Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA (2019)
- Authors:
- USP affiliated authors: ADDED, NEMITALA - IF ; MEDINA, NILBERTO HEDER - IF ; AGUIAR, VITOR REZENDE DA COSTA - IB
- Unidades: IF; IB
- DOI: 10.1109/TNS.2019.2921796
- Subjects: FÍSICA NUCLEAR; ÍONS PESADOS
- Keywords: ARM MICROPROCESSOR; FAULT INJECTION (FI); FIELD-PROGRAMMABLE GATE ARRAYS(FPGA); HEAVY ION; RELIABILITY; SOFT ERROR; SOFT PROCESSOR; TRIPLE MODULAR REDUNDANCY (TMR)
- Language: Inglês
- Imprenta:
- Publisher place: Piscataway, NJ
- Date published: 2019
- Source:
- Título: IEEE Transactions on Nuclear Science
- ISSN: 1558-1578
- Volume/Número/Paginação/Ano: v. 66 , n. 7, p. 1433-1440, 2019
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
BENITES, Luis A. C. et al. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA. IEEE Transactions on Nuclear Science, v. 66 , n. 7, p. 1433-1440, 2019Tradução . . Disponível em: https://doi.org/10.1109/TNS.2019.2921796. Acesso em: 10 nov. 2024. -
APA
Benites, L. A. C., Benevenuti, F., Oliveira, A. B. de, Kastensmidt, F. L., Added, N., Aguiar, V. Â. P. de, et al. (2019). Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA. IEEE Transactions on Nuclear Science, 66 ( 7), 1433-1440. doi:10.1109/TNS.2019.2921796 -
NLM
Benites LAC, Benevenuti F, Oliveira AB de, Kastensmidt FL, Added N, Aguiar VÂP de, Nilberto H. Medina NH, Guazzelli MA. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA [Internet]. IEEE Transactions on Nuclear Science. 2019 ; 66 ( 7): 1433-1440.[citado 2024 nov. 10 ] Available from: https://doi.org/10.1109/TNS.2019.2921796 -
Vancouver
Benites LAC, Benevenuti F, Oliveira AB de, Kastensmidt FL, Added N, Aguiar VÂP de, Nilberto H. Medina NH, Guazzelli MA. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA [Internet]. IEEE Transactions on Nuclear Science. 2019 ; 66 ( 7): 1433-1440.[citado 2024 nov. 10 ] Available from: https://doi.org/10.1109/TNS.2019.2921796 - Ionizing radiation effect mechanisms in electronic devices: how and what to measure
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Informações sobre o DOI: 10.1109/TNS.2019.2921796 (Fonte: oaDOI API)
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