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Artigo de periodico
Introduction to Python Dynamic Diffraction Toolkit (PyDDT): structural refinement of single crystals via X-ray phase measurements (2023)
Penacchio, Rafaela Felix da Silva ; Estradiote, Maurício Bastos ; Remedios, Claudio M. R.; Calligaris, Guilherme A.; Torikachvili, Milton S.; Kycia, Stefan W.; Morelhão, Sergio Luiz
Source: Journal of Applied Crystallography (JAC). Unidade: IF
Subjects: RAIOS X, ESTRUTURA MOLECULAR (FÍSICA MODERNA)
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PENACCHIO, Rafaela Felix da Silva et al. Introduction to Python Dynamic Diffraction Toolkit (PyDDT): structural refinement of single crystals via X-ray phase measurements. Journal of Applied Crystallography (JAC), v. 56, p. 1574-1584, 2023Tradução . . Disponível em: https://doi.org/10.1107/S1600576723005800. Acesso em: 02 out. 2024.
APA
Penacchio, R. F. da S., Estradiote, M. B., Remedios, C. M. R., Calligaris, G. A., Torikachvili, M. S., Kycia, S. W., & Morelhão, S. L. (2023). Introduction to Python Dynamic Diffraction Toolkit (PyDDT): structural refinement of single crystals via X-ray phase measurements. Journal of Applied Crystallography (JAC), 56, 1574-1584. doi:10.1107/S1600576723005800
NLM
Penacchio RF da S, Estradiote MB, Remedios CMR, Calligaris GA, Torikachvili MS, Kycia SW, Morelhão SL. Introduction to Python Dynamic Diffraction Toolkit (PyDDT): structural refinement of single crystals via X-ray phase measurements [Internet]. Journal of Applied Crystallography (JAC). 2023 ; 56 1574-1584.[citado 2024 out. 02 ] Available from: https://doi.org/10.1107/S1600576723005800
Vancouver
Penacchio RF da S, Estradiote MB, Remedios CMR, Calligaris GA, Torikachvili MS, Kycia SW, Morelhão SL. Introduction to Python Dynamic Diffraction Toolkit (PyDDT): structural refinement of single crystals via X-ray phase measurements [Internet]. Journal of Applied Crystallography (JAC). 2023 ; 56 1574-1584.[citado 2024 out. 02 ] Available from: https://doi.org/10.1107/S1600576723005800
Relatorio tecnico
Vibrational and structural properties of the R'FE' IND.4''SB' IND.12' (R ='NA', 'K', 'CA', 'SR', 'BA') filled skutterudites (2022)
Abrantes, Juliana Gonçalves de ; Freire, Victoria Valentim; Germano, Tarsis Mendes; Garcia, Fernando Assis ; Bittar, Eduardo M; Leithe-Jasper, Andreas
Unidade: IF
Subjects: FÍSICA MATEMÁTICA, RAIOS X
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ABRANTES, Juliana Gonçalves de et al. Vibrational and structural properties of the R'FE' IND.4''SB' IND.12' (R ='NA', 'K', 'CA', 'SR', 'BA') filled skutterudites. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/pdf/2203.14821.pdf. Acesso em: 02 out. 2024. , 2022
APA
Abrantes, J. G. de, Freire, V. V., Germano, T. M., Garcia, F. A., Bittar, E. M., & Leithe-Jasper, A. (2022). Vibrational and structural properties of the R'FE' IND.4''SB' IND.12' (R ='NA', 'K', 'CA', 'SR', 'BA') filled skutterudites. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/pdf/2203.14821.pdf
NLM
Abrantes JG de, Freire VV, Germano TM, Garcia FA, Bittar EM, Leithe-Jasper A. Vibrational and structural properties of the R'FE' IND.4''SB' IND.12' (R ='NA', 'K', 'CA', 'SR', 'BA') filled skutterudites [Internet]. 2022 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/pdf/2203.14821.pdf
Vancouver
Abrantes JG de, Freire VV, Germano TM, Garcia FA, Bittar EM, Leithe-Jasper A. Vibrational and structural properties of the R'FE' IND.4''SB' IND.12' (R ='NA', 'K', 'CA', 'SR', 'BA') filled skutterudites [Internet]. 2022 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/pdf/2203.14821.pdf
Trabalho de evento-resumo
PIXESim: self consistent analyses of RBS and PIXE data in MultiSIMNRA (2022)
Rodrigues, Cleber Lima ; Silva, Tiago Fiorini da ; Saramela, Thiago Badaró ; Tabacniks, Manfredo Harri
Source: Resumos. Conference titles: INCT-FNA Symposium- Institute of Physics. Unidade: IF
Assunto: RAIOS X
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RODRIGUES, Cleber Lima et al. PIXESim: self consistent analyses of RBS and PIXE data in MultiSIMNRA. 2022, Anais.. São Paulo: Universidade Federal Fluminese, 2022. Disponível em: https://inct-fna.if.uff.br/symposium2022/wp-content/uploads/sites/4/2022/11/Poster_Session.pdf. Acesso em: 02 out. 2024.
APA
Rodrigues, C. L., Silva, T. F. da, Saramela, T. B., & Tabacniks, M. H. (2022). PIXESim: self consistent analyses of RBS and PIXE data in MultiSIMNRA. In Resumos. São Paulo: Universidade Federal Fluminese. Recuperado de https://inct-fna.if.uff.br/symposium2022/wp-content/uploads/sites/4/2022/11/Poster_Session.pdf
NLM
Rodrigues CL, Silva TF da, Saramela TB, Tabacniks MH. PIXESim: self consistent analyses of RBS and PIXE data in MultiSIMNRA [Internet]. Resumos. 2022 ;[citado 2024 out. 02 ] Available from: https://inct-fna.if.uff.br/symposium2022/wp-content/uploads/sites/4/2022/11/Poster_Session.pdf
Vancouver
Rodrigues CL, Silva TF da, Saramela TB, Tabacniks MH. PIXESim: self consistent analyses of RBS and PIXE data in MultiSIMNRA [Internet]. Resumos. 2022 ;[citado 2024 out. 02 ] Available from: https://inct-fna.if.uff.br/symposium2022/wp-content/uploads/sites/4/2022/11/Poster_Session.pdf
Relatorio tecnico
A simple recipe to create three-dimensional reciprocal space maps (2022)
Penacchio, Rafaela Felix da Silva ; Fornari, Celso I.; Kagerer, Philipp; Dittmar, Marco; Müller, Simon; Reinert, Friedrich; Estradiote, Maurício Bastos ; Morelhão, Sergio Luiz
Unidade: IF
Subjects: TOPOLOGIA, RAIOS X
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ABNT
PENACCHIO, Rafaela Felix da Silva et al. A simple recipe to create three-dimensional reciprocal space maps. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/pdf/2210.05427.pdf. Acesso em: 02 out. 2024. , 2022
APA
Penacchio, R. F. da S., Fornari, C. I., Kagerer, P., Dittmar, M., Müller, S., Reinert, F., et al. (2022). A simple recipe to create three-dimensional reciprocal space maps. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/pdf/2210.05427.pdf
NLM
Penacchio RF da S, Fornari CI, Kagerer P, Dittmar M, Müller S, Reinert F, Estradiote MB, Morelhão SL. A simple recipe to create three-dimensional reciprocal space maps [Internet]. 2022 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/pdf/2210.05427.pdf
Vancouver
Penacchio RF da S, Fornari CI, Kagerer P, Dittmar M, Müller S, Reinert F, Estradiote MB, Morelhão SL. A simple recipe to create three-dimensional reciprocal space maps [Internet]. 2022 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/pdf/2210.05427.pdf
Relatorio tecnico
Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles (2022)
Valério, Adriana ; Penacchio, Rafaela Felix da Silva ; Estradiote, Maurício Bastos ; Morelhão, Sergio Luiz
Unidade: IF
Subjects: NANOPARTÍCULAS, RAIOS X
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ABNT
VALÉRIO, Adriana et al. Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/pdf/2203.00866.pdf. Acesso em: 02 out. 2024. , 2022
APA
Valério, A., Penacchio, R. F. da S., Estradiote, M. B., & Morelhão, S. L. (2022). Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/pdf/2203.00866.pdf
NLM
Valério A, Penacchio RF da S, Estradiote MB, Morelhão SL. Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles [Internet]. 2022 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/pdf/2203.00866.pdf
Vancouver
Valério A, Penacchio RF da S, Estradiote MB, Morelhão SL. Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles [Internet]. 2022 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/pdf/2203.00866.pdf
Relatorio tecnico
Characterization of particulate matter in iron ore mining region of Itabira, Minas Gerais, Brazil (2021)
Freitas, Ana Carolina Vasques; Belardi, Rose-Marie; Barbosa, H. M. J.
Source: Atmósfera. Unidade: IF
Subjects: FÍSICA ATMOSFÉRICA, METEOROLOGIA FÍSICA, MATERIAL PARTICULADO, CARBONO, MINERAÇÃO DE MINERAIS METÁLICOS, POLUIÇÃO ATMOSFÉRICA, AEROSSOL, QUALIDADE DO AR, FLUORESCÊNCIA, RAIOS X, GUSA, METALURGIA FERROSA
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FREITAS, Ana Carolina Vasques e BELARDI, Rose-Marie e BARBOSA, H. M. J. Characterization of particulate matter in iron ore mining region of Itabira, Minas Gerais, Brazil. Atmósfera. Cidade do México: Instituto de Física, Universidade de São Paulo. Disponível em: https://doi.org/10.20937/ATM.52987. Acesso em: 02 out. 2024. , 2021
APA
Freitas, A. C. V., Belardi, R. -M., & Barbosa, H. M. J. (2021). Characterization of particulate matter in iron ore mining region of Itabira, Minas Gerais, Brazil. Atmósfera. Cidade do México: Instituto de Física, Universidade de São Paulo. doi:10.20937/ATM.52987
NLM
Freitas ACV, Belardi R-M, Barbosa HMJ. Characterization of particulate matter in iron ore mining region of Itabira, Minas Gerais, Brazil [Internet]. Atmósfera. 2021 ;42 .[citado 2024 out. 02 ] Available from: https://doi.org/10.20937/ATM.52987
Vancouver
Freitas ACV, Belardi R-M, Barbosa HMJ. Characterization of particulate matter in iron ore mining region of Itabira, Minas Gerais, Brazil [Internet]. Atmósfera. 2021 ;42 .[citado 2024 out. 02 ] Available from: https://doi.org/10.20937/ATM.52987
Artigo de periodico
Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction (2020)
Valerio, Adriana; Penacchio, Rafaela Felix da Silva ; Estradiote, Maurício B.; Cantarino, Marli dos Reis ; Garcia, F. A. ; Morelhao, Sergio L. ; Rafter, Niamh; Kycia, Stefan W.; Calligaris, Guilherme A.; Remédios, Cláudio M.R.
Source: MRS Communications. Unidade: IF
Subjects: CRISTALOGRAFIA FÍSICA, TERMOANÁLISE, RAIOS X
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VALERIO, Adriana et al. Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction. MRS Communications, v. 10, n. 2, p. 265-271, 2020Tradução . . Disponível em: https://doi.org/10.1557/mrc.2020.37. Acesso em: 02 out. 2024.
APA
Valerio, A., Penacchio, R. F. da S., Estradiote, M. B., Cantarino, M. dos R., Garcia, F. A., Morelhao, S. L., et al. (2020). Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction. MRS Communications, 10( 2), 265-271. doi:10.1557/mrc.2020.37
NLM
Valerio A, Penacchio RF da S, Estradiote MB, Cantarino M dos R, Garcia FA, Morelhao SL, Rafter N, Kycia SW, Calligaris GA, Remédios CMR. Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction [Internet]. MRS Communications. 2020 ; 10( 2): 265-271.[citado 2024 out. 02 ] Available from: https://doi.org/10.1557/mrc.2020.37
Vancouver
Valerio A, Penacchio RF da S, Estradiote MB, Cantarino M dos R, Garcia FA, Morelhao SL, Rafter N, Kycia SW, Calligaris GA, Remédios CMR. Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction [Internet]. MRS Communications. 2020 ; 10( 2): 265-271.[citado 2024 out. 02 ] Available from: https://doi.org/10.1557/mrc.2020.37
Relatorio tecnico
Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction (2020)
Valerio, Adriana; Penacchio, Rafaela F.S.; Estradiote, Maurício B.; Cantarino, Marli ; Garcia, F. A. ; Morelhão, Sergio Luiz ; Rafter, Niamh; Kycia, Stefan W.; Calligaris, Guilherme A.; Remédios, Cláudio M.R.
Unidade: IF
Subjects: CRISTALOGRAFIA FÍSICA, TERMOANÁLISE, RAIOS X
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ABNT
VALERIO, Adriana et al. Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/ftp/arxiv/papers/2006/2006.12747.pdf. Acesso em: 02 out. 2024. , 2020
APA
Valerio, A., Penacchio, R. F. S., Estradiote, M. B., Cantarino, M., Garcia, F. A., Morelhão, S. L., et al. (2020). Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/ftp/arxiv/papers/2006/2006.12747.pdf
NLM
Valerio A, Penacchio RFS, Estradiote MB, Cantarino M, Garcia FA, Morelhão SL, Rafter N, Kycia SW, Calligaris GA, Remédios CMR. Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction [Internet]. 2020 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/ftp/arxiv/papers/2006/2006.12747.pdf
Vancouver
Valerio A, Penacchio RFS, Estradiote MB, Cantarino M, Garcia FA, Morelhão SL, Rafter N, Kycia SW, Calligaris GA, Remédios CMR. Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction [Internet]. 2020 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/ftp/arxiv/papers/2006/2006.12747.pdf
Relatorio tecnico
Usage of scherrer's formula in X-ray di raction analysis of size distribution in systems of monocrystalline nanoparticles (2019)
Valério, Adriana; Morelhão, Sergio Luiz
Unidade: IF
Subjects: NANOPARTÍCULAS, RAIOS X
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ABNT
VALÉRIO, Adriana e MORELHÃO, Sergio Luiz. Usage of scherrer's formula in X-ray di raction analysis of size distribution in systems of monocrystalline nanoparticles. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/abs/1911.00701. Acesso em: 02 out. 2024. , 2019
APA
Valério, A., & Morelhão, S. L. (2019). Usage of scherrer's formula in X-ray di raction analysis of size distribution in systems of monocrystalline nanoparticles. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/abs/1911.00701
NLM
Valério A, Morelhão SL. Usage of scherrer's formula in X-ray di raction analysis of size distribution in systems of monocrystalline nanoparticles [Internet]. 2019 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/abs/1911.00701
Vancouver
Valério A, Morelhão SL. Usage of scherrer's formula in X-ray di raction analysis of size distribution in systems of monocrystalline nanoparticles [Internet]. 2019 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/abs/1911.00701
Artigo de periodico
Hard x-ray spectroscopy of the itinerant magnetsRFe4Sb12(R=Na, K, Ca, Sr, Ba) (2019)
Mounssef Jr., Bassim; Cantarino, Marli dos Reis; Bittar, Eduardo M.; Germano, Tarsis Mendes; Leithe-Jasper, Andreas; Garcia, Fernando Assis
Source: Physical Review B. Unidades: IF, IQ
Subjects: ESPECTROSCOPIA, RAIOS X, RADIAÇÃO SINCROTRON, MAGNETISMO, ESTRUTURA ELETRÔNICA
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ABNT
MOUNSSEF JR., Bassim et al. Hard x-ray spectroscopy of the itinerant magnetsRFe4Sb12(R=Na, K, Ca, Sr, Ba). Physical Review B, v. 99, n. 3, 2019Tradução . . Disponível em: https://doi.org/10.1103/PhysRevB.99.035152. Acesso em: 02 out. 2024.
APA
Mounssef Jr., B., Cantarino, M. dos R., Bittar, E. M., Germano, T. M., Leithe-Jasper, A., & Garcia, F. A. (2019). Hard x-ray spectroscopy of the itinerant magnetsRFe4Sb12(R=Na, K, Ca, Sr, Ba). Physical Review B, 99( 3). doi:10.1103/PhysRevB.99.035152
NLM
Mounssef Jr. B, Cantarino M dos R, Bittar EM, Germano TM, Leithe-Jasper A, Garcia FA. Hard x-ray spectroscopy of the itinerant magnetsRFe4Sb12(R=Na, K, Ca, Sr, Ba) [Internet]. Physical Review B. 2019 ; 99( 3):[citado 2024 out. 02 ] Available from: https://doi.org/10.1103/PhysRevB.99.035152
Vancouver
Mounssef Jr. B, Cantarino M dos R, Bittar EM, Germano TM, Leithe-Jasper A, Garcia FA. Hard x-ray spectroscopy of the itinerant magnetsRFe4Sb12(R=Na, K, Ca, Sr, Ba) [Internet]. Physical Review B. 2019 ; 99( 3):[citado 2024 out. 02 ] Available from: https://doi.org/10.1103/PhysRevB.99.035152
Relatorio tecnico
Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals (2019)
Morelhão, Sergio Luiz ; Kycia, Stefan; Netzke, Samuel; Fornari, Celso I.; Rappl, Paulo H. O.
Unidade: IF
Subjects: NANOPARTÍCULAS, RAIOS X
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ABNT
MORELHÃO, Sergio Luiz et al. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/abs/1911.00396. Acesso em: 02 out. 2024. , 2019
APA
Morelhão, S. L., Kycia, S., Netzke, S., Fornari, C. I., & Rappl, P. H. O. (2019). Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/abs/1911.00396
NLM
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals [Internet]. 2019 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/abs/1911.00396
Vancouver
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals [Internet]. 2019 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/abs/1911.00396
Artigo de periodico
Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry (2019)
Santos, Hellen Cristine ; Silva, Tiago Fiorini da ; Leite, Alisson Rodolfo ; Assis, Renan Ferreira de; Campos, Pedro Herzilio Ottoni Viviani de ; Rizzutto, Marcia de Almeida ; Tabacniks, Manfredo Harri
Source: Journal of Applied Physics. Unidade: IF
Subjects: ÍONS, RAIOS X, FLUORESCÊNCIA, ENERGIA, DIFRAÇÃO POR RAIOS X
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ABNT
SANTOS, Hellen Cristine et al. Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry. Journal of Applied Physics, v. 126, n. 4, 2019Tradução . . Disponível em: https://doi.org/10.1063/1.5108746. Acesso em: 02 out. 2024.
APA
Santos, H. C., Silva, T. F. da, Leite, A. R., Assis, R. F. de, Campos, P. H. O. V. de, Rizzutto, M. de A., & Tabacniks, M. H. (2019). Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry. Journal of Applied Physics, 126( 4). doi:10.1063/1.5108746
NLM
Santos HC, Silva TF da, Leite AR, Assis RF de, Campos PHOV de, Rizzutto M de A, Tabacniks MH. Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry [Internet]. Journal of Applied Physics. 2019 ; 126( 4):[citado 2024 out. 02 ] Available from: https://doi.org/10.1063/1.5108746
Vancouver
Santos HC, Silva TF da, Leite AR, Assis RF de, Campos PHOV de, Rizzutto M de A, Tabacniks MH. Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry [Internet]. Journal of Applied Physics. 2019 ; 126( 4):[citado 2024 out. 02 ] Available from: https://doi.org/10.1063/1.5108746
Relatorio tecnico
MultiSIMNRA: a computational tool for self-consistent ion beam analysis using SIMNRA (2018)
Silva, Tiago Fiorini da; Moro, M. V.; Trindade, G. F.; Aguirre, F. R.; Mayer, M.; Added, Nemitala; Rizzutto, Marcia de Almeida; Tabacniks, Manfredo Harri
Unidade: IF
Subjects: RAIOS X, ESPECTROMETRIA, FÍSICA DA MATÉRIA CONDENSADA
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ABNT
SILVA, Tiago Fiorini da et al. MultiSIMNRA: a computational tool for self-consistent ion beam analysis using SIMNRA. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/abs/1803.01946. Acesso em: 02 out. 2024. , 2018
APA
Silva, T. F. da, Moro, M. V., Trindade, G. F., Aguirre, F. R., Mayer, M., Added, N., et al. (2018). MultiSIMNRA: a computational tool for self-consistent ion beam analysis using SIMNRA. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/abs/1803.01946
NLM
Silva TF da, Moro MV, Trindade GF, Aguirre FR, Mayer M, Added N, Rizzutto M de A, Tabacniks MH. MultiSIMNRA: a computational tool for self-consistent ion beam analysis using SIMNRA [Internet]. 2018 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/abs/1803.01946
Vancouver
Silva TF da, Moro MV, Trindade GF, Aguirre FR, Mayer M, Added N, Rizzutto M de A, Tabacniks MH. MultiSIMNRA: a computational tool for self-consistent ion beam analysis using SIMNRA [Internet]. 2018 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/abs/1803.01946
Artigo de periodico
Selective removal of ligands from colloidal nanocrystal assemblies with non-oxidizing 'HE' plasmas (2018)
Shaw, Santosh; Tian, Xinchun; Silva, Tiago Fiorini da; Bobbitt, Jonathan M.; Naab, Fabian; Smith, Emily A.; Cademartiri, Ludovico; Rodrigues, Cleber Lima
Source: Chemistry of Materials. Unidade: IF
Subjects: RAIOS X, ESPECTROMETRIA, FÍSICA DA MATÉRIA CONDENSADA
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ABNT
SHAW, Santosh et al. Selective removal of ligands from colloidal nanocrystal assemblies with non-oxidizing 'HE' plasmas. Chemistry of Materials, v. 30, n. 17, p. 5961-5967, 2018Tradução . . Disponível em: https://doi.org/10.1021/acs.chemmater.8b02095. Acesso em: 02 out. 2024.
APA
Shaw, S., Tian, X., Silva, T. F. da, Bobbitt, J. M., Naab, F., Smith, E. A., et al. (2018). Selective removal of ligands from colloidal nanocrystal assemblies with non-oxidizing 'HE' plasmas. Chemistry of Materials, 30( 17), 5961-5967. doi:10.1021/acs.chemmater.8b02095
NLM
Shaw S, Tian X, Silva TF da, Bobbitt JM, Naab F, Smith EA, Cademartiri L, Rodrigues CL. Selective removal of ligands from colloidal nanocrystal assemblies with non-oxidizing 'HE' plasmas [Internet]. Chemistry of Materials. 2018 ; 30( 17): 5961-5967.[citado 2024 out. 02 ] Available from: https://doi.org/10.1021/acs.chemmater.8b02095
Vancouver
Shaw S, Tian X, Silva TF da, Bobbitt JM, Naab F, Smith EA, Cademartiri L, Rodrigues CL. Selective removal of ligands from colloidal nanocrystal assemblies with non-oxidizing 'HE' plasmas [Internet]. Chemistry of Materials. 2018 ; 30( 17): 5961-5967.[citado 2024 out. 02 ] Available from: https://doi.org/10.1021/acs.chemmater.8b02095
Artigo de periodico
Protein encapsulation in SBA-15 with expanded pores (2016)
Garcia, Paulo Ricardo de Abreu Furtado; Sant'Anna, O. A.; Bicev, Renata Naporano; Oliveira Junior, Nei Fernandes de; Fantini, Márcia Carvalho de Abreu
Source: Microporous and Mesoporous Materials. Unidade: IF
Subjects: RAIOS X, MOLÉCULA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
GARCIA, Paulo Ricardo de Abreu Furtado et al. Protein encapsulation in SBA-15 with expanded pores. Microporous and Mesoporous Materials, v. no 2016, p. 59-68, 2016Tradução . . Disponível em: https://doi.org/10.1016/j.micromeso.2016.07.033. Acesso em: 02 out. 2024.
APA
Garcia, P. R. de A. F., Sant'Anna, O. A., Bicev, R. N., Oliveira Junior, N. F. de, & Fantini, M. C. de A. (2016). Protein encapsulation in SBA-15 with expanded pores. Microporous and Mesoporous Materials, no 2016, 59-68. doi:10.1016/j.micromeso.2016.07.033
NLM
Garcia PR de AF, Sant'Anna OA, Bicev RN, Oliveira Junior NF de, Fantini MC de A. Protein encapsulation in SBA-15 with expanded pores [Internet]. Microporous and Mesoporous Materials. 2016 ; no 2016 59-68.[citado 2024 out. 02 ] Available from: https://doi.org/10.1016/j.micromeso.2016.07.033
Vancouver
Garcia PR de AF, Sant'Anna OA, Bicev RN, Oliveira Junior NF de, Fantini MC de A. Protein encapsulation in SBA-15 with expanded pores [Internet]. Microporous and Mesoporous Materials. 2016 ; no 2016 59-68.[citado 2024 out. 02 ] Available from: https://doi.org/10.1016/j.micromeso.2016.07.033
Artigo de periodico
Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates (2016)
Domagala, Jaroslaw Z.; Sarzynski, Marcin; Mazdziarz, Marcin; Dluzewski, Pawel; Leszczynski, Michal; Morelhao, Sergio Luiz
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: SEMICONDUTORES, RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
DOMAGALA, Jaroslaw Z. et al. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography, v. 49, n. ju 2016, p. 798-805, 2016Tradução . . Disponível em: https://doi.org/10.1107/S1600576716004441. Acesso em: 02 out. 2024.
APA
Domagala, J. Z., Sarzynski, M., Mazdziarz, M., Dluzewski, P., Leszczynski, M., & Morelhao, S. L. (2016). Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography, 49( ju 2016), 798-805. doi:10.1107/S1600576716004441
NLM
Domagala JZ, Sarzynski M, Mazdziarz M, Dluzewski P, Leszczynski M, Morelhao SL. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates [Internet]. Journal of Applied Crystallography. 2016 ; 49( ju 2016): 798-805.[citado 2024 out. 02 ] Available from: https://doi.org/10.1107/S1600576716004441
Vancouver
Domagala JZ, Sarzynski M, Mazdziarz M, Dluzewski P, Leszczynski M, Morelhao SL. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates [Internet]. Journal of Applied Crystallography. 2016 ; 49( ju 2016): 798-805.[citado 2024 out. 02 ] Available from: https://doi.org/10.1107/S1600576716004441
Artigo de periodico
Structural properties of 'BI' IND. 2''TE' IND. 3' topological insulator thin films grown by molecular beam epitaxy on (111) 'BA''F' IND. 2' substrates (2016)
Fornari, Celso I.; Rappl, Paulo H. O.; Abramof, Eduardo; Morelhao, Sergio Luiz
Source: JOURNAL OF APPLIED PHYSICS. Unidade: IF
Subjects: SEMICONDUTORES, RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
FORNARI, Celso I. et al. Structural properties of 'BI' IND. 2''TE' IND. 3' topological insulator thin films grown by molecular beam epitaxy on (111) 'BA''F' IND. 2' substrates. JOURNAL OF APPLIED PHYSICS, v. 119, n. 16, p. 165303, 2016Tradução . . Disponível em: https://doi.org/10.1063/1.4947266. Acesso em: 02 out. 2024.
APA
Fornari, C. I., Rappl, P. H. O., Abramof, E., & Morelhao, S. L. (2016). Structural properties of 'BI' IND. 2''TE' IND. 3' topological insulator thin films grown by molecular beam epitaxy on (111) 'BA''F' IND. 2' substrates. JOURNAL OF APPLIED PHYSICS, 119( 16), 165303. doi:10.1063/1.4947266
NLM
Fornari CI, Rappl PHO, Abramof E, Morelhao SL. Structural properties of 'BI' IND. 2''TE' IND. 3' topological insulator thin films grown by molecular beam epitaxy on (111) 'BA''F' IND. 2' substrates [Internet]. JOURNAL OF APPLIED PHYSICS. 2016 ; 119( 16): 165303.[citado 2024 out. 02 ] Available from: https://doi.org/10.1063/1.4947266
Vancouver
Fornari CI, Rappl PHO, Abramof E, Morelhao SL. Structural properties of 'BI' IND. 2''TE' IND. 3' topological insulator thin films grown by molecular beam epitaxy on (111) 'BA''F' IND. 2' substrates [Internet]. JOURNAL OF APPLIED PHYSICS. 2016 ; 119( 16): 165303.[citado 2024 out. 02 ] Available from: https://doi.org/10.1063/1.4947266
Relatorio tecnico
X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements (2016)
Morelhão, Sergio Luiz; Remédios, Cláudio M. R.; Calligaris, Guilherme; Nisbet, Gareth
Unidade: IF
Subjects: SEMICONDUTORES, RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MORELHÃO, Sergio Luiz et al. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/pdf/1611.07666.pdf. Acesso em: 02 out. 2024. , 2016
APA
Morelhão, S. L., Remédios, C. M. R., Calligaris, G., & Nisbet, G. (2016). X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/pdf/1611.07666.pdf
NLM
Morelhão SL, Remédios CMR, Calligaris G, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. 2016 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/pdf/1611.07666.pdf
Vancouver
Morelhão SL, Remédios CMR, Calligaris G, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. 2016 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/pdf/1611.07666.pdf
Relatorio tecnico
Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis (2016)
Morelhão, Sergio Luiz; Fornari, Celso I.; Rappl, Paulo H. O.; Abramof, Eduardo
Unidade: IF
Subjects: SEMICONDUTORES, RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MORELHÃO, Sergio Luiz et al. Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/pdf/1612.09386.pdf. Acesso em: 02 out. 2024. , 2016
APA
Morelhão, S. L., Fornari, C. I., Rappl, P. H. O., & Abramof, E. (2016). Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/pdf/1612.09386.pdf
NLM
Morelhão SL, Fornari CI, Rappl PHO, Abramof E. Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis [Internet]. 2016 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/pdf/1612.09386.pdf
Vancouver
Morelhão SL, Fornari CI, Rappl PHO, Abramof E. Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis [Internet]. 2016 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/pdf/1612.09386.pdf
Relatorio tecnico
Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates (2016)
Domagala, Jaroslaw Z.; Sarzyński, Marcin; Maździarz, Marcin; Dlużewski, Pawel; Leszczyński, Michal; Morelhão, Sergio Luiz
Unidade: IF
Subjects: SEMICONDUTORES, RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
DOMAGALA, Jaroslaw Z. et al. Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/ftp/arxiv/papers/1603/1603.00793.pdf. Acesso em: 02 out. 2024. , 2016
APA
Domagala, J. Z., Sarzyński, M., Maździarz, M., Dlużewski, P., Leszczyński, M., & Morelhão, S. L. (2016). Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/ftp/arxiv/papers/1603/1603.00793.pdf
NLM
Domagala JZ, Sarzyński M, Maździarz M, Dlużewski P, Leszczyński M, Morelhão SL. Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates [Internet]. 2016 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/ftp/arxiv/papers/1603/1603.00793.pdf
Vancouver
Domagala JZ, Sarzyński M, Maździarz M, Dlużewski P, Leszczyński M, Morelhão SL. Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates [Internet]. 2016 ;[citado 2024 out. 02 ] Available from: https://arxiv.org/ftp/arxiv/papers/1603/1603.00793.pdf

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