X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements (2017)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- DOI: 10.1107/S1600576717004757
- Subjects: DIFRAÇÃO POR RAIOS X; RADIAÇÃO SINCROTRON
- Language: Inglês
- Imprenta:
- Publisher place: Copenhagen
- Date published: 2017
- Source:
- Título: Journal of Applied Crystallography
- ISSN: 1600-5767
- Volume/Número/Paginação/Ano: v. 50, n. 3, p. 689-700, 2017
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
MORELHÃO, Sérgio Luiz et al. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. Journal of Applied Crystallography, v. 50, n. 3, p. 689-700, 2017Tradução . . Disponível em: https://doi.org/10.1107/S1600576717004757. Acesso em: 23 jan. 2026. -
APA
Morelhão, S. L., Remédios, C. M. R., Calligaris, G. A., & Nisbet, G. (2017). X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. Journal of Applied Crystallography, 50( 3), 689-700. doi:10.1107/S1600576717004757 -
NLM
Morelhão SL, Remédios CMR, Calligaris GA, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. Journal of Applied Crystallography. 2017 ; 50( 3): 689-700.[citado 2026 jan. 23 ] Available from: https://doi.org/10.1107/S1600576717004757 -
Vancouver
Morelhão SL, Remédios CMR, Calligaris GA, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. Journal of Applied Crystallography. 2017 ; 50( 3): 689-700.[citado 2026 jan. 23 ] Available from: https://doi.org/10.1107/S1600576717004757 - Incorporation of Europium in Bi2Te3 Topological Insulator Epitaxial Films
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Informações sobre o DOI: 10.1107/S1600576717004757 (Fonte: oaDOI API)
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