Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction (2020)
- Authors:
- USP affiliated authors: GARCIA, FERNANDO ASSIS - IF ; MORELHAO, SERGIO LUIZ - IF ; PENACCHIO, RAFAELA FELIX DA SILVA - IF ; ESTRADIOTE, MAURICIO BASTOS - IF ; CANTARINO, MARLI DOS REIS - IF ; VALERIO, ADRIANA - IF
- Unidade: IF
- DOI: 10.1557/mrc.2020.37
- Subjects: CRISTALOGRAFIA FÍSICA; TERMOANÁLISE; RAIOS X
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: MRS Communications
- ISSN: 2159-6867
- Volume/Número/Paginação/Ano: v. 10, n.2, p. 265-271, junho, 2020
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
VALERIO, Adriana et al. Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction. MRS Communications, v. 10, n. 2, p. 265-271, 2020Tradução . . Disponível em: https://doi.org/10.1557/mrc.2020.37. Acesso em: 12 fev. 2026. -
APA
Valerio, A., Penacchio, R. F. da S., Estradiote, M. B., Cantarino, M. dos R., Garcia, F. A., Morelhão, S. L., et al. (2020). Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction. MRS Communications, 10( 2), 265-271. doi:10.1557/mrc.2020.37 -
NLM
Valerio A, Penacchio RF da S, Estradiote MB, Cantarino M dos R, Garcia FA, Morelhão SL, Rafter N, Kycia SW, Calligaris GA, Remédios CMR. Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction [Internet]. MRS Communications. 2020 ; 10( 2): 265-271.[citado 2026 fev. 12 ] Available from: https://doi.org/10.1557/mrc.2020.37 -
Vancouver
Valerio A, Penacchio RF da S, Estradiote MB, Cantarino M dos R, Garcia FA, Morelhão SL, Rafter N, Kycia SW, Calligaris GA, Remédios CMR. Phonon scattering mechanism in thermoelectric materials revised via resonant x-ray dynamical diffraction [Internet]. MRS Communications. 2020 ; 10( 2): 265-271.[citado 2026 fev. 12 ] Available from: https://doi.org/10.1557/mrc.2020.37 - Resonant X-ray dynamical diffraction for studying thermoelectric materials
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Informações sobre o DOI: 10.1557/mrc.2020.37 (Fonte: oaDOI API)
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