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Artigo de periodico
Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects (2020)
Oliveira, Ádria ; Tambara, Lucas A.; Benevenuti, Fabio; Benites, Luis A. C.; Added, Nemitala ; Aguiar, Vitor^Ângelo Paulino de ; Medina, N. H.; Guazzelli, Marcilei Aparecida ; Kastensmidt, Fernanda
Fonte: IEEE Transactions on Nuclear Science. Unidade: IF
Assuntos: FÍSICA NUCLEAR, ÍONS PESADOS, DISPOSITIVOS ELETRÔNICOS, MATERIAIS
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ABNT
OLIVEIRA, Ádria et al. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects. IEEE Transactions on Nuclear Science, v. 67, n. 7, p. 1503-1510, 2020Tradução . . Disponível em: https://doi.org/10.1109/TNS.2020.2995729. Acesso em: 08 out. 2025.
APA
Oliveira, Á., Tambara, L. A., Benevenuti, F., Benites, L. A. C., Added, N., Aguiar, V. ^Â. P. de, et al. (2020). Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects. IEEE Transactions on Nuclear Science, 67( 7), 1503-1510. doi:10.1109/TNS.2020.2995729
NLM
Oliveira Á, Tambara LA, Benevenuti F, Benites LAC, Added N, Aguiar V^ÂP de, Medina NH, Guazzelli MA, Kastensmidt F. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects [Internet]. IEEE Transactions on Nuclear Science. 2020 ; 67( 7): 1503-1510.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/TNS.2020.2995729
Vancouver
Oliveira Á, Tambara LA, Benevenuti F, Benites LAC, Added N, Aguiar V^ÂP de, Medina NH, Guazzelli MA, Kastensmidt F. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects [Internet]. IEEE Transactions on Nuclear Science. 2020 ; 67( 7): 1503-1510.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/TNS.2020.2995729
Artigo de periodico
Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy (2020)
González, Carlos J; Added, Nemitala ; Macchione, Eduardo Luiz Augusto ; Aguiar, Vitor Ângelo Paulino de ; Kastensmidt, Fernanda G L; Puchner, Helmut K; Guazzelli, Marcilei A ; Medina, Nilberto Heder ; Balen, Tiago R
Fonte: IEEE Transactions on Nuclear Science. Unidade: IF
Assunto: ÍONS PESADOS
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ABNT
GONZÁLEZ, Carlos J et al. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, v. . 67, n. 3, p. 518-524, 2020Tradução . . Disponível em: https://doi.org/10.1109/TNS.2019.2952775. Acesso em: 08 out. 2025.
APA
González, C. J., Added, N., Macchione, E. L. A., Aguiar, V. Â. P. de, Kastensmidt, F. G. L., Puchner, H. K., et al. (2020). Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, . 67( 3), 518-524. doi:10.1109/TNS.2019.2952775
NLM
González CJ, Added N, Macchione ELA, Aguiar VÂP de, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy [Internet]. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/TNS.2019.2952775
Vancouver
González CJ, Added N, Macchione ELA, Aguiar VÂP de, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy [Internet]. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/TNS.2019.2952775
Artigo de periodico
Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA (2019)
Benites, Luis A. C.; Benevenuti, Fabio ; Oliveira, Adria B de ; Kastensmidt, Fernanda L ; Added, Nemitala ; Aguiar, Vitor Ângelo Paulino de ; Nilberto H. Medina, Nilberto Heder ; Guazzelli, Marcilei A
Fonte: IEEE Transactions on Nuclear Science. Unidades: IF, IB
Assuntos: FÍSICA NUCLEAR, ÍONS PESADOS
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ABNT
BENITES, Luis A. C. et al. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA. IEEE Transactions on Nuclear Science, v. 66 , n. 7, p. 1433-1440, 2019Tradução . . Disponível em: https://doi.org/10.1109/TNS.2019.2921796. Acesso em: 08 out. 2025.
APA
Benites, L. A. C., Benevenuti, F., Oliveira, A. B. de, Kastensmidt, F. L., Added, N., Aguiar, V. Â. P. de, et al. (2019). Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA. IEEE Transactions on Nuclear Science, 66 ( 7), 1433-1440. doi:10.1109/TNS.2019.2921796
NLM
Benites LAC, Benevenuti F, Oliveira AB de, Kastensmidt FL, Added N, Aguiar VÂP de, Nilberto H. Medina NH, Guazzelli MA. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA [Internet]. IEEE Transactions on Nuclear Science. 2019 ; 66 ( 7): 1433-1440.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/TNS.2019.2921796
Vancouver
Benites LAC, Benevenuti F, Oliveira AB de, Kastensmidt FL, Added N, Aguiar VÂP de, Nilberto H. Medina NH, Guazzelli MA. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA [Internet]. IEEE Transactions on Nuclear Science. 2019 ; 66 ( 7): 1433-1440.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/TNS.2019.2921796
Artigo de periodico
Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs (2018)
Tambara, Lucas Antunes; Kastensmidt, Fernanda Lima; Rech, Paolo; Lins, Filipe; Medina, Nilberto Heder; Added, Nemitala ; Aguiar, Vitor Ângelo Paulino de ; Silveira, Marcilei Aparecida Guazzelli da
Fonte: IEEE Transactions on Nuclear Science. Unidade: IF
Assuntos: FÍSICA NUCLEAR, ESPECTROSCOPIA DE RAIO GAMA
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ABNT
TAMBARA, Lucas Antunes et al. Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs. IEEE Transactions on Nuclear Science, v. 65, n. 8, p. 1935 - 1942, 2018Tradução . . Disponível em: https://doi.org/10.1109/TNS.2018.2844250. Acesso em: 08 out. 2025.
APA
Tambara, L. A., Kastensmidt, F. L., Rech, P., Lins, F., Medina, N. H., Added, N., et al. (2018). Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs. IEEE Transactions on Nuclear Science, 65( 8), 1935 - 1942. doi:10.1109/TNS.2018.2844250
NLM
Tambara LA, Kastensmidt FL, Rech P, Lins F, Medina NH, Added N, Aguiar VÂP de, Silveira MAG da. Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs [Internet]. IEEE Transactions on Nuclear Science. 2018 ; 65( 8): 1935 - 1942.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/TNS.2018.2844250
Vancouver
Tambara LA, Kastensmidt FL, Rech P, Lins F, Medina NH, Added N, Aguiar VÂP de, Silveira MAG da. Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs [Internet]. IEEE Transactions on Nuclear Science. 2018 ; 65( 8): 1935 - 1942.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/TNS.2018.2844250
Artigo de periodico
Using cumulants and spectra to model nuclear radiation detectors (2006)
Pontes, Eduardo Winston; Ferreira, Ademar
Fonte: IEEE Transactions on Nuclear Science. Unidade: EP
Assuntos: RADIAÇÃO (ENERGIA RADIANTE), FÍSICA NUCLEAR
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ABNT
PONTES, Eduardo Winston e FERREIRA, Ademar. Using cumulants and spectra to model nuclear radiation detectors. IEEE Transactions on Nuclear Science, v. 52, n. 3, p. 1292-1298, 2006Tradução . . Disponível em: https://doi.org/10.1109/tns.2006.875200. Acesso em: 08 out. 2025.
APA
Pontes, E. W., & Ferreira, A. (2006). Using cumulants and spectra to model nuclear radiation detectors. IEEE Transactions on Nuclear Science, 52( 3), 1292-1298. doi:10.1109/tns.2006.875200
NLM
Pontes EW, Ferreira A. Using cumulants and spectra to model nuclear radiation detectors [Internet]. IEEE Transactions on Nuclear Science. 2006 ;52( 3): 1292-1298.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/tns.2006.875200
Vancouver
Pontes EW, Ferreira A. Using cumulants and spectra to model nuclear radiation detectors [Internet]. IEEE Transactions on Nuclear Science. 2006 ;52( 3): 1292-1298.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/tns.2006.875200
Artigo de periodico
Influence of crystalline surface quality on TlBr radiation detector performance (2005)
Oliveira, Icimone Braga de; Costa, Fábio E; Kiyohara, Pedro Kunihiko; Hamada, Margarida Mizue
Fonte: IEEE Transactions on Nuclear Science. Unidade: IF
Assuntos: MICROSCOPIA ELETRÔNICA, MICROSCOPIA ELETRÔNICA DE VARREDURA
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ABNT
OLIVEIRA, Icimone Braga de et al. Influence of crystalline surface quality on TlBr radiation detector performance. IEEE Transactions on Nuclear Science, v. 52, n. 5, p. 2058-2062, 2005Tradução . . Disponível em: https://doi.org/10.1109/tns.2005.856788. Acesso em: 08 out. 2025.
APA
Oliveira, I. B. de, Costa, F. E., Kiyohara, P. K., & Hamada, M. M. (2005). Influence of crystalline surface quality on TlBr radiation detector performance. IEEE Transactions on Nuclear Science, 52( 5), 2058-2062. doi:10.1109/tns.2005.856788
NLM
Oliveira IB de, Costa FE, Kiyohara PK, Hamada MM. Influence of crystalline surface quality on TlBr radiation detector performance [Internet]. IEEE Transactions on Nuclear Science. 2005 ; 52( 5): 2058-2062.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/tns.2005.856788
Vancouver
Oliveira IB de, Costa FE, Kiyohara PK, Hamada MM. Influence of crystalline surface quality on TlBr radiation detector performance [Internet]. IEEE Transactions on Nuclear Science. 2005 ; 52( 5): 2058-2062.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/tns.2005.856788
Artigo de periodico
Lead iodide platelets: correlations between surface, optical, and electrical properties with X- and gamma-ray spectrometric performance (2002)
Fornaro, Laura; Saucedo, Edgardo; Mussio, Luis; Gancharov, Alvaro; Guimarães, Francisco Eduardo Gontijo ; Hernandes, Antônio Carlos
Fonte: IEEE Transactions on Nuclear Science. Unidade: IFSC
Assunto: FÍSICA DA MATÉRIA CONDENSADA
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ABNT
FORNARO, Laura et al. Lead iodide platelets: correlations between surface, optical, and electrical properties with X- and gamma-ray spectrometric performance. IEEE Transactions on Nuclear Science, v. 49, n. 6, p. 3300-3305, 2002Tradução . . Disponível em: https://doi.org/10.1109/tns.2002.806193. Acesso em: 08 out. 2025.
APA
Fornaro, L., Saucedo, E., Mussio, L., Gancharov, A., Guimarães, F. E. G., & Hernandes, A. C. (2002). Lead iodide platelets: correlations between surface, optical, and electrical properties with X- and gamma-ray spectrometric performance. IEEE Transactions on Nuclear Science, 49( 6), 3300-3305. doi:10.1109/tns.2002.806193
NLM
Fornaro L, Saucedo E, Mussio L, Gancharov A, Guimarães FEG, Hernandes AC. Lead iodide platelets: correlations between surface, optical, and electrical properties with X- and gamma-ray spectrometric performance [Internet]. IEEE Transactions on Nuclear Science. 2002 ; 49( 6): 3300-3305.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/tns.2002.806193
Vancouver
Fornaro L, Saucedo E, Mussio L, Gancharov A, Guimarães FEG, Hernandes AC. Lead iodide platelets: correlations between surface, optical, and electrical properties with X- and gamma-ray spectrometric performance [Internet]. IEEE Transactions on Nuclear Science. 2002 ; 49( 6): 3300-3305.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/tns.2002.806193
Artigo de periodico
Front-end electronics for PHENIX time expansion chamber (2002)
Barish, K; Chang, W C; Dietzsch, Olácio; Ferdousi, T; Franz, A; Fried, J; Fung, S Y; Gannon, J; Harder, J; Kandasamy, A; Kelley, M A; Kotchetkov, D; Lebedev, A; Li, X H; Mahon, J; Mioduszewiski, S; Muniruzzaman, M; Nandi, B; O'Brien, E; O'Connor, P; Pisani, R; Rankowitz, S; Rosati, M; Seto, R; Takagui, E. M.; Von Achen, W; Wang, H Q; Xie, W
Fonte: IEEE Transactions on Nuclear Science. Unidade: IF
Assuntos: PARTÍCULAS (FÍSICA NUCLEAR), FÍSICA NUCLEAR
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ABNT
BARISH, K et al. Front-end electronics for PHENIX time expansion chamber. IEEE Transactions on Nuclear Science, v. 49, n. 3, p. 1141-1146, 2002Tradução . . Disponível em: https://doi.org/10.1109/nssmic.2001.1008528. Acesso em: 08 out. 2025.
APA
Barish, K., Chang, W. C., Dietzsch, O., Ferdousi, T., Franz, A., Fried, J., et al. (2002). Front-end electronics for PHENIX time expansion chamber. IEEE Transactions on Nuclear Science, 49( 3), 1141-1146. doi:10.1109/nssmic.2001.1008528
NLM
Barish K, Chang WC, Dietzsch O, Ferdousi T, Franz A, Fried J, Fung SY, Gannon J, Harder J, Kandasamy A, Kelley MA, Kotchetkov D, Lebedev A, Li XH, Mahon J, Mioduszewiski S, Muniruzzaman M, Nandi B, O'Brien E, O'Connor P, Pisani R, Rankowitz S, Rosati M, Seto R, Takagui EM, Von Achen W, Wang HQ, Xie W. Front-end electronics for PHENIX time expansion chamber [Internet]. IEEE Transactions on Nuclear Science. 2002 ; 49( 3): 1141-1146.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/nssmic.2001.1008528
Vancouver
Barish K, Chang WC, Dietzsch O, Ferdousi T, Franz A, Fried J, Fung SY, Gannon J, Harder J, Kandasamy A, Kelley MA, Kotchetkov D, Lebedev A, Li XH, Mahon J, Mioduszewiski S, Muniruzzaman M, Nandi B, O'Brien E, O'Connor P, Pisani R, Rankowitz S, Rosati M, Seto R, Takagui EM, Von Achen W, Wang HQ, Xie W. Front-end electronics for PHENIX time expansion chamber [Internet]. IEEE Transactions on Nuclear Science. 2002 ; 49( 3): 1141-1146.[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/nssmic.2001.1008528
Artigo de periodico
Measurement of two particle resolution in silicon drift detectors (1998)
Pandey, S U; Bellwied, R; Bettenmueller, R; Caines, H; Chen, W; DiMassino, D; Dyke, H; Hall, J; Takahashi, Jiro
Fonte: IEEE Transactions on Nuclear Science. Unidade: IF
Assunto: DETETORES
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ABNT
PANDEY, S U et al. Measurement of two particle resolution in silicon drift detectors. IEEE Transactions on Nuclear Science, 1998Tradução . . Disponível em: https://doi.org/10.1109/23.682400. Acesso em: 08 out. 2025.
APA
Pandey, S. U., Bellwied, R., Bettenmueller, R., Caines, H., Chen, W., DiMassino, D., et al. (1998). Measurement of two particle resolution in silicon drift detectors. IEEE Transactions on Nuclear Science. doi:10.1109/23.682400
NLM
Pandey SU, Bellwied R, Bettenmueller R, Caines H, Chen W, DiMassino D, Dyke H, Hall J, Takahashi J. Measurement of two particle resolution in silicon drift detectors [Internet]. IEEE Transactions on Nuclear Science. 1998 ;[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/23.682400
Vancouver
Pandey SU, Bellwied R, Bettenmueller R, Caines H, Chen W, DiMassino D, Dyke H, Hall J, Takahashi J. Measurement of two particle resolution in silicon drift detectors [Internet]. IEEE Transactions on Nuclear Science. 1998 ;[citado 2025 out. 08 ] Available from: https://doi.org/10.1109/23.682400
Trabalho de evento-anais periodico
A compact hybrid photodetector (HPD) (1997)
Suyama, M; Kawai, Y; Kimura, S; Asakura, N; Hirano, K; Hasegawa, Y; Saito, T; Morita, T; Muramatsu, Mikiya
Fonte: IEEE Transactions on Nuclear Science. Nome do evento: Nuclear Science Symposium and Medical Imaging Conference. Unidade: IF
Assunto: FÍSICA
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ABNT
SUYAMA, M et al. A compact hybrid photodetector (HPD). IEEE Transactions on Nuclear Science. New York: IEEE Press. . Acesso em: 08 out. 2025. , 1997
APA
Suyama, M., Kawai, Y., Kimura, S., Asakura, N., Hirano, K., Hasegawa, Y., et al. (1997). A compact hybrid photodetector (HPD). IEEE Transactions on Nuclear Science. New York: IEEE Press.
NLM
Suyama M, Kawai Y, Kimura S, Asakura N, Hirano K, Hasegawa Y, Saito T, Morita T, Muramatsu M. A compact hybrid photodetector (HPD). IEEE Transactions on Nuclear Science. 1997 ; 44( 3): 985-989.[citado 2025 out. 08 ]
Vancouver
Suyama M, Kawai Y, Kimura S, Asakura N, Hirano K, Hasegawa Y, Saito T, Morita T, Muramatsu M. A compact hybrid photodetector (HPD). IEEE Transactions on Nuclear Science. 1997 ; 44( 3): 985-989.[citado 2025 out. 08 ]

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