Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix (2023)
- Authors:
- Autor USP: CRAIEVICH, ALDO FELIX - IF
- Unidade: IF
- DOI: 10.1107/S1600576723004570
- Subjects: FILMES FINOS; NANOPARTÍCULAS
- Language: Inglês
- Imprenta:
- Publisher: John Wiley
- Publisher place: Chester
- Date published: 2023
- Source:
- Título: Journal of Applied Crystallography
- Volume/Número/Paginação/Ano: v. 56, p. 927-938, 2023
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
KELLERMANN, Guinther e CRAIEVICH, Aldo Felix. Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix. Journal of Applied Crystallography, v. 56, p. 927-938, 2023Tradução . . Disponível em: https://doi.org/10.1107/S1600576723004570. Acesso em: 09 fev. 2026. -
APA
Kellermann, G., & Craievich, A. F. (2023). Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix. Journal of Applied Crystallography, 56, 927-938. doi:10.1107/S1600576723004570 -
NLM
Kellermann G, Craievich AF. Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix [Internet]. Journal of Applied Crystallography. 2023 ; 56 927-938.[citado 2026 fev. 09 ] Available from: https://doi.org/10.1107/S1600576723004570 -
Vancouver
Kellermann G, Craievich AF. Novel methodology to determine thermal properties of nanoparticles exclusively based on SAXS measurements applied to Bi nanocrystals and nanodroplets in a glass matrix [Internet]. Journal of Applied Crystallography. 2023 ; 56 927-938.[citado 2026 fev. 09 ] Available from: https://doi.org/10.1107/S1600576723004570 - Investigaciones de nanomateriales meidante XRD, XAFS y SAXS con luz de síncrotron
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Informações sobre o DOI: 10.1107/S1600576723004570 (Fonte: oaDOI API)
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