Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates (2016)
- Authors:
- USP affiliated author: MORELHAO, SERGIO LUIZ - IF
- School: IF
- Subjects: SEMICONDUTORES; RAIOS X
- Language: Inglês
- Imprenta:
-
ABNT
DOMAGALA, Jaroslaw Z.; SARZYŃSKI, Marcin; MAŹDZIARZ, Marcin; et al. Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. [S.l: s.n.], 2016. -
APA
Domagala, J. Z., Sarzyński, M., Maździarz, M., Dlużewski, P., Leszczyński, M., & Morelhão, S. L. (2016). Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. São Paulo. -
NLM
Domagala JZ, Sarzyński M, Maździarz M, Dlużewski P, Leszczyński M, Morelhão SL. Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. 2016 ; -
Vancouver
Domagala JZ, Sarzyński M, Maździarz M, Dlużewski P, Leszczyński M, Morelhão SL. Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. 2016 ; - Invariant phase determination by genetic algorithm
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