Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique (2020)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1016/j.radphyschem.2019.04.023
- Subjects: CRISTALOGRAFIA DE RAIOS X; RADIAÇÃO SINCROTRON; MATERIAIS NANOESTRUTURADOS; NANOPARTÍCULAS
- Keywords: Imagem de raios-X com contraste de fase; Desfoque de profundidade de extinção; Resolução espacial intrínseca
- Language: Inglês
- Imprenta:
- Source:
- Título: Radiation Physics and Chemistry
- ISSN: 0969-806X
- Volume/Número/Paginação/Ano: v. 167, fevereiro, 2020, número do artigo: 108273
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
HÖNNICKE, Marcelo G. e MORELHÃO, Sérgio Luiz. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique. Radiation Physics and Chemistry, v. 167, 2020Tradução . . Disponível em: https://doi.org/10.1016/j.radphyschem.2019.04.023. Acesso em: 23 jan. 2026. -
APA
Hönnicke, M. G., & Morelhão, S. L. (2020). Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique. Radiation Physics and Chemistry, 167. doi:10.1016/j.radphyschem.2019.04.023 -
NLM
Hönnicke MG, Morelhão SL. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique [Internet]. Radiation Physics and Chemistry. 2020 ; 167[citado 2026 jan. 23 ] Available from: https://doi.org/10.1016/j.radphyschem.2019.04.023 -
Vancouver
Hönnicke MG, Morelhão SL. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique [Internet]. Radiation Physics and Chemistry. 2020 ; 167[citado 2026 jan. 23 ] Available from: https://doi.org/10.1016/j.radphyschem.2019.04.023 - Incorporation of Europium in Bi2Te3 Topological Insulator Epitaxial Films
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Informações sobre o DOI: 10.1016/j.radphyschem.2019.04.023 (Fonte: oaDOI API)
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