leonardo R. et al. Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection. 2024, Anais.. Piscataway, NJ: IEEE, 2024. Disponível em: https://doi.org/10.1109/LATS62223.2024.10534599. Acesso em: 16 fev. 2025.APA
Gobatto, L. R., Benevenuti, F., Added, N., Alberton, S., Macchione, E. L. A., Aguiar, V. A. P., et al. (2024). Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection. In . Piscataway, NJ: IEEE. doi:10.1109/LATS62223.2024.10534599NLM
Gobatto LR, Benevenuti F, Added N, Alberton S, Macchione ELA, Aguiar VAP, Medina NH, Kastensmidt FL, Azambuja JR. Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection [Internet]. 2024 ;[citado 2025 fev. 16 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534599Vancouver
Gobatto LR, Benevenuti F, Added N, Alberton S, Macchione ELA, Aguiar VAP, Medina NH, Kastensmidt FL, Azambuja JR. Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection [Internet]. 2024 ;[citado 2025 fev. 16 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534599