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Artigo de periodico
Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix (2023)
Kellermann, Guinther; Craievich, Aldo Felix
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: FILMES FINOS, NANOPARTÍCULAS
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ABNT
KELLERMANN, Guinther e CRAIEVICH, Aldo Felix. Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix. Journal of Applied Crystallography, v. 56, p. 927-938, 2023Tradução . . Disponível em: https://doi.org/10.1107/S1600576723004570. Acesso em: 03 jul. 2024.
APA
Kellermann, G., & Craievich, A. F. (2023). Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix. Journal of Applied Crystallography, 56, 927-938. doi:10.1107/S1600576723004570
NLM
Kellermann G, Craievich AF. Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix [Internet]. Journal of Applied Crystallography. 2023 ; 56 927-938.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1107/S1600576723004570
Vancouver
Kellermann G, Craievich AF. Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix [Internet]. Journal of Applied Crystallography. 2023 ; 56 927-938.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1107/S1600576723004570
Artigo de periodico
Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film (2023)
Costa, Daniel da Silva; Kellermann, Guinther; Craievich, Aldo Felix
Source: Journal of Applied Crystallography. Unidade: IF
Assunto: FILMES FINOS
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ABNT
COSTA, Daniel da Silva e KELLERMANN, Guinther e CRAIEVICH, Aldo Felix. Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film. Journal of Applied Crystallography, v. 56, p. 95-102, 2023Tradução . . Disponível em: https://doi.org/10.1107/S1600576722010974. Acesso em: 03 jul. 2024.
APA
Costa, D. da S., Kellermann, G., & Craievich, A. F. (2023). Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film. Journal of Applied Crystallography, 56, 95-102. doi:10.1107/S1600576722010974
NLM
Costa D da S, Kellermann G, Craievich AF. Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film [Internet]. Journal of Applied Crystallography. 2023 ; 56 95-102.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1107/S1600576722010974
Vancouver
Costa D da S, Kellermann G, Craievich AF. Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film [Internet]. Journal of Applied Crystallography. 2023 ; 56 95-102.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1107/S1600576722010974
Artigo de periodico
Synchrotron radiation applied to real-time studies of the kinetics of growth of aluminum nitride thin multilayers (2019)
Molleja, J García; Burgi, J; Kellermann, G; Craievich, Aldo Felix; Neuenschwander, R; Jouan, P Y; Djouadi, M A; Piccoli, M; Bemporad, E; Felicis, D de; Feugeas J N
Source: Journal of Physical Chemistry B. Unidade: IF
Assunto: FILMES FINOS
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ABNT
MOLLEJA, J García et al. Synchrotron radiation applied to real-time studies of the kinetics of growth of aluminum nitride thin multilayers. Journal of Physical Chemistry B, v. 123, p. 1679−1687, 2019Tradução . . Disponível em: https://doi.org/10.1021/acs.jpcb.8b09496. Acesso em: 03 jul. 2024.
APA
Molleja, J. G., Burgi, J., Kellermann, G., Craievich, A. F., Neuenschwander, R., Jouan, P. Y., et al. (2019). Synchrotron radiation applied to real-time studies of the kinetics of growth of aluminum nitride thin multilayers. Journal of Physical Chemistry B, 123, 1679−1687. doi:10.1021/acs.jpcb.8b09496
NLM
Molleja JG, Burgi J, Kellermann G, Craievich AF, Neuenschwander R, Jouan PY, Djouadi MA, Piccoli M, Bemporad E, Felicis D de, Feugeas J N. Synchrotron radiation applied to real-time studies of the kinetics of growth of aluminum nitride thin multilayers [Internet]. Journal of Physical Chemistry B. 2019 ; 123 1679−1687.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1021/acs.jpcb.8b09496
Vancouver
Molleja JG, Burgi J, Kellermann G, Craievich AF, Neuenschwander R, Jouan PY, Djouadi MA, Piccoli M, Bemporad E, Felicis D de, Feugeas J N. Synchrotron radiation applied to real-time studies of the kinetics of growth of aluminum nitride thin multilayers [Internet]. Journal of Physical Chemistry B. 2019 ; 123 1679−1687.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1021/acs.jpcb.8b09496
Trabalho de evento
Reactive sputter magnetron reactor for preparation of thin films and simultaneous in-situ structural study by X-ray diffraction (2013)
Feugeas J N; Bürgi, J; J Garcia MollejaA. F. Craievich3 , Kellermann, G.4 , and Neueschwander, R.5; Craievich, Aldo Felix; Kellermann, G; Neueschwander, R
Conference titles: Reunião Anual de Usuários do LNLS/CNPEM. Unidade: IF
Subjects: FILMES FINOS, DIFRAÇÃO POR RAIOS X
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ABNT
FEUGEAS J N, et al. Reactive sputter magnetron reactor for preparation of thin films and simultaneous in-situ structural study by X-ray diffraction. 2013, Anais.. Campinas: Instituto de Física, Universidade de São Paulo, 2013. Disponível em: http://lnls.cnpem.br/rau/files/2013/04/Livro-Resumos-23RAU.pdf. Acesso em: 03 jul. 2024.
APA
Feugeas J N,, Bürgi, J., J Garcia MollejaA. F. Craievich3 , K., Craievich, A. F., Kellermann, G., & Neueschwander, R. (2013). Reactive sputter magnetron reactor for preparation of thin films and simultaneous in-situ structural study by X-ray diffraction. In . Campinas: Instituto de Física, Universidade de São Paulo. Recuperado de http://lnls.cnpem.br/rau/files/2013/04/Livro-Resumos-23RAU.pdf
NLM
Feugeas J N, Bürgi J, J Garcia MollejaA. F. Craievich3 K, Craievich AF, Kellermann G, Neueschwander R. Reactive sputter magnetron reactor for preparation of thin films and simultaneous in-situ structural study by X-ray diffraction [Internet]. 2013 ;[citado 2024 jul. 03 ] Available from: http://lnls.cnpem.br/rau/files/2013/04/Livro-Resumos-23RAU.pdf
Vancouver
Feugeas J N, Bürgi J, J Garcia MollejaA. F. Craievich3 K, Craievich AF, Kellermann G, Neueschwander R. Reactive sputter magnetron reactor for preparation of thin films and simultaneous in-situ structural study by X-ray diffraction [Internet]. 2013 ;[citado 2024 jul. 03 ] Available from: http://lnls.cnpem.br/rau/files/2013/04/Livro-Resumos-23RAU.pdf
Artigo de periodico
Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction (2013)
Buergi, J.; Neuenschwander, R.; Kellermann, G.; Garcia Molleja, J.; Feugeas, J.; Craievich, Aldo Felix
Source: REVIEW OF SCIENTIFIC INSTRUMENTS. Unidade: IF
Subjects: FILMES FINOS, INSTRUMENTAÇÃO (FÍSICA)
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ABNT
BUERGI, J. et al. Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction. REVIEW OF SCIENTIFIC INSTRUMENTS, v. 84, n. ja2013, p. 015102, 2013Tradução . . Disponível em: https://doi.org/10.1063/1.4773002. Acesso em: 03 jul. 2024.
APA
Buergi, J., Neuenschwander, R., Kellermann, G., Garcia Molleja, J., Feugeas, J., & Craievich, A. F. (2013). Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction. REVIEW OF SCIENTIFIC INSTRUMENTS, 84( ja2013), 015102. doi:10.1063/1.4773002
NLM
Buergi J, Neuenschwander R, Kellermann G, Garcia Molleja J, Feugeas J, Craievich AF. Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction [Internet]. REVIEW OF SCIENTIFIC INSTRUMENTS. 2013 ; 84( ja2013): 015102.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1063/1.4773002
Vancouver
Buergi J, Neuenschwander R, Kellermann G, Garcia Molleja J, Feugeas J, Craievich AF. Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction [Internet]. REVIEW OF SCIENTIFIC INSTRUMENTS. 2013 ; 84( ja2013): 015102.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1063/1.4773002
Artigo de periodico
Formation of an extended CoSi2 thin nanohexagons array coherently buried in silicon single crystal (2012)
Kellermann, Guinther; Montoro, Luciano A; Giovanetti, Lisandro J; Claro, Paula C dos Santos; Zhang, Liang; Ramirez, Antonio J; Requejo, Félix G; Craievich, Aldo Felix
Source: Applied Physics Letters. Unidade: IF
Subjects: NANOPARTÍCULAS, FILMES FINOS
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ABNT
KELLERMANN, Guinther et al. Formation of an extended CoSi2 thin nanohexagons array coherently buried in silicon single crystal. Applied Physics Letters, v. 100, n. 6, p. 063116/1-063116/5, 2012Tradução . . Disponível em: https://doi.org/10.1063/1.3683493. Acesso em: 03 jul. 2024.
APA
Kellermann, G., Montoro, L. A., Giovanetti, L. J., Claro, P. C. dos S., Zhang, L., Ramirez, A. J., et al. (2012). Formation of an extended CoSi2 thin nanohexagons array coherently buried in silicon single crystal. Applied Physics Letters, 100( 6), 063116/1-063116/5. doi:10.1063/1.3683493
NLM
Kellermann G, Montoro LA, Giovanetti LJ, Claro PC dos S, Zhang L, Ramirez AJ, Requejo FG, Craievich AF. Formation of an extended CoSi2 thin nanohexagons array coherently buried in silicon single crystal [Internet]. Applied Physics Letters. 2012 ; 100( 6): 063116/1-063116/5.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1063/1.3683493
Vancouver
Kellermann G, Montoro LA, Giovanetti LJ, Claro PC dos S, Zhang L, Ramirez AJ, Requejo FG, Craievich AF. Formation of an extended CoSi2 thin nanohexagons array coherently buried in silicon single crystal [Internet]. Applied Physics Letters. 2012 ; 100( 6): 063116/1-063116/5.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1063/1.3683493
Artigo de periodico
Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111) (2010)
Kellermann, Guinther; Rodriguez, Eugenio; Jimenez, Ernesto; Cesar, Carlos Lenz; Barbosa, Luiz Carlos; Craievich, Aldo Felix
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: FILMES FINOS, DIFRAÇÃO POR RAIOS X, SEMICONDUTORES
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ABNT
KELLERMANN, Guinther et al. Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111). Journal of Applied Crystallography, v. 43, p. 385-393, 2010Tradução . . Disponível em: http://onlinelibrary.wiley.com/doi/10.1107/S0021889810005625/pdf. Acesso em: 03 jul. 2024.
APA
Kellermann, G., Rodriguez, E., Jimenez, E., Cesar, C. L., Barbosa, L. C., & Craievich, A. F. (2010). Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111). Journal of Applied Crystallography, 43, 385-393. Recuperado de http://onlinelibrary.wiley.com/doi/10.1107/S0021889810005625/pdf
NLM
Kellermann G, Rodriguez E, Jimenez E, Cesar CL, Barbosa LC, Craievich AF. Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111) [Internet]. Journal of Applied Crystallography. 2010 ; 43 385-393.[citado 2024 jul. 03 ] Available from: http://onlinelibrary.wiley.com/doi/10.1107/S0021889810005625/pdf
Vancouver
Kellermann G, Rodriguez E, Jimenez E, Cesar CL, Barbosa LC, Craievich AF. Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111) [Internet]. Journal of Applied Crystallography. 2010 ; 43 385-393.[citado 2024 jul. 03 ] Available from: http://onlinelibrary.wiley.com/doi/10.1107/S0021889810005625/pdf
Trabalho de evento-resumo
Study of nanostructured ZnO thin films prepared by sol-gel spin-coating by synchrotron techniques: crystal structures and local order (2009)
Bojorge, C D; Canepa, H R; Casanova, J R; Craievich, Aldo Felix; Heredia, E; Kellermann, Guinther
Source: Resumos de trabalhos científicos. Conference titles: Reunião Anual de Usuários do LNLS. Unidade: IF
Subjects: NANOPARTÍCULAS, FILMES FINOS
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ABNT
BOJORGE, C D et al. Study of nanostructured ZnO thin films prepared by sol-gel spin-coating by synchrotron techniques: crystal structures and local order. 2009, Anais.. Campinas: LNLS, 2009. . Acesso em: 03 jul. 2024.
APA
Bojorge, C. D., Canepa, H. R., Casanova, J. R., Craievich, A. F., Heredia, E., & Kellermann, G. (2009). Study of nanostructured ZnO thin films prepared by sol-gel spin-coating by synchrotron techniques: crystal structures and local order. In Resumos de trabalhos científicos. Campinas: LNLS.
NLM
Bojorge CD, Canepa HR, Casanova JR, Craievich AF, Heredia E, Kellermann G. Study of nanostructured ZnO thin films prepared by sol-gel spin-coating by synchrotron techniques: crystal structures and local order. Resumos de trabalhos científicos. 2009 ;[citado 2024 jul. 03 ]
Vancouver
Bojorge CD, Canepa HR, Casanova JR, Craievich AF, Heredia E, Kellermann G. Study of nanostructured ZnO thin films prepared by sol-gel spin-coating by synchrotron techniques: crystal structures and local order. Resumos de trabalhos científicos. 2009 ;[citado 2024 jul. 03 ]
Artigo de periodico
Dynamical scaling properties of nanoporous undoped and Sb-doped 'SnO IND.2' supported thin films during tri- and bidimensional structure coarsening (2007)
Santilli, Celso Valentim; Rizzato, A P; Pulcinelli, Sandra Helena; Craievich, Aldo Felix
Source: Physical Review B. Unidade: IF
Subjects: DIFRAÇÃO POR RAIOS X, FILMES FINOS
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ABNT
SANTILLI, Celso Valentim et al. Dynamical scaling properties of nanoporous undoped and Sb-doped 'SnO IND.2' supported thin films during tri- and bidimensional structure coarsening. Physical Review B, v. 75, n. 20, p. 205335/1-205335/8, 2007Tradução . . Disponível em: https://doi.org/10.1103/physrevb.75.205335. Acesso em: 03 jul. 2024.
APA
Santilli, C. V., Rizzato, A. P., Pulcinelli, S. H., & Craievich, A. F. (2007). Dynamical scaling properties of nanoporous undoped and Sb-doped 'SnO IND.2' supported thin films during tri- and bidimensional structure coarsening. Physical Review B, 75( 20), 205335/1-205335/8. doi:10.1103/physrevb.75.205335
NLM
Santilli CV, Rizzato AP, Pulcinelli SH, Craievich AF. Dynamical scaling properties of nanoporous undoped and Sb-doped 'SnO IND.2' supported thin films during tri- and bidimensional structure coarsening [Internet]. Physical Review B. 2007 ; 75( 20): 205335/1-205335/8.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1103/physrevb.75.205335
Vancouver
Santilli CV, Rizzato AP, Pulcinelli SH, Craievich AF. Dynamical scaling properties of nanoporous undoped and Sb-doped 'SnO IND.2' supported thin films during tri- and bidimensional structure coarsening [Internet]. Physical Review B. 2007 ; 75( 20): 205335/1-205335/8.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1103/physrevb.75.205335
Trabalho de evento-resumo
Local structure of metal-oxygen bonds in nanocrystalline zirconiaceriarisolid solutions synthesized by a gel-combustion process (2006)
Prado, Rogério Junqueira; Fantini, Márcia Carvalho de Abreu ; Craievich, Aldo Felix; Rapp, Maria Emilia F; Reca, Noemi E W; Lamas, Diego G; Fuentes, Rodolfo O; Fábregas, Ismael O
Source: ORAL SESSION G1. Conference titles: Encontro da Sociedade Brasileira de Pesquisas em Materiais (SBPMat). Unidade: IF
Subjects: MATERIAIS (PESQUISA), FILMES FINOS
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ABNT
PRADO, Rogério Junqueira et al. Local structure of metal-oxygen bonds in nanocrystalline zirconiaceriarisolid solutions synthesized by a gel-combustion process. 2006, Anais.. Rio de Janeiro: SBPMat, 2006. Disponível em: http://www.sbpmat.org.br/5encontro/SympG.pdf. Acesso em: 03 jul. 2024.
APA
Prado, R. J., Fantini, M. C. de A., Craievich, A. F., Rapp, M. E. F., Reca, N. E. W., Lamas, D. G., et al. (2006). Local structure of metal-oxygen bonds in nanocrystalline zirconiaceriarisolid solutions synthesized by a gel-combustion process. In ORAL SESSION G1. Rio de Janeiro: SBPMat. Recuperado de http://www.sbpmat.org.br/5encontro/SympG.pdf
NLM
Prado RJ, Fantini MC de A, Craievich AF, Rapp MEF, Reca NEW, Lamas DG, Fuentes RO, Fábregas IO. Local structure of metal-oxygen bonds in nanocrystalline zirconiaceriarisolid solutions synthesized by a gel-combustion process [Internet]. ORAL SESSION G1. 2006 ;[citado 2024 jul. 03 ] Available from: http://www.sbpmat.org.br/5encontro/SympG.pdf
Vancouver
Prado RJ, Fantini MC de A, Craievich AF, Rapp MEF, Reca NEW, Lamas DG, Fuentes RO, Fábregas IO. Local structure of metal-oxygen bonds in nanocrystalline zirconiaceriarisolid solutions synthesized by a gel-combustion process [Internet]. ORAL SESSION G1. 2006 ;[citado 2024 jul. 03 ] Available from: http://www.sbpmat.org.br/5encontro/SympG.pdf
Artigo de periodico
Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures (2003)
Rizzato, Alessandro P; Santilli, Celso V; Pulcinelli, Sandra H; Craievich, Aldo Felix
Source: Journal of Applied Cristalography. Unidade: IF
Subjects: CRISTALOGRAFIA, FILMES FINOS
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ABNT
RIZZATO, Alessandro P et al. Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures. Journal of Applied Cristalography, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0021889803004953. Acesso em: 03 jul. 2024.
APA
Rizzato, A. P., Santilli, C. V., Pulcinelli, S. H., & Craievich, A. F. (2003). Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures. Journal of Applied Cristalography. doi:10.1107/s0021889803004953
NLM
Rizzato AP, Santilli CV, Pulcinelli SH, Craievich AF. Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures [Internet]. Journal of Applied Cristalography. 2003 ;[citado 2024 jul. 03 ] Available from: https://doi.org/10.1107/s0021889803004953
Vancouver
Rizzato AP, Santilli CV, Pulcinelli SH, Craievich AF. Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures [Internet]. Journal of Applied Cristalography. 2003 ;[citado 2024 jul. 03 ] Available from: https://doi.org/10.1107/s0021889803004953
Artigo de periodico
Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures (2002)
Tokumoto, M S; Smith, A; Santilli, Celso Valentim; Pulcinelli, Sandra Helena; Craievich, Aldo Felix; Elkaim, E
Source: Thin Solid Films. Unidade: IF
Subjects: FILMES FINOS, MATERIAIS (PROPRIEDADES ELÉTRICAS)
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ABNT
TOKUMOTO, M S et al. Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures. Thin Solid Films, v. 416, n. 1-2, p. 284-293, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0040-6090(02)00531-x. Acesso em: 03 jul. 2024.
APA
Tokumoto, M. S., Smith, A., Santilli, C. V., Pulcinelli, S. H., Craievich, A. F., & Elkaim, E. (2002). Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures. Thin Solid Films, 416( 1-2), 284-293. doi:10.1016/s0040-6090(02)00531-x
NLM
Tokumoto MS, Smith A, Santilli CV, Pulcinelli SH, Craievich AF, Elkaim E. Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures [Internet]. Thin Solid Films. 2002 ; 416( 1-2): 284-293.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1016/s0040-6090(02)00531-x
Vancouver
Tokumoto MS, Smith A, Santilli CV, Pulcinelli SH, Craievich AF, Elkaim E. Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures [Internet]. Thin Solid Films. 2002 ; 416( 1-2): 284-293.[citado 2024 jul. 03 ] Available from: https://doi.org/10.1016/s0040-6090(02)00531-x
Trabalho de evento-resumo
A nucleation-growth study in a bidimensional film of a semifluorinated alkane: towards the 2D/3D transformation process at the air-water interface (2002)
Pouzet, Eric; Craievich, Aldo Felix; Abed, Abdel El; Sanière, Michele; Muller, Pierre
Source: Resumos. Conference titles: Encontro Nacional de Física da Matéria Condensada. Unidade: IF
Subjects: SUPERFÍCIE FÍSICA, FILMES FINOS
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ABNT
POUZET, Eric et al. A nucleation-growth study in a bidimensional film of a semifluorinated alkane: towards the 2D/3D transformation process at the air-water interface. 2002, Anais.. São Paulo: SBF, 2002. . Acesso em: 03 jul. 2024.
APA
Pouzet, E., Craievich, A. F., Abed, A. E., Sanière, M., & Muller, P. (2002). A nucleation-growth study in a bidimensional film of a semifluorinated alkane: towards the 2D/3D transformation process at the air-water interface. In Resumos. São Paulo: SBF.
NLM
Pouzet E, Craievich AF, Abed AE, Sanière M, Muller P. A nucleation-growth study in a bidimensional film of a semifluorinated alkane: towards the 2D/3D transformation process at the air-water interface. Resumos. 2002 ;[citado 2024 jul. 03 ]
Vancouver
Pouzet E, Craievich AF, Abed AE, Sanière M, Muller P. A nucleation-growth study in a bidimensional film of a semifluorinated alkane: towards the 2D/3D transformation process at the air-water interface. Resumos. 2002 ;[citado 2024 jul. 03 ]
Trabalho de evento-resumo
Evolução estrutural local durante a obtenção de oxi-hidroxido de níquel (2001)
Fischer, Hannes; Brito, Giancarlo Esposito de Souza; Craievich, Aldo Felix
Source: Resumos. Conference titles: Encontro Nacional de Física da Matéria Condensada. Unidade: IF
Subjects: MATERIAIS MAGNÉTICOS, MAGNETISMO, ESTRUTURA DOS MATERIAIS, DIFRAÇÃO POR RAIOS X, FILMES FINOS
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ABNT
FISCHER, Hannes e BRITO, Giancarlo Esposito de Souza e CRAIEVICH, Aldo Felix. Evolução estrutural local durante a obtenção de oxi-hidroxido de níquel. 2001, Anais.. São Paulo: SBF, 2001. . Acesso em: 03 jul. 2024.
APA
Fischer, H., Brito, G. E. de S., & Craievich, A. F. (2001). Evolução estrutural local durante a obtenção de oxi-hidroxido de níquel. In Resumos. São Paulo: SBF.
NLM
Fischer H, Brito GE de S, Craievich AF. Evolução estrutural local durante a obtenção de oxi-hidroxido de níquel. Resumos. 2001 ;[citado 2024 jul. 03 ]
Vancouver
Fischer H, Brito GE de S, Craievich AF. Evolução estrutural local durante a obtenção de oxi-hidroxido de níquel. Resumos. 2001 ;[citado 2024 jul. 03 ]
Trabalho de evento-resumo
Propriedades eletrocrômicas de multicamadas à base de 'NiO' e 'ZnO' preparados pelo processo sol-gel e "dip coating" (2001)
Brito, Giancarlo Esposito de Souza; Martini, Milena; Fantini, Márcia Carvalho de Abreu ; Craievich, Aldo Felix
Source: Resumos. Conference titles: Encontro Nacional de Física da Matéria Condensada. Unidade: IF
Subjects: SUPERFÍCIE FÍSICA, FILMES FINOS, LUZ, ÓPTICA
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ABNT
BRITO, Giancarlo Esposito de Souza et al. Propriedades eletrocrômicas de multicamadas à base de 'NiO' e 'ZnO' preparados pelo processo sol-gel e "dip coating". 2001, Anais.. São Paulo: SBF, 2001. . Acesso em: 03 jul. 2024.
APA
Brito, G. E. de S., Martini, M., Fantini, M. C. de A., & Craievich, A. F. (2001). Propriedades eletrocrômicas de multicamadas à base de 'NiO' e 'ZnO' preparados pelo processo sol-gel e "dip coating". In Resumos. São Paulo: SBF.
NLM
Brito GE de S, Martini M, Fantini MC de A, Craievich AF. Propriedades eletrocrômicas de multicamadas à base de 'NiO' e 'ZnO' preparados pelo processo sol-gel e "dip coating". Resumos. 2001 ;[citado 2024 jul. 03 ]
Vancouver
Brito GE de S, Martini M, Fantini MC de A, Craievich AF. Propriedades eletrocrômicas de multicamadas à base de 'NiO' e 'ZnO' preparados pelo processo sol-gel e "dip coating". Resumos. 2001 ;[citado 2024 jul. 03 ]

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