Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures (2003)
- Authors:
- Autor USP: CRAIEVICH, ALDO FELIX - IF
- Unidade: IF
- DOI: 10.1107/s0021889803004953
- Subjects: CRISTALOGRAFIA; FILMES FINOS
- Language: Inglês
- Imprenta:
- Publisher place: Copenhagen
- Date published: 2003
- Source:
- Título: Journal of Applied Cristalography
- ISSN: 0021-8898
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
RIZZATO, Alessandro Panzanato et al. Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures. Journal of Applied Cristalography, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0021889803004953. Acesso em: 08 fev. 2026. -
APA
Rizzato, A. P., Santilli, C. V., Pulcinelli, S. H., & Craievich, A. F. (2003). Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures. Journal of Applied Cristalography. doi:10.1107/s0021889803004953 -
NLM
Rizzato AP, Santilli CV, Pulcinelli SH, Craievich AF. Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures [Internet]. Journal of Applied Cristalography. 2003 ;[citado 2026 fev. 08 ] Available from: https://doi.org/10.1107/s0021889803004953 -
Vancouver
Rizzato AP, Santilli CV, Pulcinelli SH, Craievich AF. Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures [Internet]. Journal of Applied Cristalography. 2003 ;[citado 2026 fev. 08 ] Available from: https://doi.org/10.1107/s0021889803004953 - Investigaciones de nanomateriales meidante XRD, XAFS y SAXS con luz de síncrotron
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Informações sobre o DOI: 10.1107/s0021889803004953 (Fonte: oaDOI API)
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